Steven L Burnham

US Patent:

6597232, Jul 22, 2003

Filed:

Mar 28, 2002

Appl. No.:

10/109614

Inventors:

Steven Burnham - Blackstone MA

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

H03K 1762

US Classification:

327407

Abstract:

A multiplexer having a plurality of multiplexer devices. Each one of the devices is adapted to couple a selected one of a plurality of 2 output/input ports, where C is an integer, to an input/output port of such device when an N bit device address code fed to such device matches an N bit device address wired to the device. The one of the output/input ports is selected in accordance with a C bit channel select code fed to the device. The multiplexer includes a plurality of cascaded levels of such devices, a first one of such levels having a plurality of [2 -M], where M is a non-zero integer less than 2 of the devices. A common port for the multiplexer is connected to the input/output ports of the plurality of the devices in the first level, The input/output ports of the devices in a succeeding level are connected to the output/input ports of the devices in the preceding level of devices. In one embodiment, N is 3 and M is 5. In one embodiment, each one of the devices passes an I2C signal.

US Patent:

7600202, Oct 6, 2009

Filed:

Sep 14, 2006

Appl. No.:

11/520979

Inventors:

Steven Burnham - Blackstone MA, US

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

G06F 17/50

US Classification:

716 4, 716 1, 716 5

Abstract:

A technique for providing a product FIT rate is performed within electronic circuitry (e. g. , one or more computerized devices). The technique involves receiving a Mean Time To Failure (MTTF) target for a product and a Mean Time To Repair (MTTR) target for the product (e. g. , a circuit board module). The technique further involves establishing a FIT rate based on the MTTF target and the MTTR target, and then outputting the FIT rate to a design process for the product (e. g. , a circuit board design process). The FIT rate is a number of product failures expected per amount of time of product operation.