Stephen P Mclaughlin

US Patent:

8081305, Dec 20, 2011

Filed:

Mar 30, 2009

Appl. No.:

12/414111

Inventors:

Masud Azimi - Belmont MA, US
Arran Bibby - Savannah GA, US
Christopher D. Brown - Haverhill MA, US
Peili Chen - Andover MA, US
Kevin J. Knopp - Newburyport MA, US
Daryoosh Vakhshoori - Cambridge MA, US
Peidong Wang - Carlisle MA, US
Stephen McLaughlin - Andover MA, US

Assignee:

Ahura Scientific Inc. - Wilmington MA

International Classification:

G01N 21/35
G01N 21/65

US Classification:

356 73, 356301, 25033908, 25033911

Abstract:

We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.

US Patent:

D670587, Nov 13, 2012

Filed:

Jun 1, 2011

Appl. No.:

29/393237

Inventors:

Maura Fitzpatrick - North Chelmsford MA, US
Stephen McLaughlin - Andover MA, US
Gregory H. Vander Rhodes - Melrose MA, US

Assignee:

Thermo Scientific Portable Analytical Instruments Inc. - Tewksbury MA

International Classification:

1004

US Classification:

D10 81

US Patent:

20120092658, Apr 19, 2012

Filed:

Dec 19, 2011

Appl. No.:

13/330649

Inventors:

Masud AZIMI - Belmont MA, US
Arran BIBBY - Savannah GA, US
Christopher D. BROWN - Haverhill MA, US
Peili CHEN - Andover MA, US
Kevin J. KNOPP - Newburyport MA, US
Daryoosh VAKHSHOORI - Cambridge MA, US
Peidong WANG - Carlisle MA, US
Stephen MCLAUGHLIN - Andover MA, US

International Classification:

G01N 21/01

US Classification:

356244

Abstract:

We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.

US Patent:

20150146201, May 28, 2015

Filed:

May 2, 2013

Appl. No.:

13/875671

Inventors:

Michael Burka - Winchester MA, US
Stephen McLaughlin - Andover MA, US
Malcolm C. Smith - Winchester MA, US
Jie Zhang - Hockessin DE, US

International Classification:

G01J 3/02
G01J 3/44

US Classification:

356301

Abstract:

A side-looking optical probe for a Raman spectroscopy system is provided. The probe includes: a base for mounting the probe to an optical assembly of the system; and a prism mounted to the base, the prism configured for receiving signal light from a sample and providing the signal light to the system. A method of fabrication and a spectrometer are provided.

US Patent:

20150131091, May 14, 2015

Filed:

Nov 14, 2013

Appl. No.:

14/080234

Inventors:

Malcolm Smith - Winchester MA, US
Michael Burka - Winchester MA, US
Stephen McLaughlin - Andover MA, US

International Classification:

G01J 3/02

US Classification:

356301

Abstract:

In an embodiment, an apparatus may include a light source, a beam manipulator, an optical component, an analyzer, and a detector. The light source may generate an incident light at a first frequency. The beam manipulator may include one or more polyhedron-shaped prisms that may deflect the incident light for focus at a plurality of points on a sample. The optical component may collect the deflected incident light, focus the collected deflected incident light at the plurality of points on the sample, and collect scattered light from the sample. The scattered light may include elastic scattered light and/or inelastic scattered light. The inelastic scattered light may have a second frequency that is shifted up or down from the first frequency. The detector may detect the inelastic scattered light and the analyzer may identify a substance contained in the sample based on the detected inelastic scattered light.