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Vibheesh Bharathan

age ~40

from Pleasanton, CA

Vibheesh Bharathan Phones & Addresses

  • Pleasanton, CA
  • San Jose, CA

Work

  • Company:
    Cypress semiconductor corporation
    Mar 2007 to Jun 2012
  • Position:
    Applications engineering, capacitive sensing group

Education

  • School / High School:
    M.s. Ramaiah School of Advance Studies
    2008 to 2010

Skills

Embedded Systems • Soc • Firmware • Microcontrollers • Mixed Signal • Debugging • Analog • Verilog • Semiconductors • Fpga • Cmos • Usb • Electronics • Circuit Design • Hardware Architecture • Ic • Asic • Analog Circuit Design • Field Programmable Gate Arrays • Vlsi • Eda • I2C • Microprocessors • Integrated Circuit Design • Static Timing Analysis • Power Management • Capsense • Capacitive Sensing • Failure Analysis • System Design • Application Notes • Design Guidelines • Solution Development • System Architecture • Capacitive Sensing Methods • Evalution Kit Designs

Industries

Semiconductors

Resumes

Vibheesh Bharathan Photo 1

Principal Systems Engineer

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Location:
2700 162Nd St southwest, Lynnwood, WA 98087
Industry:
Semiconductors
Work:
Cypress Semiconductor Corporation Mar 2007 - Jun 2012
Applications Engineering, Capacitive Sensing Group

Cypress Semiconductor Corporation Mar 2007 - Jun 2012
Principal Systems Engineer

Delopt Aug 2005 - Mar 2007
Design Engineer, Research and Development Group
Education:
M.s. Ramaiah School of Advance Studies 2008 - 2010
Nttf Electronics Center, Bangalore 2002 - 2005
Skills:
Embedded Systems
Soc
Firmware
Microcontrollers
Mixed Signal
Debugging
Analog
Verilog
Semiconductors
Fpga
Cmos
Usb
Electronics
Circuit Design
Hardware Architecture
Ic
Asic
Analog Circuit Design
Field Programmable Gate Arrays
Vlsi
Eda
I2C
Microprocessors
Integrated Circuit Design
Static Timing Analysis
Power Management
Capsense
Capacitive Sensing
Failure Analysis
System Design
Application Notes
Design Guidelines
Solution Development
System Architecture
Capacitive Sensing Methods
Evalution Kit Designs

Us Patents

  • Multi-Frequency Scan For Multi-Sensor Electrode

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  • US Patent:
    8547118, Oct 1, 2013
  • Filed:
    Dec 21, 2012
  • Appl. No.:
    13/724516
  • Inventors:
    Santhosh Kumar Vojjala - Bangalore, IN
    Vibheesh Bharathan - San Jose CA, US
    Sai Prashanth Chinnapalli - San Jose CA, US
    Jijeesh Choorakottayil Gopinathan - Ernakulam, IN
    Edward Grivna - Brooklyn Park MN, US
    David G. Wright - San Diego CA, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    G01R 27/26
  • US Classification:
    324681, 324667, 324686
  • Abstract:
    An apparatus includes multiple capacitive sensing elements coupled through a filter network. The apparatus can include a control device configured to excite the capacitive sensing elements with different scanning frequencies and determine capacitances corresponding to each of the capacitive sensing elements based on sensor responses to the excitation of the capacitive sensing elements with the different scanning frequencies and a configuration of the filter network.
  • Capacitive Differential Rotary Encoder

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  • US Patent:
    20220244078, Aug 4, 2022
  • Filed:
    Oct 7, 2021
  • Appl. No.:
    17/496639
  • Inventors:
    - San Jose CA, US
    Vibheesh Bharathan - San Jose CA, US
    Igor Kravets - Lviv, UA
    Mykhaylo Krekhovetskyy - Lviv, UA
    David Durlin - Castle Rock WA, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    G01D 5/241
    G06F 3/0362
  • Abstract:
    A rotary encoder for capturing angular position of a target rotating over capacitive sensors. The rotary encoder includes a source plate. The rotary encoder includes a pair of capacitive sensors coupled to the source plate, and a target plate separated from the source plate by a gap. The target plate includes a spoke and a flange. The spoke is capacitively coupled to the pair of capacitive sensors and the flange is capacitively coupled to a ground pad. Each capacitive sensor of the pair of capacitive sensors is configured to detect a change in a capacitive value corresponding to an angular position of the spoke to the capacitive sensor. The target plate is mechanically coupled to a joystick. A movement of the joystick causes a rotation of the target plate about an axis to change the angular position of the spoke to the pair of capacitive sensors.
  • System Level Simulation And Evaluation Of Capacitive And Inductive Sensing-Based Solutions

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  • US Patent:
    20210081590, Mar 18, 2021
  • Filed:
    Jun 16, 2020
  • Appl. No.:
    16/903217
  • Inventors:
    - San Jose CA, US
    Vibheesh Bharathan - San Jose CA, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    G06F 30/3308
    G06F 30/367
    G06F 30/39
  • Abstract:
    Information associated with a plurality of components of a capacitance sensing system is received. Performance of the capacitance sensing system is simulated based on the information associated with the plurality of components of the capacitance sensing system. A set of configuration parameters for a capacitance sensing controller is generated without user intervention based on the simulated performance of the capacitance sensing system.
  • Detect And Differentiate Touches From Different Size Conductive Objects On A Capacitive Button

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  • US Patent:
    20180164359, Jun 14, 2018
  • Filed:
    Jan 18, 2018
  • Appl. No.:
    15/874705
  • Inventors:
    - San Jose CA, US
    Vibheesh Bharathan - San Jose CA, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    G01R 27/26
  • Abstract:
    Apparatuses and methods of distinguishing between a finger and stylus proximate to a touch surface are described. One apparatus includes a first circuit to obtain capacitance measurements of sense elements when a conductive object is proximate to a touch surface. The apparatus also includes a second circuit coupled to the first circuit. The second circuit is operable to detect whether the conductive object activates the first sense element, second sense element, or both, in view of the capacitance measurements. To distinguish between a stylus and a finger as the conductive object, the second circuit determines the conductive object as being the stylus when the second sense element is activated and the first sense element is not activated and determines the conductive object as being the finger when the first sense element and the second sense element are activated.
  • Detect And Differentiate Touches From Different Size Conductive Objects On A Capacitive Button

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  • US Patent:
    20180003752, Jan 4, 2018
  • Filed:
    Jul 26, 2017
  • Appl. No.:
    15/660754
  • Inventors:
    - San Jose CA, US
    Vibheesh Bharathan - San Jose CA, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    G01R 27/26
  • Abstract:
    Apparatuses and methods of distinguishing between a finger and stylus proximate to a touch surface are described. One apparatus includes a first circuit to obtain capacitance measurements of sense elements when a conductive object is proximate to a touch surface. The apparatus also includes a second circuit coupled to the first circuit. The second circuit is operable to detect whether the conductive object activates the first sense element, second sense element, or both, in view of the capacitance measurements. To distinguish between a stylus and a finger as the conductive object, the second circuit determines the conductive object as being the stylus when the second sense element is activated and the first sense element is not activated and determines the conductive object as being the finger when the first sense element and the second sense element are activated.
  • Quasi-Differential Mutual Capacitance Measurement

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  • US Patent:
    20170205453, Jul 20, 2017
  • Filed:
    Jan 12, 2017
  • Appl. No.:
    15/405047
  • Inventors:
    - San Jose CA, US
    Vibheesh Bharathan - San Jose CA, US
  • Assignee:
    Cypress Semiconductor Corporation - San Jose CA
  • International Classification:
    G01R 27/26
    G06F 3/044
  • Abstract:
    A circuit, system, and method for converting mutual capacitance to a digital value is described. Charge packets are transferred from a mutual capacitance to a pair of integration capacitors during alternate charge and discharge cycles. The time required to bring the discharged integration capacitor to the same potential as the charged integration capacitor with a current source is measured as a single-slope analog-to-digital converter (ADC). The output of the ADC is representative of the mutual capacitance.

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Vibheesh Bharathan Photo 2

Vibheesh Bharathan

Lived:
San Jose, CA
Work:
Cypress Semiconductor - Applications Engineer Staff (2007)
Delopt pvt ltd - Engineer (2005-2007)
Education:
Perambra Higher Secondary School - High school, Vakayadu Higher Secondary School - +2, NTTF NEC - Dip In Eletronics, MS Ramaiah School of Advanced Studies - MS Engineering
Relationship:
Single

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