Stephen A Ippolito

US Patent:

6687058, Feb 3, 2004

Filed:

Dec 20, 2001

Appl. No.:

10/019133

Inventors:

Stephen B. Ippolito - Tampa FL
M. Selim Unlu - Jamaica Plain MA
Bennett B Goldberg - Newton MA

Assignee:

The Trustees of Boston University - Boston MA

International Classification:

G02B 2102

US Classification:

359656, 359661

Abstract:

A viewing enhancement lens ( -NAIL) which functions to increase the numerical aperture or light gathering or focusing power of viewing optics such as a microscope ( ) used to view structure within a substrate such as a semiconductor wafer or chip or of imaging optics such as media recorders. The result is to increase the resolution of the system by a factor of between n, and n , where n is the index of retraction of the lens substrate.

US Patent:

7110118, Sep 19, 2006

Filed:

Dec 19, 2001

Appl. No.:

10/451096

Inventors:

Selim M. Ünlü - Jamaica Plain MA, US
Anna Swan - Cambridge MA, US
Bennett B. Goldberg - Newton MA, US
Stephen Ippolito - Tampa FL, US
Lev Moiseev - Brighton MA, US
Yunjie Tong - Allston MA, US

Assignee:

Trustees of Boston University - Boston MA

International Classification:

G01B 9/02

US Classification:

356450, 356512

Abstract:

A method and apparatus for performing optical microscopy in one to three dimensions employs a spectral self-interference fluorescent microscopy technique that includes providing at least one fluorescent microscopy sample, at least one objective lens, and at least one reflecting surface. The fluorescent sample is disposed between the objective lens and the reflecting surface, the distance from the sample to the reflecting surface being several to several tens times an excitation wavelength. Excitation light causes the fluorescent sample to emit light, at least a portion of which is reflected by the reflecting surface. The objective lens collects the reflected light and the light emitted directly by the fluorescent sample. The direct and reflected light interfere causing spectral oscillations in the emission spectrum. The periodicity and the peak wavelengths of the emission spectrum are spectroscopically analyzed to determine the optical path length between the fluorescent sample and the reflecting surface.

US Patent:

20160231353, Aug 11, 2016

Filed:

Feb 3, 2016

Appl. No.:

15/015067

Inventors:

- Fremont CA, US
Stephen Bradley Ippolito - Saint Petersburg FL, US
Sean Zumwalt - Oxnard CA, US

Assignee:

DCG Systems, Inc. - Fremont CA

International Classification:

G01Q 60/30

Abstract:

Using a local-potential-driving probe drives a conductor to a known potential while adjacent lines are grounded through the sample body reduces electrostatic scanning microscope signal from adjacent lines, allows imaging of metal lines deeper in the sample. Providing different potentials locally on different conductive lines using multiple local-potential-driving probes allows different conductors to be highlighted in the same image, for example, by changing the phase of the signal being applied to the different local-potential-driving probes.

US Patent:

20160202288, Jul 14, 2016

Filed:

Feb 18, 2016

Appl. No.:

15/047560

Inventors:

- Goleta CA, US
Stephen Bradley Ippolito - Saint Petersburg FL, US

International Classification:

G01Q 20/02
G01Q 60/24
G02B 6/36
G01Q 60/38

Abstract:

A SPM head incorporates a probe and a cantilever on which the probe is mounted. The cantilever has a planar reflecting surface proximate a free end of the cantilever. The cantilever extends from a mechanical mount and a single-mode optical fiber is supported by the mechanical mount to provide a beam. A micromirror is mounted to reflect the beam substantially 90 to the planar reflecting surface.

US Patent:

20160025771, Jan 28, 2016

Filed:

Jul 22, 2015

Appl. No.:

14/805679

Inventors:

- Santa Barbara CA, US
Stephen Bradley Ippolito - Saint Petersburg FL, US
Kyle Alfred Hofstatter - Santa Barbara CA, US

International Classification:

G01Q 20/02
G01Q 60/38
G01Q 60/24
G02B 6/26
G02B 6/255

Abstract:

A SPM head incorporates a probe and a cantilever on which the probe is mounted. The cantilever has a planar reflecting surface proximate a free end of the cantilever. The cantilever extends from a mechanical mount and a single-mode optical fiber is supported by the mechanical mount to provide a beam axis at an angle away from normal relative to the reflecting surface.

US Patent:

20150338627, Nov 26, 2015

Filed:

May 21, 2015

Appl. No.:

14/719203

Inventors:

- Santa Barbara CA, US
Stephen Bradley Ippolito - Saint Petersburg FL, US
Anton Lewis Riley - Santa Barbara CA, US

International Classification:

G02B 21/00
G02B 6/26

Abstract:

A near-field optic has a high refractive index waveguide with a planar far field facet more than half of a wavelength across for coupling propagating light and a near field facet with the near field zone of the waveguide supporting only the fundamental optical mode in each polarization. A tapered waveguide section extends from the near field facet to transform the fundamental optical mode. A cantilever supports the tapered waveguide section.