Thomas Walter Hagler from Sandia Park, NM, age 61

Lawyers & Attorneys

Thomas Hagler - Lawyer

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Specialties:

Accidents
Personal Injury
Labor and Employment Discrimination
Probate
Criminal Defense

ISLN:

906783878

Admitted:

1975

University:

Gonzaga University, B.A., 1969

Law School:

Southwestern University, J.D., 1975

Thomas Hagler - Lawyer

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Specialties:

Environmental Law
Employment & Labor

ISLN:

906783861

Admitted:

1983

University:

University of California, M.L.S., 1979; University of Virginia, B.A., 1975

Law School:

Stanford University, J.D., 1983

Resumes

R And D Manager, Multidomain Sensing And Effects

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Location:

42 Stagecoach Trl, Sandia Park, NM 87047

Industry:

Defense & Space

Work:

Defense Contractor since Mar 2007
SA Program Manager / Chief Scientist
2020 Photometrics since Jan 2006
Professional Consultant
Aspectrics, Inc. 2000 - 2006
Founder / Chairman / Chief Technology Officer
Andros 1996 - 1999
Sr. Optical Physicist
LLNL 1994 - 1996
Physicist

Education:

University of California, Santa Barbara 1987 - 1992
Ph.D., Physics Oregon State University 1984 - 1987
BS, Physics

Skills:

Sensors
Systems Engineering
Simulations
Engineering Management
Optics
Dod
R&D
Program Management
Radar
Integration
Aerospace
Requirements Management
Physics
Proposal Writing
Security Clearance
Signal Processing
System Architecture
Defense
Embedded Systems
Analysis
Electronic Warfare
System Design
Optical Engineering
Interferometry
Ir
Spectroscopy
Photonics
C4Isr
Flight Test
Systems Design
Patent Drafting
Simulation
Algorithms
Laser
Space Systems
Earned Value Management
Configuration Management
Electro Optics
Government Contracting
Optical Design
Chemometrics
Imaging
Modeling
Survivability
Satellite
Sigint
Image Processing

Interests:

Bass Guitar
West
Fly Fishing
Lee
Photography
Mountain Biking
Pastorius

Thomas Hagler

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Location:

United States

License Records

Thomas K Hagler Sr

License #:

2701034757 - Expired

Category:

Contractor

Issued Date:

Jul 6, 1989

Expiration Date:

Jul 31, 1999

Type:

Class A

Us Patents

Method And Apparatus For Spectrum Analysis And Encoder
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US Patent:

6897952, May 24, 2005
Filed:

Jun 25, 1999
Appl. No.:

09/869371
Inventors:

Thomas W. Hagler - Grass Valley CA, US
Assignee:

Advanced Photometrics, Inc. - Grass Valley CA
International Classification:

G01J003/04
G01J003/433
US Classification:

356310, 356323, 356326
Abstract:

A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin(mθ+pπ/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by corresponding filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.

Method And Apparatus For Radiation Encoding And Analysis
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US Patent:

6995840, Feb 7, 2006
Filed:

Mar 6, 2003
Appl. No.:

10/384374
Inventors:

Thomas W. Hagler - Grass Valley CA, US
Assignee:

Aspectrics, Inc. - Pleasanton CA
International Classification:

G01J 3/06
US Classification:

356310
Abstract:

Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.

Method And Apparatus For Radiation Analysis And Encoder
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US Patent:

6999165, Feb 14, 2006
Filed:

May 3, 2001
Appl. No.:

09/848614
Inventors:

Thomas W. Hagler - Grass Valley CA, US
Assignee:

Aspectrics, Inc. - Pleasanton CA
International Classification:

G01J 3/04
G02B 26/02
US Classification:

356310, 359236
Abstract:

Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.

Method And Apparatus For Radiation Analysis And Encoder
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US Patent:

7330253, Feb 12, 2008
Filed:

Nov 30, 2005
Appl. No.:

11/291179
Inventors:

Thomas W. Hagler - Grass Valley CA, US
Assignee:

Aspectrics, Inc. - Pleasanton CA
International Classification:

G01J 3/04
G02B 26/02
US Classification:

356310, 356323, 356326, 359236, 359238
Abstract:

Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.

Spatial Radiation Modulator Pattern Generation
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US Patent:

7420673, Sep 2, 2008
Filed:

Oct 26, 2007
Appl. No.:

11/925102
Inventors:

Thomas W. Hagler - Grass Valley CA, US
Assignee:

Aspectrics, Inc. - Pleasanton CA
International Classification:

G01J 3/04
US Classification:

356310, 356330
Abstract:

A method of generating a design pattern for a spatial radiation modulator to encode two or more selected spectral components in one or more spectral ranges for the chemometric analysis of a group of analytes. The method includes obtaining a corresponding spectrum for each of the analytes, defining a set of initial spectral windows, constructing a chemometric matrix to relate concentrations of the analytes to intensities of the spectral components, deriving optimized spectral windows, and translating the center wavelength and the bandwidth of each of the optimized spectral windows into a corresponding optimized annular region on the modulator.

Encoder Spectrograph And Modulator For Use Therewith
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US Patent:

7423748, Sep 9, 2008
Filed:

Aug 3, 2007
Appl. No.:

11/833886
Inventors:

Thomas W. Hagler - Grass Valley CA, US
Assignee:

Aspectrics, Inc. - Pleasanton CA
International Classification:

G01J 3/06
G01J 3/18
G01J 3/28
US Classification:

356310, 356328, 356330
Abstract:

An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph includes a modulator with radiation filters having non-equal widths and centered at non-equal intervals along the encoding axis of the modulator.

Encoded Photometric Infrared Spectroscopy Analyzer With Orthogonal-Encoded Components
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US Patent:

7423749, Sep 9, 2008
Filed:

Aug 3, 2007
Appl. No.:

11/833897
Inventors:

Thomas W. Hagler - Grass Valley CA, US
Assignee:

Aspectrics, Inc. - Pleasanton CA
International Classification:

G01J 3/06
G01J 3/18
G01J 3/28
US Classification:

356310, 356328, 25033907
Abstract:

An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoded photometric infrared spectroscopy (“EPIR”) analyzer employs orthogonal encoded components having substantially identical modulation frequencies, which may allow for the multiplexing of up to twice as many encoded components.

Calibration Training For Spectrometer
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US Patent:

7426446, Sep 16, 2008
Filed:

Aug 3, 2007
Appl. No.:

11/833900
Inventors:

Thomas W. Hagler - Grass Valley CA, US
Assignee:

Aspectrics, Inc. - Pleasanton CA
International Classification:

G01J 3/00
G06F 17/40
US Classification:

702 85, 702 32, 702 30, 356303
Abstract:

An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. A spectra sorting algorithm is used to determine calibration training spectra for a spectrometer in a spectrometer calibration training mode.