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Walter G Vahey

age ~59

from Winchester, MA

Also known as:
  • Walter L Vahey
  • Walter A Vahey
  • Walter G Wahe
  • Walterg Vahey
  • Lisa Vahey
  • Auey V Walter
  • Walter Vattey
Phone and address:
2 Ware Rd, Winchester, MA 01890
(781)7212133

Walter Vahey Phones & Addresses

  • 2 Ware Rd, Winchester, MA 01890 • (781)7212133
  • 839 Sconticut Neck Rd, Fairhaven, MA 02719 • (508)9798330
  • Arlington Heights, IL
  • Schaumburg, IL
  • Schererville, IN

Resumes

Walter Vahey Photo 1

President, System Test Group

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Location:
Winchester, MA
Industry:
Computer Hardware
Work:
Teradyne Jul 2004 - Jun 2012
Vice President and General Manager

Teradyne Jul 2004 - Jun 2012
President, System Test Group

Empirix 1999 - 2004
Vice President Marketing

Teradyne 1986 - 1999
Various Engineering, Sales, Marketing Roles
Education:
Carnegie Mellon University 1982 - 1986
Bachelors, Bachelor of Science, Computer Engineering
Skills:
Computer Hardware
Walter Vahey Photo 2

Owner

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Work:
Venomous
Owner
Name / Title
Company / Classification
Phones & Addresses
Walter Vahey
TERADYNE, INC
600 Riverpark Dr, North Reading, MA 01864
600 Riverpark Dr Ms700-2-2, North Reading, MA 01864
Walter Vahey
Teradyne
Semiconductors · Electrical Equipment Repair Services · Measuring and Controlling Devices, Nec, Nsk · Mfg Automatic Test Equipment · Manufactures Instruments for Measuring and Testing of Electricity · Mfg Instruments for Measuring & Testing of Electricity · Mfg Automatic Test Equipment & Connecting Devices · Electrician
600 Riverpark Dr, North Reading, MA 01864
2390 E Camelback Rd, Phoenix, AZ 85016
600 Riverpark Dr Ms 700-2-2, North Reading, MA 01864
700 Riverpark Dr, North Reading, MA 01864
(978)3702700, (617)3687709, (978)3701541, (978)6642197

Us Patents

  • Method Of Providing Software Testing Services

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  • US Patent:
    6859922, Feb 22, 2005
  • Filed:
    Aug 24, 2000
  • Appl. No.:
    09/645279
  • Inventors:
    Caren H. Baker - Waltham MA, US
    George Friedman - Framingham MA, US
    Michael V. Glik - Newton MA, US
    Walter G. Vahey - Winchester MA, US
  • Assignee:
    Empirix Inc. - Bedford MA
  • International Classification:
    G06F009/44
  • US Classification:
    717125, 717120, 717121, 717124, 705 51
  • Abstract:
    A system that provides easy testing of software objects and reduces the burden on a program developer for maintaining a test system is presented. The system accepts as an input objects and automatically creates test drivers for these objects. The test objects are provided to a test bed comprising an application server where the objects are tested by application of the test drivers. In a preferred embodiment, the test bed comprises a collection of application servers. An application service provider provides the system test driver and the test bed. Access to the test system is provided by passing a representing of the object under test to the application service provided through a network interface. The application service provider provides test services on a fee for service basis.
  • Method And System For Software Object Testing

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  • US Patent:
    6934934, Aug 23, 2005
  • Filed:
    Jan 12, 2000
  • Appl. No.:
    09/482178
  • Inventors:
    Michael V. Glik - Newton MA, US
    Walter G. Vahey - Winchester MA, US
    Caren H. Baker - Waltham MA, US
    George Friedman - Framingham MA, US
  • Assignee:
    Empirix Inc. - Bedford MA
  • International Classification:
    G06F009/44
  • US Classification:
    717126, 717125, 709224, 718100, 719315
  • Abstract:
    A system for testing middleware of applications in the N-tiered model. The test system contains test code generators, test engines to execute multiple copies of the test code and a data analyzer to analyze and present the results to a human user. The system is able to automatically generate test code to exercise components of the middleware using information about these components that would otherwise be available to the application under test. Multiple copies of the test code are executed in a synchronized fashion. Execution times of multiple events are recorded and then presented in one of several formats. With the system, an application developer can identify components that represent performance bottlenecks or can gather information on deployment properties of individual components that can be used to enhance the performance of the application under test.
  • Test Code Generator, Engine And Analyzer For Testing Middleware Applications

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  • US Patent:
    7000224, Feb 14, 2006
  • Filed:
    Apr 13, 2000
  • Appl. No.:
    09/548203
  • Inventors:
    Michael V. Glik - Newton MA, US
    Caren H. Baker - Waltham MA, US
    George Friedman - Framingham MA, US
    Walter G. Vahey - Winchester MA, US
  • Assignee:
    Empirix Inc. - Bedford MA
  • International Classification:
    G06F 9/44
  • US Classification:
    717125, 717127, 714738
  • Abstract:
    A system for testing middleware of applications in the N-tiered model. The test system contains test code generators, test engines to execute multiple copies of the test code and a data analyzer to analyze and present the results to a human user. The system is able to automatically generate test code to exercise components of the middleware using information about these components that would otherwise be available to the application under test. Multiple copies of the test code are executed in a synchronized fashion. Execution times of multiple events are recorded and then presented in one of several formats. With the system, an application developer can identify components that represent performance bottlenecks or can gather information on deployment properties of individual components that can be used to enhance the performance of the application under test.
  • Disk Drive Testing

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  • US Patent:
    7996174, Aug 9, 2011
  • Filed:
    Dec 18, 2007
  • Appl. No.:
    11/958788
  • Inventors:
    Edward Garcia - Holbrook MA, US
    Brian S. Merrow - Harvard MA, US
    Evgeny Polyakov - Brookline MA, US
    Walter Vahey - Winchester MA, US
    Eric L. Truebenbach - Sudbury MA, US
  • Assignee:
    Teradyne, Inc. - North Reading MA
  • International Classification:
    G01M 7/00
  • US Classification:
    702115
  • Abstract:
    A disk drive testing system includes at least one robotic arm defining a first axis substantially normal to a floor surface. The robotic arm is operable to rotate through a predetermined arc about and extend radially from the first axis. Multiple racks are arranged around the robotic arm for servicing by the robotic arm. Each rack houses multiple test slots that are each configured to receive a disk drive transporter configured to carry a disk drive for testing.
  • Disk Drive Testing

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  • US Patent:
    20090153993, Jun 18, 2009
  • Filed:
    Dec 18, 2007
  • Appl. No.:
    11/958817
  • Inventors:
    Edward Garcia - Holbrook MA, US
    Brian S. Merrow - Harvard MA, US
    Evgeny Polyakov - Brookline MA, US
    Walter Vahey - Winchester MA, US
    Eric L. Truebenbach - Sudbury MA, US
  • Assignee:
    TERADYNE, INC. - North Reading MA
  • International Classification:
    G11B 27/36
  • US Classification:
    360 31
  • Abstract:
    A disk drive testing system includes at least one robotic arm defining a first axis substantially normal to a floor surface. The robotic arm is operable to rotate through a predetermined arc about and extend radially from the first axis. Multiple racks are arranged around the robotic arm for servicing by the robotic arm. Each rack houses multiple test slots that are each configured to receive a disk drive transporter configured to carry a disk drive for testing. A transfer station is arranged for servicing by the robotic arm. The transfer station includes multiple tote receptacles that are each configured to receive a disk drive tote.
  • Storage Device Testing

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  • US Patent:
    20120102374, Apr 26, 2012
  • Filed:
    Apr 17, 2009
  • Appl. No.:
    13/264665
  • Inventors:
    Edward Garcia - Holbrook MA, US
    Brian S. Merrow - Harvard MA, US
    Evgeny Polyakov - Brookline MA, US
    Walter Vahey - Winchester MA, US
    Eric L. Truebenbach - Sudbury MA, US
  • Assignee:
    TERADYNE, INC. - North Reading MA
  • International Classification:
    G11C 29/08
    G06F 11/26
    B25J 13/08
    B65H 1/00
    G06F 7/00
  • US Classification:
    714718, 41422207, 700218, 700254, 901 47, 901 9, 714E11159
  • Abstract:
    A storage device testing system () includes at least one robotic arm () defining a first axis () substantially normal to a floor surface (). The robotic arm is operable to rotate through a predetermined arc about and extend radially from the first axis. Multiple racks () are arranged around the robotic arm for servicing by the robotic arm. Each rack houses multiple test slots () that are each configured to receive a storage device transporter () configured to carry a storage device () for testing.
  • Method And System For Software Object Testing

    view source
  • US Patent:
    6775824, Aug 10, 2004
  • Filed:
    Jan 12, 2000
  • Appl. No.:
    09/481151
  • Inventors:
    Michael V. Glik - Newton MA
    Walter G. Vahey - Winchester MA
    Caren H. Baker - Waltham MA
    George Friedman - Framingham MA
  • Assignee:
    Empirix Inc. - Waltham MA
  • International Classification:
    G06F 944
  • US Classification:
    717125, 714 46, 714703, 714738
  • Abstract:
    A system for testing middleware of applications in the N-tiered model. The test system contains test code generators, test engines to execute multiple copies of the test code and a data analyzer to analyze and present the results to a human user. The system is able to automatically generate test code to exercise components of the middleware using information about these components that would otherwise be available to the application under test. Multiple copies of the test code are executed in a synchronized fashion. Execution times of multiple events are recorded and then presented in one of several formats. With the system, an application developer can identify components that represent performance bottlenecks or can gather information on deployment properties of individual components that can be used to enhance the performance of the application under test.

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Walter Vahey Photo 3

Walter Vahey's Public

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Walter Vahey

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Friends:
Brenda Lafont, Mike Cottingham, Shirley Vahey, Teresa Vahey, Jack Vahey

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