Roger A Panicacci from 14700 Golf Links Dr, Los Gatos, CA 95032, age 62, Phone: (408)4025483

Resumes

Vice President Of Design Platform Technology

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Location:

San Francisco, CA

Industry:

Semiconductors

Work:

Aptina Imaging
Vice President of Product Development
Micron Technology Nov 2001 - Mar 2008
Director, Product Development
Photobit Corporation May 1996 - Nov 2001
CTO, Senior Analog/Mixed Signal Design Engineer
Jet Propulsion Laboratory Jun 1994 - May 1996
Member of the Technical Staff
Kodak Berkeley Research Jul 1990 - Jun 1994
Member of the Technical Staff

Education:

University of California, Santa Barbara 1987 - 1989
MS, Electrical Engineering University of California, Berkeley 1981 - 1985
BS, Electrical Engineering and Computer Science

Skills:

Ic
Semiconductors
Cmos
Asic
Mixed Signal
Sensors
Soc
Semiconductor Industry
Engineering Management
Eda
Analog
Product Management

Us Patents

Ram Line Storage For Fixed Pattern Noise Correction
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US Patent:

6473124, Oct 29, 2002
Filed:

Apr 23, 1998
Appl. No.:

09/066506
Inventors:

Roger Panicacci - Los Angeles CA
Barmak Mansoorian - Los Angeles CA
Eric Fossum - La Crescenta CA
Assignee:

Micron Technology, Inc. - Boise ID
International Classification:

H04N 5217
US Classification:

348241, 348243
Abstract:

A random access memory stores values indicative of fixed pattern noise from a pixel circuit, which are used to compensate the pixel output to compensate for the fixed pattern noise.

Reducing Internal Bus Speed In A Bus System Without Reducing Readout Rate
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US Patent:

6480921, Nov 12, 2002
Filed:

Jul 21, 1999
Appl. No.:

09/359068
Inventors:

Barmak Mansoorian - Los Angeles CA
Scott Yee - Taipei, TW
Roger Panicacci - Los Angeles CA
Assignee:

Micron Technology, Inc. - Boise ID
International Classification:

G06F 1300
US Classification:

710305, 710 52, 710316, 370386
Abstract:

An improved bus system having input ports and output ports for transporting data is described. The bus system includes bus lines, switching elements, and a sequencing element. The bus lines channel data from the input ports to the output ports. The switching elements are configured to place data from the input ports onto the bus lines. Each of the switching elements enable one of a group of data to be placed on each of the bus lines simultaneously. The sequencing element selects a predetermined number of the group of data on the bus lines and sequentially directs the selected number of data to the output ports at different points in time.

Look Ahead Shutter Pointer Allowing Real Time Exposure Control
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US Patent:

6529242, Mar 4, 2003
Filed:

Mar 11, 1998
Appl. No.:

09/038888
Inventors:

Roger Panicacci - Los Angeles CA
Assignee:

Micron Technology, Inc. - Boise ID
International Classification:

H04N 314
US Classification:

348308, 348362
Abstract:

Look ahead shutter pointer used for exposure control determination. One shutter is used to remove the pixels from reset. This begins the integration process. The pixels are integrated by turning them on one by one and sampling their outputs sometime later. The amount of time between turning them on and sampling them can be varied. This can be done while the system is being used. In the preferred embodiment the time of exposure is changed at the interface between two frames to avoid problems in the image.

Single Chip Camera Active Pixel Sensor
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US Patent:

6606122, Aug 12, 2003
Filed:

Sep 29, 1998
Appl. No.:

09/162920
Inventors:

Timothy Shaw - Pasadena CA
Bedabrata Pain - Los Angeles CA
Brita Olson - Pasadena CA
Robert H. Nixon - San Pedro CA
Eric R. Fossum - La Crescenta CA
Roger A. Panicacci - Los Angeles CA
Barmak Mansoorian - Los Angeles CA
Assignee:

California Institute of Technology - Pasadena CA
International Classification:

H04N 314
US Classification:

348302, 2502081, 257291, 348308, 348294
Abstract:

A totally digital single chip camera includes communications to operate most of its structure in serial communication mode. The digital single chip camera include a D/A converter for converting an input digital word into an analog reference signal. The chip includes all of the necessary circuitry for operating the chip using a single pin.

Dead Pixel Correction By Row/Column Substitution
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US Patent:

6611288, Aug 26, 2003
Filed:

Feb 26, 1998
Appl. No.:

09/031145
Inventors:

Eric R. Fossum - La Crescenta CA
Nick Doudoumopoulos - Marina Del Rey CA
Roger Panicacci - Los Angeles CA
Assignee:

Micron Technology, Inc. - Boise ID
International Classification:

H04N 964
US Classification:

348246
Abstract:

Bad pixels areas in an optical device are investigated and corrected. An upper limit on the number of bad areas is defined. Each bad area can be one, or more than one pixel.

Readout Circuit With Gain And Analog-To-Digital A Conversion For Image Sensor
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US Patent:

6885396, Apr 26, 2005
Filed:

Mar 8, 1999
Appl. No.:

09/264501
Inventors:

Roger Panicacci - Los Angeles CA, US
Barmak Mansoorian - Los Angeles CA, US
Sandor Barna - Pasadena CA, US
Alexander I. Krymski - Montrose CA, US
Assignee:

Micron Technology, Inc. - Boise ID
International Classification:

H04N005/217
H04N005/228
H04N005/335
H01L027/00
H03M001/12
US Classification:

348241, 348302, 3482221, 2502081, 341172
Abstract:

A CMOS imager includes an array of active pixel sensors, wherein each pixel is associated with a respective column in the array. The imager also includes multiple circuits for reading out values of pixels from the active sensor array. Each readout circuit can be associated with a respective pair of columns in the array and can include first and second sample-and-hold circuits. The first and second sample-and-hold circuits are associated, respectively, with first and second columns of pixels in the array. Each readout circuit also includes an operational amplifier-based charge sensing circuit that selectively provides an amplified differential output signal based on signals sampled either by the first sample-and-hold circuit or the second sample-and-hold circuit. The readout circuit also has an analog-to-digital converter for converting the differential output to a corresponding digital signal using a successive approximation technique. Use of the readout circuit can increase the parallel structure of the overall chip, thereby reducing the bandwidth which each readout circuit must be capable of handling.

Digital Exposure Circuit For An Image Sensor
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US Patent:

6906745, Jun 14, 2005
Filed:

Apr 23, 1999
Appl. No.:

09/298306
Inventors:

Eric R. Fossum - La Crescenta CA, US
Alexander I. Krymski - Montrose CA, US
Roger A. Panicacci - Los Angeles CA, US
Christopher Clark - Pasadena CA, US
Assignee:

Micron Technology, Inc. - Boise ID
International Classification:

H04N005/235
H04N005/335
G03B007/00
US Classification:

3482291, 348362, 348297
Abstract:

Automatic exposure adjusting device considers the image on a pixel-by-pixel basis. Each pixel is characterized according to its most significant bits. After the pixels are characterized, the number of pixels in any particular group is counted. That counting is compared with thresholds which set whether the image is over exposed, under exposed, and can optionally also determine if the image is seriously over exposed or seriously under exposed. Adjustment of the exposure is carried out to bring the image to a more desired state.

Analog To Digital Converter With Internal Data Storage
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US Patent:

7002628, Feb 21, 2006
Filed:

Mar 30, 1999
Appl. No.:

09/281358
Inventors:

Roger Panicacci - Los Angeles CA, US
Assignee:

Micron Technology, Inc. - Boise ID
International Classification:

H04N 5/335
H04N 5/228
H03M 1/12
US Classification:

348307, 348308, 3482221, 341155
Abstract:

An analog-to-digital converter in an active pixel sensor array includes on board memory elements for storing results. The stored results can be read out in a different order than the order in which they were converted.