Russell J Navarre from 27837 Westcott Crescent Cir, Farmington, MI 48334, Phone: (248)4733993

Russell Navarre Phones & Addresses

Surface Evaluation In A Stamping Manufacturing Process Utilizing True Reflection Line Methodology And Computer Graphics Technology
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US Patent:

6785640, Aug 31, 2004
Filed:

Aug 7, 2000
Appl. No.:

09/633212
Inventors:

Yun Lu - Troy MI
Russell J Navarre - Farmington Hills MI
Li Zhang - Rochester Hills MI
Assignee:

DaimlerChrysler Corporation - Auburn Hills MI
International Classification:

G06G 748
US Classification:

703 7, 703 1, 703 2, 700 98, 700108, 345419
Abstract:

The present invention provides a method for evaluating a surface quality of a simulated stamping which includes the steps of obtaining a CAD model of a desired part, calculate and display at least one image of true reflect line on the CAD model, obtaining a blank mesh representative of the part before the part is formed, and processing the blank mesh with a springback simulation software to obtain a deformed finite element analysis springback blank. True reflect lines are then calculated and displayed on the deformed FEA springback blank, and the reflect lines are compared with the true reflect lines on the CAD model to determine variance of the deformed springback blank with the CAD model.