Praveen Dani - San Jose CA, US Robert Fulton - Rancho Cordova CA, US Andrew M. Volk - Granite Bay CA, US Surya Musunuri - Roseville CA, US
International Classification:
H03B 21/00
US Classification:
327105
Abstract:
An apparatus for clock generation is presented. In one embodiment, the apparatus comprises a phase interpolator that generates an output with a phase value within reference phases associated with two input clocks. Logic units are coupled to determine a number of phase settings for the phase interpolator. A divider is coupled to the phase interpolator to generate an output clock based on a modifiable divider setting.
Corrosion Mitigation For An External Connector Of An Electronic Device
- Cupertino CA, US Nagendra Bage Jayaraj - San Jose CA, US Derek J. DiCarlo - San Jose CA, US Chi Kin Ho - Milpitas CA, US Xingqun Li - San Jose CA, US Jahan C. Minoo - San Jose CA, US Surya Musunuri - San Jose CA, US Tony Chi Wang Ng - Santa Clara CA, US Carlos Ribas - Los Altos CA, US Ching Yu John Tam - Los Gatos CA, US Evan J. Thompson - Sunnyvale CA, US Daniel C. Wagman - Scotts Valley CA, US Di Zhao - Santa Clara CA, US Robert D. Zupke - San Jose CA, US
A voltage of a first pin that is one of several pins of an external connector of a system is measured, while the first pin is un-driven except for being pulled to ground through a first resistance, and a second pin of the external connector is being used as a power supply rail of the system. The measured voltage is compared to a short circuit threshold and in response to that threshold being exceeded, the power supply voltage on the second pin is reduced. In such an embodiment, no test stimulus needs to be applied to any of the pins of the external connector. Other embodiments are also described and claimed.
Corrosion Mitigation For An External Connector Of An Electronic Device
- Cupertino CA, US Nagendra Bage Jayaraj - San Jose CA, US Derek J. DiCarlo - San Jose CA, US Chi Kin Ho - Milpitas CA, US Xingqun Li - San Jose CA, US Jahan C. Minoo - San Jose CA, US Surya Musunuri - San Jose CA, US Tony Chi Wang Ng - Santa Clara CA, US Carlos Ribas - Los Altos CA, US Ching Yu John Tam - Los Gatos CA, US Evan J. Thompson - Sunnyvale CA, US Daniel C. Wagman - Scotts Valley CA, US Di Zhao - Santa Clara CA, US Robert D. Zupke - San Jose CA, US
A voltage of a first pin that is one of several pins of an external connector of a system is measured, while the first pin is un-driven except for being pulled to ground through a first resistance, and a second pin of the external connector is being used as a power supply rail of the system. The measured voltage is compared to a short circuit threshold and in response to that threshold being exceeded, the power supply voltage on the second pin is reduced. In such an embodiment, no test stimulus needs to be applied to any of the pins of the external connector. Other embodiments are also described and claimed.
Apparatus And Method For Fast Phase Locking For Digital Phase Locked Loop
- Santa Clara CA, US Mohamed A. ABDELSALAM - Giza, EG Mamdouh O. ABD EL-MEJEED - Alexandria, EG Nasser A. KURD - Portland OR, US Mark ELZINGA - El Dorado CA, US Young Min PARK - Folsom CA, US Jagannadha R. RAPETA - Folsom CA, US Surya MUSUNURI - Folsom CA, US
International Classification:
H03L 7/10 G04F 10/00 H03L 7/099
Abstract:
Described is an integrated circuit (IC) with a phase locked loop with capability of fast locking. The IC comprises: a node to provide a reference clock; a digitally controlled oscillator (DCO) to generate an output clock; a divider coupled to the DCO, the divider to divide the output clock and to generate a feedback clock; and control logic operable to reset the DCO and the divider, and operable to release reset in synchronization with the reference clock. An apparatus for zeroing phase error is provided which comprises a first node to provide a reference clock; a second node to provide a feedback clock; a time-to-digital converter, coupled to the first and second nodes, to measure phase error between the reference and feedback clocks; a digital loop filter; and a control unit to adjust the measured phase error, and to provide the adjusted phase error to the digital loop filter.