Disclosed are apparatus and methods for monitoring an operation parameter of a process tool, independently of a process system recipe, are provided. In one embodiment, the behavior of a process device as it transitions between different states is monitored for a single cycle of operation or over time to detect trends that indicate a potential failure of the process device. When a trend that indicates a potential failure is detected, an alarm is generated. In one implementation, the time for reaching a particular stage of operation may be repeatedly monitored over a plurality of device cycles. For example, the time to open a valve or door may be monitored. In another example, the time for reaching a stable phase of gas flow after a ramping stage has commenced is monitored. When the time for reaching a particular stage begins to decline by a predetermined amount, an alarm may be generated.
Apparatus And Methods For Monitoring Health Of Semiconductor Process Systems
Jeffery William Achtnig - Calgary, CA Russell Fleming - Pleasanton CA, US Jaideep Jain - San Jose CA, US
Assignee:
Novellus Systems, Inc. - San Jose CA
International Classification:
G04F 7/00 G05B 19/18 G05B 23/02 G06F 19/00
US Classification:
700108, 700 9, 700109, 700121, 340 31, 702176
Abstract:
Disclosed are apparatus and methods for monitoring an operation parameter of a process tool, independently of a process system recipe, are provided. In general, an indirect effect that results from implementing an event from a process system recipe on the process system is monitored without using the specific values or setpoints that are entered for such event into the process system to thereby change a state of such process system. In one embodiment, the behavior of a process device as it transitions between different states is monitored for a single cycle of operation or over time to detect trends that indicate a potential failure of the process device. When a trend that indicates a potential failure is detected, an alarm is generated. In one implementation, the time for reaching a particular stage of operation may be repeatedly monitored over a plurality of device cycles. For example, the time to open a valve or door may be monitored.
Archbishop Bergan Cathol High School Fremont NE 1993-1997
Community:
Matt Mueller, Travis Goreham, Eric Lozo, Regina Rios, Colleen Ireland, Daniel Duraj, Heather Bergman, Sarah Mcwhirter, Nathen Cone, Casey Dunson, Brian Hayes, Ted Rogers
Carl Hennessee, Jeannette Craig, William Queen, David Cuthbertson, Nanette Cobb, Jeannie Garrison, Julius Beck, Clarence Wiseman, Mabel Patton, Frances Benfield, Charlotte Franklin