White E Gibson

US Patent:

56005768, Feb 4, 1997

Filed:

Mar 11, 1994

Appl. No.:

8/209056

Inventors:

Stuart P. Broadwater - White Hall MD
White E. Gibson - Baltimore MD
Paul W. Skeberdis - Baltimore MD
Edward A. Cockey - Jarrettsville MD

Assignee:

Northrop Grumman Corporation - Los Angeles CA

International Classification:

G01L 310

US Classification:

36457103

Abstract:

A time stress measurement device is provided for use in diverse electronic and electromechanical system. The TSMD collects environmental data applied to a system, collects event data experienced by the system, time-stamps the environmental and event data, compares the environmental data to various preset thresholds, and stores the time-stamped environmental data and time-stamped event data. The data is stored in various data structures, including recent environmental data, historical environmental data, peak environmental data, and event signature data. The environmental data and event data can be retrieved by maintenance personnel to isolate and analyze system faults and failures. The device can further be capable of sending a test signal to the system in order to determine whether the system is operating properly.