Maureen M. Lein - Chester NH Ellen Lord - So. Berwick ME Richard C. Eisfeller - Greenland NH Mark E. Dukeshire - New Durham NH Richard W. Finch - Northford CT Alfred T. Poliquin - Dover NH Gerard L. Vachon - Somersworth NH John B. Clark - Stratham NH Stephen P. McLaughlin - Bloomfield Hills MI Robert D. Sparling - Madbury NH
Assignee:
Textron Automotive Company - Troy MI
International Classification:
B32B 300
US Classification:
428195, 428203, 428458
Abstract:
A process for manufacturing a metallized substrate using the island coating method, includes depositing a coating layer containing a radiation curable non-volatile film former. The coated part is then vacuum metallized to form the metal islands of the present invention. A layer of clear resinous protective dielectric topcoat containing a radiation curable non-volatile film former is then deposited to completely cover the layer of metal islands while maintaining the aesthetic properties of the metallizing island coating system at a reduced cost and with minimal variability among parts.
Masud Azimi - Belmont MA, US Arran Bibby - Savannah GA, US Christopher D. Brown - Haverhill MA, US Peili Chen - Andover MA, US Kevin J. Knopp - Newburyport MA, US Daryoosh Vakhshoori - Cambridge MA, US Peidong Wang - Carlisle MA, US Stephen McLaughlin - Andover MA, US
Assignee:
Ahura Scientific Inc. - Wilmington MA
International Classification:
G01N 21/35 G01N 21/65
US Classification:
356 73, 356301, 25033908, 25033911
Abstract:
We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.
Kevin J. Knopp - Newburyport MA, US Daryoosh Vakhshoori - Cambridge MA, US Peidong Wang - Carlisle MA, US Masud Azimi - Belmont MA, US Scott E. Miller - Somerville MA, US Jason Goldstein - Salem NH, US Stephen McLaughlin - Andover MA, US
Assignee:
Thermo Scientific Portable Analytical Instruments Inc. - Tewksbury MA
International Classification:
A61B 10/00
US Classification:
422536, 422 50, 422500, 422501, 422502, 436180
Abstract:
Systems and methods disclosed include: a support apparatus configured to detachably receive a chip; movable pins extendible from a first position to a second position, where, in the first position, the movable pins do not contact a chip positioned on the support apparatus, and in the second position, the movable pins contact electrical terminals of a heating element within a chip positioned on the support apparatus; a radiation source configured to direct radiation to be incident on a chip positioned on the support apparatus; a detector; and an electronic processor, the electronic processor being configured to detect molecules in a sample positioned within the chip, and to determine a temperature of the chip by measuring an electrical resistance between two of the multiple pins connected to the electrical terminals.
Masud AZIMI - Belmont MA, US Arran BIBBY - Savannah GA, US Christopher D. BROWN - Haverhill MA, US Peili CHEN - Andover MA, US Kevin J. KNOPP - Newburyport MA, US Daryoosh VAKHSHOORI - Cambridge MA, US Peidong WANG - Carlisle MA, US Stephen MCLAUGHLIN - Andover MA, US
International Classification:
G01N 21/01
US Classification:
356244
Abstract:
We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.
Maureen M. Lein - Chester NH Ellen Lord - Berwick ME Richard C. Eisfeller - Greenland NH Mark E. Dukeshire - New Durham NH Richard W. Finch - Northford CT Alfred T. Poliquin - Dover NH Gerard L. Vachon - Somersworth NH John B. Clark - Stratham NH Stephen P. McLaughlin - Bloomfield Hills MI Robert D. Sparling - Madbury NH
Assignee:
Davidson Textron Inc. - Dover NH
International Classification:
B32B 300
US Classification:
428195
Abstract:
A process for manufacturing a metallized substrate using the island coating method, includes depositing a coating layer containing a radiation curable non-volatile film former. The coated part is then vacuum metallized to form the metal islands of the present invention. A layer of clear resinous protective dielectric topcoat containing a radiation curable non-volatile film former is then deposited to completely cover the layer of metal islands while maintaining the aesthetic properties of the metallizing island coating system at a reduced cost and with minimal variability among parts.
Michael Burka - Winchester MA, US Stephen McLaughlin - Andover MA, US Malcolm C. Smith - Winchester MA, US Jie Zhang - Hockessin DE, US
International Classification:
G01J 3/02 G01J 3/44
US Classification:
356301
Abstract:
A side-looking optical probe for a Raman spectroscopy system is provided. The probe includes: a base for mounting the probe to an optical assembly of the system; and a prism mounted to the base, the prism configured for receiving signal light from a sample and providing the signal light to the system. A method of fabrication and a spectrometer are provided.
Malcolm Smith - Winchester MA, US Michael Burka - Winchester MA, US Stephen McLaughlin - Andover MA, US
International Classification:
G01J 3/02
US Classification:
356301
Abstract:
In an embodiment, an apparatus may include a light source, a beam manipulator, an optical component, an analyzer, and a detector. The light source may generate an incident light at a first frequency. The beam manipulator may include one or more polyhedron-shaped prisms that may deflect the incident light for focus at a plurality of points on a sample. The optical component may collect the deflected incident light, focus the collected deflected incident light at the plurality of points on the sample, and collect scattered light from the sample. The scattered light may include elastic scattered light and/or inelastic scattered light. The inelastic scattered light may have a second frequency that is shifted up or down from the first frequency. The detector may detect the inelastic scattered light and the analyzer may identify a substance contained in the sample based on the detected inelastic scattered light.