Shannon M Campbell

US Patent:

8111905, Feb 7, 2012

Filed:

Oct 29, 2009

Appl. No.:

12/608943

Inventors:

Shannon R. Campbell - Bothell WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

G06K 9/00

US Classification:

382152, 382100, 382255, 382325, 348 86, 348 E7085

Abstract:

A refined autofocus method provides optimized lighting between iterative autofocus operations, to reliably provide the best possible autofocus Z-height precision. The method includes a quantitative initial focus Z-height determination based on initial focus curve data from initial autofocus images acquired using initial light control parameters. Then, the camera is set at that initial focus Z-height such that well focused images are provided. Refined (optimized) light control parameters are then determined based on at least one respective image acquired using respective light control parameters at that Z-height, such that an image acquired using the refined light control parameters provides a near-optimum value for a contrast-related metric (e. g. , a focus metric) at that Z-height. Then, refined autofocus images are acquired using the refined light control parameters and a refined precise Z-height is quantitatively determined base on the resulting focus curve.

US Patent:

8581162, Nov 12, 2013

Filed:

Dec 8, 2009

Appl. No.:

12/633695

Inventors:

Shannon R. Campbell - Bothell WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

G02B 27/64
G06K 9/00
G01B 11/24

US Classification:

2502012, 382141, 356609

Abstract:

A machine vision inspection system acquires a plurality of images of a workpiece region of interest at various focus heights, and determines a Z-height (e. g. , the best focus height) for the region of interest based on a focus peak determining data set for the region of interest. The focus peak determining data set is derived from the plurality of images. The machine vision inspection system also determines Z-height quality meta-data based on data derived from the plurality of images (e. g. , based on the focus peak determining data set), and associates the Z-height quality meta-data with the corresponding Z-heights. The Z-height quality meta-data are usable to establish weighting factors that are used in association with the corresponding best focus Z-heights in subsequent operations that fit a workpiece surface representation to a plurality of the best focus Z-heights.

US Patent:

20130027538, Jan 31, 2013

Filed:

Jul 29, 2011

Appl. No.:

13/194856

Inventors:

Yuhua Ding - Bothell WA, US
Shannon Roy Campbell - Woodinville WA, US

Assignee:

MITUTOYO CORPORATION - Kawasaki-shi

International Classification:

H04N 7/18
G03B 13/00

US Classification:

348 79, 382100, 348E07085

Abstract:

A multi-region focus navigation interface for a machine vision inspection system is provided to assist a user with user-directed or manual focus operations. The multi-region focus navigation interface comprises a plurality of regional focus elements, each corresponding to a respective region of interest and superimposed on a displayed field of view. Each focus element comprises at least first and second operating states corresponding to its focus distance being in a close or intermediate range, respectively. Each operating state comprises a respective graphical focus indicator. For the intermediate range, a focus improvement direction may also be indicated. In one embodiment, in the close range operating state, a user may activate a region focus element to perform autofocus operations, while in the intermediate range operating state, a user may activate a focus element to perform operations that move toward the focus height by a predetermined step size.

US Patent:

20130162806, Jun 27, 2013

Filed:

Dec 23, 2011

Appl. No.:

13/336938

Inventors:

Yuhua Ding - Kirkland WA, US
Shannon Roy Campbell - Woodinville WA, US
Mark Lawrence Delaney - Shoreline WA, US
Robert Kamil Bryll - Bothell WA, US

Assignee:

MITUTOYO CORPORATION - Kawasaki-shi

International Classification:

G06K 9/00
H04N 7/18

US Classification:

348 86, 382152, 348E07085

Abstract:

A method for operating an edge focus tool to focus the optics of a machine vision inspection system proximate to an edge adjacent to a beveled surface feature is provided. The method comprises defining a region of interest (ROI) including the edge in a field of view of the machine vision inspection system; acquiring an image stack of the ROI over a Z range including the edge; generating a point cloud including a Z height for a plurality of points in the ROI, based on determining a best focus Z height measurement for the plurality of points; defining a proximate subset of the point cloud comprising points proximate to the beveled surface feature and corresponding to the shape of the beveled surface feature; defining a Z-extremum subset of the proximate subset of the point cloud; and focusing the optics at a Z height corresponding to the Z-extremum subset.

US Patent:

20210390681, Dec 16, 2021

Filed:

Jun 15, 2020

Appl. No.:

16/902181

Inventors:

- Kanagawa-ken, JP
Robert Kamil Bryll - Bothell WA, US
Shannon Roy Campbell - Woodinville WA, US

International Classification:

G06T 7/00

Abstract:

A workpiece inspection and defect detection system includes a light source, a lens that inputs image light arising from a surface of a workpiece, and a camera that receives imaging light transmitted along an imaging optical path. The system utilizes images of workpieces acquired with the camera as training images to train a defect detection portion to detect defect images that include workpieces with defects. Anomaly detector classification characteristics are determined based on features of the training images. Run mode images of workpieces are acquired with the camera, and based on determined features from the images, the anomaly detector classification characteristics are utilized to determine if the images of the workpieces are classified as anomalous. In addition, the defect detection portion determines if images are defect images that include workpieces with defects and for which additional operations may be performed (e.g., metrology operations for measuring dimensions of the defects, etc.)