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Rohith Sood

age ~49

from Portland, OR

Also known as:
  • Romith Sood
Phone and address:
4135 15Th Ave, Portland, OR 97211
(503)3312508

Rohith Sood Phones & Addresses

  • 4135 15Th Ave, Portland, OR 97211 • (503)3312508
  • 629 Morris St, Portland, OR 97212 • (503)3312508
  • Vancouver, WA
  • Seattle, WA
  • San Jose, CA
  • 4135 NE 15Th Ave, Portland, OR 97211

Work

  • Company:
    Lattice semiconductor
    Aug 2011
  • Position:
    Senior test development engineer

Education

  • Degree:
    BS
  • School / High School:
    University of Washington
    1992 to 1997
  • Specialities:
    Electrical Engineering

Skills

Asic • Cmos • Semiconductors • Ic • Mixed Signal • Soc • Debugging • Analog • Eda • Fpga • Circuit Design • Verilog • Lvs • Drc • Floorplanning

Industries

Semiconductors

Resumes

Rohith Sood Photo 1

Staff Applications Engineer

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Location:
Portland, OR
Industry:
Semiconductors
Work:
Lattice Semiconductor since Aug 2011
Senior Test Development Engineer

Lattice Semiconductor May 1997 - Jul 2011
Senior Design Engineer
Education:
University of Washington 1992 - 1997
BS, Electrical Engineering
Skills:
Asic
Cmos
Semiconductors
Ic
Mixed Signal
Soc
Debugging
Analog
Eda
Fpga
Circuit Design
Verilog
Lvs
Drc
Floorplanning

Us Patents

  • Triggered Sense Amplifier

    view source
  • US Patent:
    8477549, Jul 2, 2013
  • Filed:
    Dec 22, 2010
  • Appl. No.:
    12/976520
  • Inventors:
    Rohith Sood - Portland OR, US
    Zheng Chen - Upper Macungie PA, US
    Loren McLaury - Hillsboro OR, US
  • Assignee:
    Lattice Semiconductor Corporation - Hillsboro OR
  • International Classification:
    G11C 7/00
  • US Classification:
    365203, 365154, 365156, 326 38, 326 47
  • Abstract:
    Techniques are provided which may be used to reduce power consumed by memory circuits. In one example, a programmable logic device (PLD) includes a plurality of static random access memory (SRAM) cells adapted to configure the PLD for an intended use. A pair of bitlines are connected to the SRAM cells. At least one of the SRAM cells is adapted to provide data signals to the bitlines in response to a wordline signal received by the one of the SRAM cells during a read operation. A sense amplifier is connected to the bitlines and adapted to detect a data value from the data signals in response to a trigger signal received by the sense amplifier during the read operation. Logic is adapted to delay the trigger signal relative to the wordline signal to permit the data signals to settle before the sense amplifier detects the data value.
  • Blocking Memory Readback In A Programmable Logic Device

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  • US Patent:
    8522126, Aug 27, 2013
  • Filed:
    Dec 22, 2010
  • Appl. No.:
    12/977011
  • Inventors:
    Zheng Chen - Upper Macungie PA, US
    Rohith Sood - Portland OR, US
    Loren McLaury - Hillsboro OR, US
  • Assignee:
    Lattice Semiconductor Corporation - Hillsboro OR
  • International Classification:
    G06F 11/10
  • US Classification:
    714807, 714763
  • Abstract:
    A programmable logic device (PLD) is provided that includes: a configuration memory including a plurality of memory cells arranged according to rows and columns, wherein a subset of the rows are RAM rows, and wherein a subset of the columns in each RAM row are RAM columns and at least one column in each RAM row is a flag bit column, the memory cells corresponding to the flag bit column and RAM rows operable to store flag bit signals; a soft error detection (SED) circuit operable to read the configuration memory to derive a checksum; a logic circuit to determine if a RAM row is being read by the SED circuit that includes an asserted flag bit; and a blocking circuit that provides a known logical value to the SED circuit responsive to the logic circuit to block readback of the memory cells corresponding to the RAM rows and RAM columns.
  • Bitline Floating Circuit For Memory Power Reduction

    view source
  • US Patent:
    8351287, Jan 8, 2013
  • Filed:
    Dec 22, 2010
  • Appl. No.:
    12/976412
  • Inventors:
    Rohith Sood - Portland OR, US
    Fabiano Fontana - San Jose CA, US
    Zheng Chen - Upper Macungie PA, US
  • Assignee:
    Lattice Semiconductor Corporation - Hillsboro OR
  • International Classification:
    G11C 7/00
  • US Classification:
    365203, 365154, 365156, 326 38, 326 47
  • Abstract:
    Techniques are provided which may be used to reduce power consumed by memory circuits. In one example, a memory circuit includes a static random access memory (SRAM) cell. A pair of bitlines are connected to the SRAM cell. A precharge circuit is connected to the bitlines. The precharge circuit is adapted to precharge the bitlines immediately prior to read and write operations performed on the SRAM cell and float relative to the bitlines at other times.

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