Siyuan Chen

US Patent:

20190114481, Apr 18, 2019

Filed:

Oct 16, 2018

Appl. No.:

16/161499

Inventors:

- New York NY, US
Hod Lipson - New York NY, US
Rebecca J. Nelson - New York NY, US
Michael A. Gore - New York NY, US
Tyr Wiesner-Hanks - New York NY, US
Ethan Stewart - New York NY, US
Jason Yosinski - New York NY, US
Siyuan Chen - New York NY, US

International Classification:

G06K 9/00
G06N 5/04
G06N 3/04
G06N 3/08

Abstract:

Disclosed are devices, systems, apparatus, methods, products, and other implementations, including a method to detect pattern characteristics in target specimens that includes acquiring sensor data for the target specimens, dividing the acquired sensor data into a plurality of data segments, and generating, by multiple neural networks that each receives the plurality of data segments, multiple respective output matrices, with each data element of the multiple respective output matrices being representative of a probability that corresponding sensor data of a respective one of the plurality of data segments includes a pattern characteristic in the target specimens. The method further includes determining by another neural network, based on the multiple respective output matrices generated by the multiple neural networks, a presence of the pattern characteristic in the target specimens.