Vernon P Cooke

US Patent:

8305104, Nov 6, 2012

Filed:

Mar 25, 2010

Appl. No.:

12/732002

Inventors:

Douglas Garcia - Beaverton OR, US
Vernon Cooke - Tigard OR, US
Spencer Barrett - Beaverton OR, US

Assignee:

Electro Scientific Industries, Inc. - Portland OR

International Classification:

G01R 31/20

US Classification:

32475701, 32475704, 32475903

Abstract:

An improved method and apparatus for testing and sorting electro-optic devices by both electrical and optical properties at high speed is disclosed. Electro-optic devices, in particular light emitting diodes, are singulated by a singulation device and transferred to a linear track where they are tested for electrical and optical properties. The devices are then sorted into a large number of different bins depending upon the tested properties.

US Patent:

8598888, Dec 3, 2013

Filed:

May 4, 2010

Appl. No.:

12/773549

Inventors:

Vernon Cooke - Tigard OR, US

Assignee:

Electro Scientific Industries, Inc. - Portland OR

International Classification:

G01R 31/02

US Classification:

324537, 32475016

Abstract:

An improved method of testing and sorting electronic devices uses two or more test stations and two or more sorting stations applied to a single track to improve system throughput. Applying two or more test stations and two or more sorting stations to a single track accomplishes improved system throughput while increasing system cost less than would be expected if a duplicate track was installed for each test station.

US Patent:

56776349, Oct 14, 1997

Filed:

Nov 16, 1995

Appl. No.:

8/559547

Inventors:

Peter A. Cooke - Escondido CA
David M. Ivancic - San Diego CA
Naom Chaplik - San Diego CA
Michael C. Steinmeyer - Oceanside CA
Vernon P. Cooke - Escondido CA

Assignee:

Electro Scientific Industries, Inc. - Portland OR

International Classification:

G01R 3112

US Classification:

324548

Abstract:

A plurality of electrical circuit components having capacitance, e. g. ceramic capacitors, are tested simultaneously in a corresponding plurality of test channels. They are stressed by a variable voltage source that can produce an electrical potential selected from a wide range from low potential to high potential. For example the range of selectable potentials can be 1000 volts with a resolution of 1 volt. The charge current by which a component accumulates a charge is controlled to a selected linear rate by a current controller. Voltage sensors and current sensors measure accumulated charges and leakage current, respectively. The current sensor can be selectively sensitized to a plurality of anticipated leakage current ranges. In addition, the selected potentials can each be applied to the components in a single step or can be applied over time in ramp fashion. A processor can be used for running at least a prescribed test process on components, the processor being operatively coupled to, for controlling and receiving inputs from, the above elements.

US Patent:

58425799, Dec 1, 1998

Filed:

Nov 16, 1995

Appl. No.:

8/559546

Inventors:

Douglas J. Garcia - Valley Center CA
Steven D. Swendrowski - San Diego CA
Mitsuaki Tani - Escondido CA
Hsang Wang - San Diego CA
Martin J. Twite - San Diego CA
Malcolm V. Hawkes - Escondido CA
Evart David Shealey - Jamul CA
Martin S. Voshell - Lakeside CA
Jeffrey L. Fish - San Diego CA
Vernon P. Cooke - Escondido CA

Assignee:

Electro Scientific Industries, Inc. - Portland OR

International Classification:

B07C 5344

US Classification:

209573

Abstract:

One or more concentric rings of component seats are rotatable about the rings' center. The seats are uniformly angularly spaced and the rings are incrementally rotated, the increment of rotation being the angular space between adjacent seats. The rings are inclined at an angle and a stream of components is poured onto the rings as they are rotating. Stationary fences adjacent to outboard sides of the seats, confine unseated components to tumble randomly, due to gravity, over empty seats passing through arcs of the rings' rotation paths. The random tumbling results in seated components. In the paths of the rotating rings are electrical contactors for coupling the components to a tester. Preferably there are five contactor stations to permit five different kinds of tests to be performed simultaneously. Tested components pass beneath an ejection manifold which defines a plurality of ejection holes which register with a set of seats each time the ring is rotated an increment.