Thomas A Raymond

US Patent:

6393038, May 21, 2002

Filed:

Oct 4, 1999

Appl. No.:

09/412044

Inventors:

Thomas D. Raymond - Edgewood NM
William J. Alford - Albuquerque NM
Mary H. Crawford - Albuquerque NM
Andrew A. Allerman - Albuquerque NM

Assignee:

Sandia Corporation - Albuquerque NM

International Classification:

H01S 310

US Classification:

372 22, 372 50, 372 98, 372 75

Abstract:

A frequency-doubled semiconductor vertical-external-cavity surface-emitting laser (VECSEL) is disclosed for generating light at a wavelength in the range of 300-550 nanometers. The VECSEL includes a semiconductor multi-quantum-well active region that is electrically or optically pumped to generate lasing at a fundamental wavelength in the range of 600-1100 nanometers. An intracavity nonlinear frequency-doubling crystal then converts the fundamental lasing into a second-harmonic output beam. With optical pumping with 330 milliWatts from a semiconductor diode pump laser, about 5 milliWatts or more of blue light can be generated at 490 nm. The device has applications for high-density optical data storage and retrieval, laser printing, optical image projection, chemical-sensing, materials processing and optical metrology.

US Patent:

6624896, Sep 23, 2003

Filed:

Oct 18, 2000

Appl. No.:

09/690766

Inventors:

Daniel R. Neal - Tijeras NM
Daniel R. Hamrick - Cedar Crest NM
Thomas D. Raymond - Sandia Park NM

Assignee:

WaveFront Sciences, Inc. - Albuquerque NM

International Classification:

G01B 1130

US Classification:

356600, 356121

Abstract:

A metrology system and method uses pulsed light to allow continuous movement of a target relative to the sensor. A metrology system and method uses dynamic adjustment of tilt in a system. A metrology system and method calibrates the system to remove inherent optical aberrations in the system. Filtering may also be used in the system to increase accuracy.

US Patent:

6790688, Sep 14, 2004

Filed:

Sep 24, 2002

Appl. No.:

10/252416

Inventors:

Thomas Daniel Raymond - Edgewood NM
Daniel Richard Hamrick - Cedar Crest NM
Daniel Ralph Neal - Tijeras NM

Assignee:

Wavefront Sciences Inc. - Albuquerque NM

International Classification:

H01L 2166

US Classification:

438 16, 382261, 708322

Abstract:

An improved method of high pass filtering a data set includes flattening the data set and then filtering the flattened data set with an adaptive filter. The data set is flattened by fitting it to a predetermined function, and then obtaining the difference between the original data set and the fitted data set. Beneficially, the predetermined function is a polynomial. The adaptive filter includes a masking function that has a constant, non-zero value (e. g. , 1) within the bounds of the original data set and value of zero outside the bounds of the original data set.

US Patent:

7583389, Sep 1, 2009

Filed:

Apr 9, 2007

Appl. No.:

11/783314

Inventors:

Daniel R. Neal - Tijeras NM, US
Thomas Daniel Raymond - Edgewood NM, US
William Shea Powers - Albuquerque NM, US

Assignee:

Amo Wavefront Sciences, LLC - Albuquerque NM

International Classification:

G01B 11/02

US Classification:

356512, 356497

Abstract:

A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.

US Patent:

7616330, Nov 10, 2009

Filed:

Apr 9, 2007

Appl. No.:

11/783316

Inventors:

Daniel R. Neal - Tijeras NM, US
Thomas Daniel Raymond - Edgewood NM, US
William Shea Powers - Albuquerque NM, US

Assignee:

AMO Wavefront Sciences, LLP - Santa Ana CA

International Classification:

G01B 11/14
G01B 11/24

US Classification:

356625, 356601, 356612

Abstract:

A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.

US Patent:

7623251, Nov 24, 2009

Filed:

Apr 9, 2007

Appl. No.:

11/783315

Inventors:

Daniel R. Neal - Tijeras NM, US
Thomas Daniel Raymond - Edgewood NM, US
William Shea Powers - Albuquerque NM, US

Assignee:

AMO Wavefront Sciences, LLC. - Albuquerque NM

International Classification:

G01B 11/14

US Classification:

356625

Abstract:

A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.

US Patent:

7967440, Jun 28, 2011

Filed:

Jan 25, 2010

Appl. No.:

12/693106

Inventors:

James Copland - Albuquerque NM, US
Daniel R. Neal - Tijeras NM, US
Thomas D. Raymond - Edgewood NM, US
Stephen W. Farrer - Albuquerque NM, US
Paul Pulaski - Albuquerque NM, US

Assignee:

AMO Wavefront Sciences LLC. - Santa Ana CA

International Classification:

A61B 3/10

US Classification:

351212, 351205, 351215, 351221

Abstract:

A system includes a light pattern generator having light spots for illuminating front and back surfaces of a cornea with polarized light; one or more detectors for receiving one or more of first spot images from light reflected off the front surface, and second spot images from light reflected off the back surface, the light reflected off the front surface having a first polarization and the light reflected off the back surface having a second polarization; a polarization element in an optical path between the back surface and the one or more detectors, the polarization element being configured to attenuate an intensity of the light reflected off the front surface by an amount greater than an amount by which it attenuates the light reflected off the back surface; and a processor for determining a geometric characteristic of the cornea using at least the second plurality of spot images.

US Patent:

7969585, Jun 28, 2011

Filed:

Nov 6, 2009

Appl. No.:

12/613848

Inventors:

Daniel R Neal - Tijeras NM, US
Thomas D Raymond - Edgewood NM, US
William S Powers - Albuquerque NM, US

Assignee:

AMO Wavefront Sciences LLC. - Santa Ana CA

International Classification:

G01B 11/14

US Classification:

356625, 356630

Abstract:

A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.