Steven S Gilmore

US Patent:

8216867, Jul 10, 2012

Filed:

Jun 10, 2009

Appl. No.:

12/482165

Inventors:

Matthew Donofrio - Raleigh NC, US
Winston T. Parker - Cary NC, US
Michael John Bergmann - Chapel Hill NC, US
Steven Scott Gilmore - Raleigh NC, US
Jay Thomas Norman - Durham NC, US
Kevin Shawne Schneider - Cary NC, US

Assignee:

Cree, Inc. - Durham NC

International Classification:

H01L 21/00

US Classification:

438 33, 438462, 438463, 257E21347, 257E21599

Abstract:

A wafer of light emitting diodes (LEDs) is laser scribed to produce a laser scribing cut. Then, the wafer is cleaned, for example by wet etching, to reduce scribe damage. Then, electrical contact layers for the LEDs are formed on the wafer that has been cleaned. Alternatively, the scribing cut may be produced by multiple etches before contact formation. Related LEDs are also described.

US Patent:

20020126285, Sep 12, 2002

Filed:

Dec 18, 2000

Appl. No.:

09/739199

Inventors:

Steven Gilmore - West Bradford PA, US
John Leiby - Reading PA, US
John Rizzo - Oley PA, US
Kenneth Weidner - Limekiln PA, US

International Classification:

G01B011/00

US Classification:

356/399000

Abstract:

A test fixture for testing circuit components includes at least one test bar, at least one tray, a test pedestal, a transportable test stage, a pickup collet, a first camera, and a second camera. Each test bar contains at least one circuit component. Each tray contains at least one test bar. The test pedestal is adapted to hold at least one test bar. The transportable test stage includes at least one tray and the test pedestal. The transportable test stage transports the circuit component under test from the pickup collet to the test site and return. The trays and test pedestal are in a fixed position with respect to the test stage. The pickup collet picks up test bars from the trays and the test pedestal. The pickup collet also places the test bars in the trays and on the test pedestal. The first camera is used to visually align the pickup collet and components on the test stage, and read test bar identification codes. The second camera is used to visually align the test bars with a test site.

Address:

12516 Pawleys Ml Cir, Raleigh, NC 27614

VIN:

KNAFU6A27A5182654

Make:

KIA

Model:

FORTE KOUP

Year:

2010