Shawn P Dugan

US Patent:

20170230846, Aug 10, 2017

Filed:

Feb 9, 2016

Appl. No.:

15/019952

Inventors:

- Atlanta GA, US
Shawn Dugan - Pittsburgh PA, US
William Wiese - Anaheim CA, US
Zhou Wu - Bellevue WA, US

International Classification:

H04W 24/04

Abstract:

Determining RAN performance outlier information is disclosed. In an aspect, RAN data for a current condition can be analyzed in view of historical RAN data to determine if the current condition in atypical and represents an outlier condition. In an aspect, historically similar environments between the historical and current RAN data can allow the analysis to have increased relevance. The disclosure can employ a binary array to facilitate determining performance outlier information. In an aspect, the present disclosure can be performed in a distributed computing environment and is scalable to manage large data volumes. Performance outlier information can be employed in alerts, scheduling repair, planning hardware or software upgrades, tracking rollout of new features, etc.