Stephen B. Ippolito - Tampa FL M. Selim Unlu - Jamaica Plain MA Bennett B Goldberg - Newton MA
Assignee:
The Trustees of Boston University - Boston MA
International Classification:
G02B 2102
US Classification:
359656, 359661
Abstract:
A viewing enhancement lens ( -NAIL) which functions to increase the numerical aperture or light gathering or focusing power of viewing optics such as a microscope ( ) used to view structure within a substrate such as a semiconductor wafer or chip or of imaging optics such as media recorders. The result is to increase the resolution of the system by a factor of between n, and n , where n is the index of retraction of the lens substrate.
Method For Imaging A Feature Using A Scanning Probe Microscope
- Fremont CA, US Stephen Bradley Ippolito - Saint Petersburg FL, US Sean Zumwalt - Oxnard CA, US
Assignee:
DCG Systems, Inc. - Fremont CA
International Classification:
G01Q 60/30
Abstract:
Using a local-potential-driving probe drives a conductor to a known potential while adjacent lines are grounded through the sample body reduces electrostatic scanning microscope signal from adjacent lines, allows imaging of metal lines deeper in the sample. Providing different potentials locally on different conductive lines using multiple local-potential-driving probes allows different conductors to be highlighted in the same image, for example, by changing the phase of the signal being applied to the different local-potential-driving probes.
- Goleta CA, US Stephen Bradley Ippolito - Saint Petersburg FL, US
International Classification:
G01Q 20/02 G01Q 60/24 G02B 6/36 G01Q 60/38
Abstract:
A SPM head incorporates a probe and a cantilever on which the probe is mounted. The cantilever has a planar reflecting surface proximate a free end of the cantilever. The cantilever extends from a mechanical mount and a single-mode optical fiber is supported by the mechanical mount to provide a beam. A micromirror is mounted to reflect the beam substantially 90 to the planar reflecting surface.
A SPM head incorporates a probe and a cantilever on which the probe is mounted. The cantilever has a planar reflecting surface proximate a free end of the cantilever. The cantilever extends from a mechanical mount and a single-mode optical fiber is supported by the mechanical mount to provide a beam axis at an angle away from normal relative to the reflecting surface.
Apparatus And Method For Atomic Force, Near-Field Scanning Optical Microscopy
- Santa Barbara CA, US Stephen Bradley Ippolito - Saint Petersburg FL, US Anton Lewis Riley - Santa Barbara CA, US
International Classification:
G02B 21/00 G02B 6/26
Abstract:
A near-field optic has a high refractive index waveguide with a planar far field facet more than half of a wavelength across for coupling propagating light and a near field facet with the near field zone of the waveguide supporting only the fundamental optical mode in each polarization. A tapered waveguide section extends from the near field facet to transform the fundamental optical mode. A cantilever supports the tapered waveguide section.