Steve B Kim

US Patent:

6830189, Dec 14, 2004

Filed:

Jun 15, 2001

Appl. No.:

09/883130

Inventors:

Constantine J. Tsikos - Voorhees NJ
Allan Wirth - Bedford MA
Andrew Jankevics - Westford MA
Steve Y. Kim - Cambridge MA
Timothy Good - Clementon NJ
Thomas Amundsen - Turnersville NJ
Charles A. Naylor - Sewell NJ
Russell Joseph Dobbs - Cherry Hill NJ
Xiaoxun Zhu - Marlton NJ
Michael D. Schnee - Aston PA
Carl Harry Knowles - Moorestown NJ

Assignee:

Metrologic Instruments, Inc. - Blackwood NJ

International Classification:

G06K 710

US Classification:

23546222, 23546201, 23546225, 23546242, 23546245, 23546248

Abstract:

Methods of and systems for illuminating objects using planar laser illumination beams having substantially-planar spatial distribution characteristics that extend through the field of view (FOV) of image formation and detection modules employed in such systems. Each planar laser illumination beam is produced from a planar laser illumination beam array (PLIA) comprising an plurality of planar laser illumination modules (PLIMs). Each PLIM comprises a visible laser diode (VLD, a focusing lens, and a cylindrical optical element arranged therewith. The individual planar laser illumination beam components produced from each PLIM are optically combined to produce a composite substantially planar laser illumination beam having substantially uniform power density characteristics over the entire spatial extend thereof and thus the working range of the system. Preferably, each planar laser illumination beam component is focused so that the minimum beam width thereof occurs at a point or plane which is the farthest or maximum object distance at which the system is designed to acquire images, thereby compensating for decreases in the power density of the incident planar laser illumination beam due to the fact that the width of the planar laser illumination beam increases in length for increasing object distances away from the imaging optics. Advanced high-resolution wavefront control methods and devices are disclosed for use with the PLIIM-based systems in order to reduce the power of speckle-noise patterns observed at the image detections thereof.

US Patent:

7600689, Oct 13, 2009

Filed:

Jun 26, 2007

Appl. No.:

11/821940

Inventors:

Constantine J. Tsikos - Voorhees NJ, US
Allan Wirth - Bedford MA, US
Timothy A. Good - Clementon NJ, US
Andrew Jankevics - Westford MA, US
Steve Y. Kim - Cambridge MA, US
Thomas Amundsen - Turnersville NJ, US
Charles A. Naylor - Sewell NJ, US
Russell Joseph Dobbs - Cherry Hill NJ, US
Patrick A. Giordano - Blackwood NJ, US
Jeffery Yorsz - Winchester MA, US
Mark S. Schmidt - Williamstown NJ, US
Stephen J. Colavito - Brookhaven PA, US
Ka Man Au - Philadelphia PA, US
William Svedas - Deptford NJ, US
Sankar Ghosh - Glenolden PA, US
Michael D. Schnee - Aston PA, US
Xiaoxun Zhu - Marlton NJ, US
C. Harry Knowles - Moorestown NJ, US

Assignee:

Metrologic Instruments, Inc. - Blackwood NJ

International Classification:

G06K 7/10

US Classification:

23546243, 23547225

Abstract:

Methods of and systems for illuminating objects using planar laser illumination beams having substantially-planar spatial distribution characteristics that extend through the field of view (FOV) of image formation and detection modules employed in such systems. Each planar laser illumination beam is produced from a planar laser illumination beam array (PLIA) comprising an plurality of planar laser illumination modules (PLIMs). Each PLIM comprises a visible laser diode (VLD, a focusing lens, and a cylindrical optical element arranged therewith. The individual planar laser illumination beam components produced from each PLIM are optically combined to produce a composite substantially planar laser illumination beam having substantially uniform power density characteristics over the entire spatial extend thereof and thus the working range of the system. Preferably, each planar laser illumination beam component is focused so that the minimum beam width thereof occurs at a point or plane which is the farthest or maximum object distance at which the system is designed to acquire images, thereby compensating for decreases in the power density of the incident planar laser illumination beam due to the fact that the width of the planar laser illumination beam increases in length for increasing object distances away from the imaging optics. Advanced high-resolution wavefront control methods and devices are disclosed for use with the PLIIM-based systems in order to reduce the power of speckle-noise patterns observed at the image detections thereof.

US Patent:

20020134180, Sep 26, 2002

Filed:

Feb 11, 2002

Appl. No.:

10/074350

Inventors:

Jacob Gorin - Studio City CA, US
Steve Kim - Valencia CA, US

International Classification:

F16H025/20

US Classification:

074/089370, 074/089380, 192/141000

Abstract:

A linear actuator for providing linear motion of an output shaft member and automatically disconnecting the shaft from a gear train comprising a rotatable shaft adapted to be coupled to an electrically powered gear train for causing rotation of the shaft; a shaft member mounted onto the rotatable shaft and axially moveable between a retracted position and an extended position in response to rotation of the shaft; a rotatable screw co-acting with the gear train to rotate in response to movement of the gear train; a second member mounted on the rotatable screw and axially moveable in response to rotation of the screw between the retracted position and the extended position; a switch unit located at at least one of the extended and retracted positions and responsive to engagement with the moveable second member for causing an electrical disconnection between the gear train and a power source to cause termination of shaft rotation; and a member coupled to the rotatable shaft for disconnecting the shaft from the gear train in response to the shaft member or second member reaching the retracted position.

US Patent:

20020139853, Oct 3, 2002

Filed:

Sep 17, 2001

Appl. No.:

09/954477

Inventors:

Constantine Tsikos - Voorhees NJ, US
Allan Wirth - Bedford MA, US
Timothy Good - Clementon NJ, US
Andrew Jankevics - Westford MA, US
Steve Kim - Cambridge MA, US
Thomas Amundsen - Turnersville NJ, US
Charles Naylor - Sewell NJ, US
Russell Dobbs - Cherry Hill NJ, US
Patrick Giordano - Blackwood NJ, US
Jeffery Yorsz - Winchester MA, US
Mark Schmidt - Williamstown NJ, US
Stephen Colavito - Brookhaven PA, US
David Wilz - Sewell NJ, US
Ka Au - Philadelphia PA, US
William Svedas - Deptford NJ, US
Sankar Ghosh - Glenolden PA, US
Michael Schnee - Aston PA, US
Xiaoxun Zhu - Marlton NJ, US
C. Knowles - Moorestown NJ, US

Assignee:

Metrologic Instruments, Inc. - Blackwood NJ

International Classification:

G06K007/10

US Classification:

235/462010

Abstract:

Methods of and systems for illuminating objects using planar laser illumination beams having substantially-planar spatial distribution characteristics that extend through the field of view (FOV) of image formation and detection modules employed in such systems. Each planar laser illumination beam is produced from a planar laser illumination beam array (PLIA) comprising an plurality of planar laser illumination modules (PLIMs). Each PLIM comprises a visible laser diode (VLD, a focusing lens, and a cylindrical optical element arranged therewith. The individual planar laser illumination beam components produced from each PLIM are optically combined to produce a composite substantially planar laser illumination beam having substantially uniform power density characteristics over the entire spatial extend thereof and thus the working range of the system. Preferably, each planar laser illumination beam component is focused so that the minimum beam width thereof occurs at a point or plane which is the farthest or maximum object distance at which the system is designed to acquire images, thereby compensating for decreases in the power density of the incident planar laser illumination beam due to the fact that the width of the planar laser illumination beam increases in length for increasing object distances away from the imaging optics. Advanced high-resolution wavefront control methods and devices are disclosed for use with the PLIIM-based systems in order to reduce the power of speckle-noise patterns observed at the image detections thereof. By virtue of the present invention, it is now possible to use both VLDs and high-speed CCD-type image detectors in conveyor, hand-held and hold-under type imaging applications alike, enjoying the advantages and benefits that each such technology has to offer, while avoiding the shortcomings and drawbacks hitherto associated therewith.

US Patent:

20020153422, Oct 24, 2002

Filed:

Feb 1, 2002

Appl. No.:

10/066547

Inventors:

Constantine Tsikos - Voorhees NJ, US
Allan Wirth - Bedford MA, US
Timothy Good - Clementon NJ, US
Andrew Jankevics - Westford MA, US
Steve Kim - Cambridge MA, US
Thomas Amundsen - Turnersville NJ, US
Charles Naylor - Sewell NJ, US
Russell Dobbs - Cherry Hill NJ, US
Patrick Giordano - Blackwood NJ, US
Jeffery Yorsz - Winchester MA, US
Mark Schmidt - Williamstown NJ, US
Stephen Colavito - Brookhaven PA, US
David Wilz - Sewell NJ, US
Ka Au - Philadelphia PA, US
William Svedas - Deptford NJ, US
Sankar Ghosh - Glenolden PA, US
Michael Schnee - Aston PA, US
Xiaoxun Zhu - Marlton NJ, US
C. Knowles - Moorestown NJ, US

International Classification:

G06K007/10
G06K007/14

US Classification:

235/454000

Abstract:

Methods of and systems for illuminating objects using planar laser illumination beams having substantially-planar spatial distribution characteristics that extend through the field of view (FOV) of image formation and detection modules employed in such systems. Each planar laser illumination beam is produced from a planar laser illumination beam array (PLIA) comprising an plurality of planar laser illumination modules (PLIMs). Each PLIM comprises a visible laser diode (VLD, a focusing lens, and a cylindrical optical element arranged therewith. The individual planar laser illumination beam components produced from each PLIM are optically combined to produce a composite substantially planar laser illumination beam having substantially uniform power density characteristics over the entire spatial extend thereof and thus the working range of the system. Preferably, each planar laser illumination beam component is focused so that the minimum beam width thereof occurs at a point or plane which is the farthest or maximum object distance at which the system is designed to acquire images, thereby compensating for decreases in the power density of the incident planar laser illumination beam due to the fact that the width of the planar laser illumination beam increases in length for increasing object distances away from the imaging optics. Advanced high-resolution wavefront control methods and devices are disclosed for use with the PLIIM-based systems in order to reduce the power of speckle-noise patterns observed at the image detections thereof. By virtue of the present invention, it is now possible to use both VLDs and high-speed CCD-type image detectors in conveyor, hand-held and hold-under type imaging applications alike, enjoying the advantages and benefits that each such technology has to offer, while avoiding the shortcomings and drawbacks hitherto associated therewith.

US Patent:

20030042308, Mar 6, 2003

Filed:

Feb 5, 2002

Appl. No.:

10/067540

Inventors:

Constantine Tsikos - Voorhees NJ, US
Allan Wirth - Bedford MA, US
Timothy Good - Clementon NJ, US
Andrew Jankevics - Westford MA, US
Steve Kim - Cambridge MA, US
Thomas Amundsen - Turnersville NJ, US
Charles Naylor - Sewell NJ, US
Russell Dobbs - Cherry Hill NJ, US
Patrick Giordano - Black wood NJ, US
Jeffery Yorsz - Winchester MA, US
Mark Schmidt - Williamstown NJ, US
Stephen Colavito - Brookhaven PA, US
David Wilz - Sewell NJ, US
Ka Au - Philadelphia PA, US
William Svedas - Deptford NJ, US
Sankar Ghosh - Glenolden PA, US
Michael Schnee - Aston PA, US
Xiaoxun Zhu - Marlton NJ, US
C. Knowles - Moorestown NJ, US

International Classification:

G06K007/10
G06K007/14

US Classification:

235/454000

Abstract:

Methods of and systems for illuminating objects using planar laser illumination beams having substantially-planar spatial distribution characteristics that extend through the field of view (FOV) of image formation and detection modules employed in such systems. Each planar laser illumination beam is produced from a planar laser illumination beam array (PLIA) comprising an plurality of planar laser illumination modules (PLIMs). Each PLIM comprises a visible laser diode (VLD, a focusing lens, and a cylindrical optical element arranged therewith. The individual planar laser illumination beam components produced from each PLIM are optically combined to produce a composite substantially planar laser illumination beam having substantially uniform power density characteristics over the entire spatial extend thereof and thus the working range of the system. Preferably, each planar laser illumination beam component is focused so that the minimum beam width thereof occurs at a point or plane which is the farthest or maximum object distance at which the system is designed to acquire images, thereby compensating for decreases in the power density of the incident planar laser illumination beam due to the fact that the width of the planar laser illumination beam increases in length for increasing object distances away from the imaging optics. Advanced high-resolution wavefront control methods and devices are disclosed for use with the PLIIM-based systems in order to reduce the power of speckle-noise patterns observed at the image detections thereof. By virtue of the present invention, it is now possible to use both VLDs and high-speed CCD-type image detectors in conveyor, hand-held and hold-under type imaging applications alike, enjoying the advantages and benefits that each such technology has to offer, while avoiding the shortcomings and drawbacks hitherto associated therewith.

US Patent:

20030146282, Aug 7, 2003

Filed:

Feb 6, 2002

Appl. No.:

10/068803

Inventors:

Constantine Tsikos - Voorhees NJ, US
Allan Wirth - Bedford MA, US
Timothy Good - Clementon NJ, US
Andrew Jankevics - Westford MA, US
Steve Kim - Cambridge MA, US
Thomas Amundsen - Turnersville NJ, US
Charles Naylor - Sewell NJ, US
Russell Dobbs - Cherry Hill NJ, US
Patrick Giordano - Blackwood NJ, US
Jeffery Yorsz - Winchester MA, US
Mark Schmidt - Williamstown NJ, US
Stephen Colavito - Brookhaven PA, US
David Wilz - Sewell NJ, US
Ka Au - Philadelphia PA, US
William Svedas - Deptford NJ, US
Sankar Ghosh - Glenolden PA, US
Michael Schnee - Aston PA, US
Xiaoxun Zhu - Marlton NJ, US
C. Knowles - Moorestown NJ, US

Assignee:

Metrologic Instruments, Inc. - Blackwood NJ

International Classification:

G06K007/10
G06K007/14

US Classification:

235/454000

Abstract:

Methods of and systems for illuminating objects using planar laser illumination beams having substantially-planar spatial distribution characteristics that extend through the field of view (FOV) of image formation and detection modules employed in such systems. Each planar laser illumination beam is produced from a planar laser illumination beam array (PLIA) comprising an plurality of planar laser illumination modules (PLIMs). Each PLIM comprises a visible laser diode (VLD, a focusing lens, and a cylindrical optical element arranged therewith The individual planar laser illumination beam components produced from each PLIM are optically combined to produce a composite substantially planar laser illumination beam having substantially uniform power density characteristics over the entire spatial extend thereof and thus the working range of the system. Preferably, each planar laser illumination bear component is focused so that the minimum beam width thereof occurs at a point or plane which is the farthest or maximum object distance at which the system is designed to acquire images, thereby compensating for decreases in the power density of the incident planar laser illumination beam due to the fact that the width of the planar laser illumination beam increases in length for increasing object distances away from the imaging optics. Advanced high-resolution wavefront control methods and devices are disclosed for use with the PLIIM-based systems in order to reduce the power of speckle-noise patterns observed at the image detections thereof. By virtue of the present invention, it is now possible to use both VLDs and high-speed CCD-type image detectors in conveyor, hand-held and hold-under type imaging applications alike, enjoying the advantages and benefits that each such technology has to offer, while avoiding the shortcomings and drawbacks hitherto associated therewith.

US Patent:

20110258351, Oct 20, 2011

Filed:

Apr 20, 2010

Appl. No.:

12/799270

Inventors:

Steve Kim - Cerritos CA, US

International Classification:

G06F 13/12

US Classification:

710 74

Abstract:

A private restricted access email & storage system which utilizes a connector for connection to a conventional computer, a flash drive connected to the connector and a micro-controller connected to at least one of the connector and the flash drive and which may, in combination with the permissions and compatibility detected in the conventional computer, enable selected access to the flash drive to perform private email and file access functions.