Thomas D Mcclure

US Patent:

20200176240, Jun 4, 2020

Filed:

Feb 5, 2020

Appl. No.:

16/782746

Inventors:

- San Jose CA, US
Thomas D. McClure - Sunnyvale CA, US

International Classification:

H01J 49/42
H01J 49/00

Abstract:

A system comprises an electrostatic trapping mass analyzer and an information processor configured to receive a transient signal from the electrostatic trapping mass analyzer at a maximum resolution, the information processor comprising instructions operable to: partition the transient signal into segments and, while a quality metric is either less than a pre-determined minimum threshold or greater than a pre-determined maximum threshold value, to perform the steps of: (i) defining a test transient as being equal to either a first one of the segments or a previously defined transient with an appended signal segment; (ii) generating a spectrum of component frequencies by calculating a mathematical transform of the test transient; and (iii) determining the quality metric from the spectrum of component frequencies; and set an instrumental resolution to be employed for subsequent mass spectral data acquisitions in accordance with a length of the most-recently-defined test transient.

US Patent:

20200066504, Feb 27, 2020

Filed:

Aug 23, 2018

Appl. No.:

16/111024

Inventors:

- San Jose CA, US
Thomas D. McClure - Sunnyvale CA, US

International Classification:

H01J 49/42
H01J 49/00

Abstract:

A method of operating an electrostatic trapping mass analyzer, comprises: (a) operating the electrostatic trapping mass analyzer at a maximum resolution so as to acquire a transient signal; (b) partitioning the transient signal into signal segments; (c) while a quality metric is either less than a pre-determined minimum threshold or greater than a pre-determined maximum threshold value, performing the steps of: (i) defining a test transient as being equal to either a first one of the segments or a previously defined transient with an appended signal segment; (ii) calculating a mathematical transform of the test transient and thereby generating a spectrum of component frequencies; and (iii) determining the quality metric from the spectrum of component frequencies; and (d) setting an instrumental resolution to be employed for subsequent mass spectral data acquisitions in accordance with a length of the most-recently-defined test transient.