Steven M Cramer

US Patent:

6573373, Jun 3, 2003

Filed:

Jun 29, 1999

Appl. No.:

09/343006

Inventors:

Abhinav A. Shukla - Bothell WA
Ranjit R. Deshmukh - San Diego CA
Steven M. Cramer - Schenectady NY
James A. Moore - Troy NY

Assignee:

ISIS Pharmaceuticals, Inc. - Carlsbad CA
Rensselaer Polytechin Institute - Troy NY

International Classification:

C07H 2100

US Classification:

536 254, 536 2541

Abstract:

A method for purifying oligonucleotides by displacement chromatography on anion-exchange media, using high affinity, low molecular weight (less than about 10000 Da) displacers, is disclosed. Several examples of high affinity, low molecular weight anionic displacers are provided, including polycyclic aromatic compounds having sulfonic acid moieties attached thereon. The efficacy of the technique for high resolution separation of oligonucleotides is demonstrated for an industrial mixture.

US Patent:

6828436, Dec 7, 2004

Filed:

May 15, 2002

Appl. No.:

10/146266

Inventors:

Abhinav A. Shukla - Bothell WA
Ranjit R. Deshmukh - San Diego CA
Steven M. Cramer - Schenectady NY
James A. Moore - Troy NY

Assignee:

ISIS Pharmaceuticals, Inc. - Carlsbad CA
Rensselaer Polytechnic Institute - Troy NY

International Classification:

C07H 2100

US Classification:

536 254, 536 2541, 536 553, 530416, 530412, 530344

Abstract:

A method for purifying oligonucleotides by displacement chromatography on anion-exchange media, using high affinity, low molecular weight (less than about 10000 Da) displacers, is disclosed. Several examples of high affinity, low molecular weight anionic displacers are provided, including polycyclic aromatic compounds having sulfonic acid moieties attached thereon. The efficacy of the technique for high resolution separation of oligonucleotides is demonstrated for an industrial mixture.

US Patent:

D515717, Feb 21, 2006

Filed:

Feb 11, 2004

Appl. No.:

29/199238

Inventors:

James Michael Cormier - Wichita KS, US
Angela T. den Hoed - Metz-Tessy, FR
Steven Mitchell Cramer - Redmond WA, US

Assignee:

The Coleman Company, Inc. - Wichita KS

International Classification:

2602

US Classification:

D26 37

US Patent:

D637653, May 10, 2011

Filed:

Jul 1, 2010

Appl. No.:

29/365007

Inventors:

Travis Justin Hosler - Seattle WA, US
Austin Rand Porter - Seattle WA, US
Steven M. Cramer - Redmond WA, US
Kwok Sum Ho - Hong Kong, HK

Assignee:

THQ Inc. - Agoura Hills CA

International Classification:

2101

US Classification:

D21329

US Patent:

63085712, Oct 30, 2001

Filed:

Sep 1, 1999

Appl. No.:

9/388192

Inventors:

Mark A. Stanish - Seattle WA
Stan L. Floyd - Enumclaw WA
Steven M. Cramer - Lodi WI

Assignee:

Weyerhaeuser Company - Federal Way WA

International Classification:

G01N 2918
F26B 1310

US Classification:

73597

Abstract:

A method for determining crook potential of wood is described. One embodiment comprises nondestructively obtaining lengthwise shrinkage rates (from a third party or by direct measurement) of wood and then determining crook potential of the wood based on the lengthwise shrinkage rates. Where the wood comprises lumber, lengthwise shrinkage rate measurements typically are made on at least one major planar surface of the lumber. The method typically comprises determining lengthwise shrinkage rates two or more measuring points separated by a predetermined distance, such as at substantially one-foot intervals along the lumber. Particular embodiments of the present invention determine lengthwise shrinkage rates using infrared radiation, microwave radiation, electricity, ultrasound energy, and combinations thereof Working embodiments of the method use ultrasound energy to determine lengthwise shrinkage rates. For example, one working embodiment measures the speed of an ultrasound pulse through wood to determine the modulus of elasticity (MOE) of the wood which can then be correlated to the lengthwise shrinkage rate. In another example, lengthwise shrinkage rate can be determined from the speed of an ultrasound pulse using an empirically derived formula, such as an exponential formula.

US Patent:

62931520, Sep 25, 2001

Filed:

Sep 2, 1999

Appl. No.:

9/389676

Inventors:

Mark A. Stanish - Seattle WA
Stan L. Floyd - Enumclaw WA
Steven M. Cramer - Lodi WI

Assignee:

Weyerhaeuser Company - Federal Way WA

International Classification:

G01N 3346
G01N 2900
G01R 2726

US Classification:

73597

Abstract:

A method for determining twist potential of wood is described. One embodiment of the method comprises nondestructively obtaining a grain angle of wood, such as trees or lumber, and then determining twist potential of the wood based on the grain angle. Where the wood comprises lumber, grain angle determinations typically are made on at least one major surface of the lumber. The method typically comprises determining grain angle at at least two measuring locations separated by a predetermined distance, such as at substantially one-foot intervals along the board. The method also can further comprise obtaining at least one fiber dive angle. Particular embodiments of the present invention determine grain angle using infrared radiation, microwave radiation, light energy (such as by using a laser), electricity, ultrasound energy, and combinations thereof. Working embodiments of the method used light energy and ultrasound energy to determine grain angle. For example, a first transmission speed of an ultrasound pulse through the board was determined along a first path and along a second path.

US Patent:

63052245, Oct 23, 2001

Filed:

Sep 2, 1999

Appl. No.:

9/389276

Inventors:

Mark A. Stanish - Seattle WA
Stan L. Floyd - Enumclaw WA
Steven M. Cramer - Lodi WI

Assignee:

Weyerhaeuser Company - Federal Way WA

International Classification:

G01N 2918
B23Q 1507
B27B 100
B26D 540

US Classification:

73597

Abstract:

A method for determining warp potential of wood. One embodiment comprises nondestructively obtaining lengthwise shrinkage rates and grain angles of wood--such as trees, logs, or lumber--then determining warp potential of the wood based on the lengthwise shrinkage rates and grain angles. The method typically comprises measuring plural lengthwise shrinkage rates and plural grain angles to determine warp potential. Where the wood comprises lumber, lengthwise shrinkage rate and grain angle measurements typically are made on at least one major planar surface of the lumber at at least two measuring points separated by a predetermined distance, such as at substantially one-foot intervals along the lumber. Particular embodiments of the present invention determine lengthwise shrinkage rates using electromagnetic energy, acoustic energy, and combinations thereof. Working embodiments of the method use ultrasound energy to determine lengthwise shrinkage rates and grain angles.

US Patent:

20190319660, Oct 17, 2019

Filed:

Oct 5, 2018

Appl. No.:

16/152846

Inventors:

- Fort Worth TX, US
Steven Cramer - Redmond WA, US

International Classification:

H04B 1/3888
F21V 29/70
G03B 17/56
H01L 27/15
H01L 33/54
H01L 33/64
F21V 33/00
F21L 4/00
F21V 29/507
H04M 1/18
H04M 1/22

Abstract:

A lighting device is disclosed having a plurality of LED chips mounted on a single planar flexible substrate, wherein the single planar flexible substrate is disposed in an arcuate orientation. A heat sink having an arcuate surface shaped to approximate the arcuate orientation of the flexible substrate is coupled to the flexible substrate between complementary arcuate surfaces. A luminescent coating is disposed about a top surface of the arcuate single planar flexible substrate.