Ronald D Kelley

US Patent:

47479132, May 31, 1988

Filed:

Oct 31, 1986

Appl. No.:

6/926029

Inventors:

Ralph Gerstenkorn - Huntington Beach CA
Dale D. Erickson - Huntington Beach CA
Heyward G. Christmas - Bellingham WA
Ronald E. Kelley - Lynden WA
Charles A. Taul - Bellingham WA

Assignee:

Atlantic Richfield Company - Los Angeles CA

International Classification:

C10B 3910

US Classification:

202227

Abstract:

Apparatus for cooling granular material such as petroleum coke comprises an elongated drum characterized by a generally cylindrical shell wall having spaced apart circular segment pockets extending radially inwardly from the shell wall toward the central axis of the drum to provide extended heat transfer surfaces and flow spaces for cooling water. The cooling pockets are welded to the shell wall along the edges of opposed sidewalls of the pocket or conduit members themselves. The somewhat flexible drum shell resulting from the aforedescribed construction is strengthened and held substantially rigid for rotation about its central axis by a plurality of circumferentially spaced tension rods which extend from one end of the drum to the other and are engagable with a support plate. A plurality of coil springs are circumferentially spaced about the support plate and are compressed between the support plate and a flange of the drum to uniformly distribute compressive loads on the drum to minimize cyclical bending stresses on the drum during rotation thereof.

US Patent:

20150330877, Nov 19, 2015

Filed:

Dec 30, 2013

Appl. No.:

14/758150

Inventors:

- Hillsboro OR, US
Jeffrey Blackwood - Portland OR, US
Stacey Stone - Brno, CZ
Sang Hoon Lee - Forest Grove OR, US
Ronald Kelley - Portland OR, US
Trevan Landin - Hillsboro OR, US

Assignee:

FEI Company - Hilsboro OR

International Classification:

G01N 1/32
H01L 21/3065

Abstract:

A method and apparatus is provided for preparing samples for observation in a charged particle beam system in a manner that reduces or prevents artifacts. An ion beam mills exposes a cross section of the work piece using a bulk mill process. A deposition precursor gas is directed to the sample surface while a small amount of material is removed from the exposed cross section face, the deposition precursor producing a more uniform cross section. Embodiments are useful for preparing cross sections for SEM observation of samples having layers of materials of different hardnesses. Embodiments are useful for preparation of thin TEM samples.

US Patent:

20140190934, Jul 10, 2014

Filed:

Dec 31, 2013

Appl. No.:

14/144902

Inventors:

- Hillsboro OR, US
Jeffrey Blackwood - Portland OR, US
Stacey Stone - Beaverton OR, US
Sang Hoon Lee - Hillsboro OR, US
Ronald Kelley - Portland OR, US

International Classification:

G01N 1/32

US Classification:

216 37, 15634524

Abstract:

A method and apparatus is provided for preparing samples for observation in a charged particle beam system in a manner that reduces or prevents artifacts. Material is deposited onto the sample using charged particle beam deposition just before or during the final milling, which results in an artifact-free surface. Embodiments are useful for preparing cross sections for SEM observation of samples having layers of materials of different hardnesses. Embodiments are useful for preparation of thin TEM samples.

US Patent:

20140138350, May 22, 2014

Filed:

Nov 15, 2013

Appl. No.:

14/081947

Inventors:

- Hillsboro OR, US
Ronald Kelley - Portland OR, US

International Classification:

B05D 3/04

US Classification:

216 37, 15634524

Abstract:

A method and apparatus is provided for preparing samples for observation in a charged particle beam system in a manner that reduces or prevents artifacts. Material is deposited onto the sample using charged particle beam deposition just before or during the final milling, which results in an artifact-free surface. Embodiments are useful for preparing cross sections for SEM observation of samples having layers of materials of different hardnesses. Embodiments are useful for preparation of thin TEM samples.