Scott Allen Lindsey

US Patent:

7667475, Feb 23, 2010

Filed:

Apr 4, 2008

Appl. No.:

12/062988

Inventors:

Steven C. Steps - Saratoga CA, US
Scott E. Lindsey - Brentwood CA, US
Kenneth W. Deboe - Santa Clara CA, US
Alberto Calderon - San Jose CA, US

Assignee:

AEHR Test Systems - Fremont CA

International Classification:

G01R 31/02

US Classification:

324760, 324754, 324765

Abstract:

The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.

US Patent:

7684619, Mar 23, 2010

Filed:

Jan 9, 2006

Appl. No.:

11/329385

Inventors:

Steve Sprang - Mountain View CA, US
Scott Lindsey - Portland OR, US

Assignee:

Apple Inc. - Cupertino CA

International Classification:

G06K 9/34
G06F 17/21
G06K 9/00

US Classification:

382176, 715210

Abstract:

Providing text flow in or around an irregular container, such as a non-rectangular graphic, is disclosed. In the case of flow around a container, the intersection, if any, between a proposed text rectangle and the irregular container is determined. A valid rectangle, if any, that is not within the bounds in the x-direction of an area of intersection between the proposed text rectangle and the graphic is identified as a valid text area within the proposed text rectangle. In the case of flow around a container, one or more difference areas, if any, in which a proposed text rectangle is present but the container is not present are found. A valid rectangle, if any, that is not within the bounds in the x-direction of any of said one or more difference areas is identified as a valid text area within the proposed text rectangle.

US Patent:

7762822, Jul 27, 2010

Filed:

Apr 27, 2006

Appl. No.:

11/413323

Inventors:

Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Long V. Vu - San Jose CA, US

Assignee:

Aehr Test Systems - Fremont CA

International Classification:

H01R 13/44

US Classification:

439131

Abstract:

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

US Patent:

7902846, Mar 8, 2011

Filed:

Jan 7, 2010

Appl. No.:

12/684051

Inventors:

Steven C. Steps - Saratoga CA, US
Scott E. Lindsey - Brentwood CA, US
Kenneth W. Deboe - Santa Clara CA, US
Alberto Calderon - San Jose CA, US

Assignee:

Aehr Test Systems - Fremont CA

International Classification:

G01R 31/00

US Classification:

32475016, 32476205

Abstract:

The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.

US Patent:

8118618, Feb 21, 2012

Filed:

May 3, 2010

Appl. No.:

12/772932

Inventors:

Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US

Assignee:

Aehr Test Systems - Fremont CA

International Classification:

H01R 24/00

US Classification:

439676

Abstract:

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

US Patent:

8198909, Jun 12, 2012

Filed:

Feb 8, 2011

Appl. No.:

13/022803

Inventors:

Steven C. Steps - Saratoga CA, US
Scott E. Lindsey - Brentwood CA, US
Kenneth W. Deboe - Santa Clara CA, US
Alberto Calderon - San Jose CA, US

Assignee:

AEHR Test Systems - Fremont CA

International Classification:

G01R 31/40

US Classification:

32476401, 32475605, 32476202, 324537

Abstract:

The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.

US Patent:

8388357, Mar 5, 2013

Filed:

Jan 18, 2012

Appl. No.:

13/353269

Inventors:

Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US

Assignee:

Aehr Test Systems - Fremont CA

International Classification:

H01R 12/00

US Classification:

439 70

Abstract:

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

US Patent:

8506335, Aug 13, 2013

Filed:

Jan 30, 2013

Appl. No.:

13/754765

Inventors:

Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US

Assignee:

AEHA Test Systems - Fremont CA

International Classification:

H01R 4/50

US Classification:

439770

Abstract:

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.