Ronald H Fleming

US Patent:

6439054, Aug 27, 2002

Filed:

May 31, 2000

Appl. No.:

09/585242

Inventors:

Russell B. Gore - Spokane WA
Ronald H. Fleming - Spokane WA

Assignee:

Honeywell International Inc. - Morristown NJ

International Classification:

G01N 2904

US Classification:

73620, 73623, 73602

Abstract:

The invention includes a method for testing materials, such as for example sputtering target materials, other materials for electronics applications, or other materials in general in which homogeneity throughout the material is desired. A plurality of positions are defined across at least a portion of a material. Sonic energy is sequentially irradiated across the plurality of positions. Echoes are induced by the sonic energy, and detected. At least some of the detected echoes are associated with individual positions of the plurality of positions that triggered the detected echoes. Information pertaining to at least one physical attribute of the detected echoes is processed to sort the detected echoes into a first group indicative of inhomogeneities in the material, and a second group which does not indicate inhomogeneities in the material. The echoes of the first group are sorted into clusters, with the clusters being defined as echoes from adjacent positions of the plurality of positions. The separate echoes associated with a common cluster are analyzed and considered together to generate information about an inhomogeneity in the material.

US Patent:

6803235, Oct 12, 2004

Filed:

Jun 15, 2000

Appl. No.:

09/595583

Inventors:

John D. Mize - Spokane WA
Russell B. Gore - Spokane WA
Ronald H. Fleming - Spokane WA

Assignee:

Honeywell International Inc. - Morristown NJ

International Classification:

G01N 3100

US Classification:

436 2, 436 75, 436145, 436 46, 436164

Abstract:

The invention encompasses a method of generating information about materials in a composition. A reagent is utilized to dissolve portions of the composition, and thereafter is filtered through a substrate which is then scanned with a microscope using automated displacement of the substrate to obtain data about the non-dissolved portions at locations along a grid pattern. Information about the size and quantity of the non-dissolved portions of the composition is generated. The invention also encompasses a method of generating information about impurities present in a metal composition. Metallic portions of the composition are selectively dissolved relative to impurities to form a solution. The solution is filtered through a substrate which is then scanned with a microscope to obtain data about a darkness of the impurities relative to a background. The data is processed to generate information about the size, quantity and type of the impurities.

US Patent:

7521286, Apr 21, 2009

Filed:

May 5, 2006

Appl. No.:

11/418668

Inventors:

Martin W. Weiser - Liberty Lake WA, US
Nancy F. Dean - Liberty Lake WA, US
Brett M. Clark - Spokane WA, US
Michael J. Bossio - Spokane WA, US
Ronald H. Fleming - Spokane WA, US
James P. Flint - Spokane WA, US

Assignee:

Honeywell International Inc. - Morristown NJ

International Classification:

H01L 21/44
H01L 21/48
H01L 21/50

US Classification:

438108, 438613

Abstract:

The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.

US Patent:

20040065954, Apr 8, 2004

Filed:

Sep 26, 2003

Appl. No.:

10/670319

Inventors:

Martin Weiser - Liberty Lake WA, US
Nancy Dean - Liberty Lake WA, US
Brett Clark - Spokane WA, US
Michael Bossio - Spokane WA, US
Ronald Fleming - Spokane WA, US
James Flint - Spokane WA, US

International Classification:

H01L023/48

US Classification:

257/734000

Abstract:

The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.

US Patent:

20050194541, Sep 8, 2005

Filed:

Mar 3, 2004

Appl. No.:

10/793319

Inventors:

Brett Clark - Spokane WA, US
Ronald Fleming - Spokane WA, US

International Classification:

G01T001/185

US Classification:

250385100

Abstract:

The invention includes an ionizing radiation detector which includes a chamber within a housing. A receiving member within the chamber has a plurality of spaced holders for receiving samples. The samples are maintained in an array of substantially parallel samples with the samples functioning as electrodes within the chamber. The invention includes a method of counting emissions from samples. An odd number of electrodes are introduced into a detector chamber. Each of the electrodes includes at least one sample to be analyzed. The electrodes are organized into an array of substantially parallel electrodes, each electrode being in electrical communication with a contact surface. The electrode array includes cathodes and anodes where the number of cathodes differs from the number of anodes by one. A voltage is applied across the electrodes and particle emission is detected from the samples based upon ionization of counting gas within the chamber.

US Patent:

20070045838, Mar 1, 2007

Filed:

Nov 2, 2006

Appl. No.:

11/592396

Inventors:

Martin Weiser - Liberty Lake WA, US
Nancy Dean - Liberty Lake WA, US
Brett Clark - Spokane WA, US
Michael Bossio - Spokane WA, US
Ronald Fleming - Spokane WA, US
James Flint - Spokane WA, US

International Classification:

H01L 23/48

US Classification:

257734000

Abstract:

The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.

US Patent:

20070045839, Mar 1, 2007

Filed:

Nov 2, 2006

Appl. No.:

11/592446

Inventors:

Martin Weiser - Liberty Lake WA, US
Nancy Dean - Liberty Lake WA, US
Brett Clark - Spokane WA, US
Michael Bossio - Spokane WA, US
Ronald Fleming - Spokane WA, US
James Flint - Spokane WA, US

International Classification:

H01L 23/48

US Classification:

257734000

Abstract:

The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.

US Patent:

20070045842, Mar 1, 2007

Filed:

Nov 2, 2006

Appl. No.:

11/592347

Inventors:

Martin Weiser - Liberty Lake WA, US
Nancy Dean - Liberty Lake WA, US
Brett Clark - Spokane WA, US
Michael Bossio - Spokane WA, US
Ronald Fleming - Spokane WA, US
James Flint - Spokane WA, US

International Classification:

H01L 23/48

US Classification:

257737000, 257734000, 257772000

Abstract:

The invention includes solder materials having low concentrations of alpha particle emitters, and includes methods of purification of materials to reduce a concentration of alpha particle emitters within the materials. The invention includes methods of reducing alpha particle flux in various lead-containing and lead-free materials through purification of the materials. The invention also includes methods of estimating the fractionation of a low concentration of one or more alpha particle emitters during purification of a material.