Wigbert J Siekhaus

US Patent:

7118630, Oct 10, 2006

Filed:

Aug 10, 2000

Appl. No.:

09/636134

Inventors:

Mehdi Balooch - Berkeley CA, US
Long N. Dinh - Concord CA, US
Wigbert J. Siekhaus - Berkeley CA, US

Assignee:

The Regents of the University of California - Oakland CA

International Classification:

C23C 16/00

US Classification:

118726, 427596, 427597

Abstract:

Short-wavelength photons are used to ablate material from a low work function target onto a suitable substrate. The short-wavelength photons are at or below visible wavelength. The elemental composition of the deposit is controlled by the composition of the target and the gaseous environment in which the ablation process is performed. The process is carried out in a deposition chamber to which a short-wavelength laser is mounted and which includes a substrate holder which can be rotated, tilted, heated, or cooled. The target material is mounted onto a holder that spins the target during laser ablation. In addition, the deposition chamber is provided with a vacuum pump, an external gas supply with atomizer and radical generator, a gas generator for producing a flow of molecules on the substrate, and a substrate cleaning device, such as an ion gun. The substrate can be rotated and tilted, for example, whereby only the tip of an emitter can be coated with a low work function material.

US Patent:

56208545, Apr 15, 1997

Filed:

Mar 13, 1995

Appl. No.:

8/402800

Inventors:

John F. Holzrichter - Berkeley CA
Wigbert J. Siekhaus - Berkeley CA

Assignee:

Regents of the University Of California - Oakland CA

International Classification:

C12Q 168
G01N 3353
G01N 2100
C12P 1934

US Classification:

435 6

Abstract:

A scanning probe microscope, such as an atomic force microscope (AFM) or a scanning tunneling microscope (STM), is operated in a stationary mode on a site where an activity of interest occurs to measure and identify characteristic time-varying micromotions caused by biological, chemical, mechanical, electrical, optical, or physical processes. The tip and cantilever assembly of an AFM is used as a micromechanical detector of characteristic micromotions transmitted either directly by a site of interest or indirectly through the surrounding medium. Alternatively, the exponential dependence of the tunneling current on the size of the gap in the STM is used to detect micromechanical movement. The stationary mode of operation can be used to observe dynamic biological processes in real time and in a natural environment, such as polymerase processing of DNA for determining the sequence of a DNA molecule.

US Patent:

46671013, May 19, 1987

Filed:

Feb 4, 1985

Appl. No.:

6/697828

Inventors:

Wigbert Siekhaus - Berkeley CA

Assignee:

The United States of America as respresented by the United States
Department of Energy - Washington DC

International Classification:

G01N 23227

US Classification:

250307

Abstract:

An apparatus useful in the prediction of the damage threshold of various optical devices, the location of weak spots on such devices and the location, identification, and elimination of optical surface impurities comprising, a focused and pulsed laser, an photo electric detector/imaging means, and a timer. The weak spots emit photoelectrons when subjected to laser intensities that are less than the intensity actually required to produce the damage. The weak spots may be eliminated by sustained exposure to the laser beam.

US Patent:

57471207, May 5, 1998

Filed:

Feb 11, 1997

Appl. No.:

8/799085

Inventors:

William McLean - Oakland CA
Mehdi Balooch - Berkeley CA
Wigbert J. Siekhaus - Berkeley CA

Assignee:

Regents Of The University Of California - Oakland CA

International Classification:

B05D 306

US Classification:

427596

Abstract:

Wear-resistant coatings composed of laser ablated hard carbon films, are deposited by pulsed laser ablation using visible light, on instruments such as microscope tips and micro-surgical tools. Hard carbon, known as diamond-like carbon (DLC), films produced by pulsed laser ablation using visible light enhances the abrasion resistance, wear characteristics, and lifetimes of small tools or instruments, such as small, sharp silicon tips used in atomic probe microscopy without significantly affecting the sharpness or size of these devices. For example, a 10-20 nm layer of diamond-like carbon on a standard silicon atomic force microscope (AFM) tip, enables the useful operating life of the tip to be increased by at least twofold. Moreover, the low inherent friction coefficient of the DLC coating leads to higher resolution for AFM tips operating in the contact mode.

US Patent:

61208574, Sep 19, 2000

Filed:

May 18, 1998

Appl. No.:

9/080109

Inventors:

Mehdi Balooch - Berkeley CA
Long N. Dinh - Concord CA
Wigbert J. Siekhaus - Berkeley CA

Assignee:

The Regents of the University of California - Oakland CA

International Classification:

C23C 1428
B05D 512

US Classification:

427596

Abstract:

Short-wavelength photons are used to ablate material from a low work function target onto a suitable substrate. The short-wavelength photons are at or below visible wavelength. The elemental composition of the deposit is controlled by the composition of the target and the gaseous environment in which the ablation process is performed. The process is carried out in a deposition chamber to which a short-wavelength laser is mounted and which includes a substrate holder which can be rotated, tilted, heated, or cooled. The target material is mounted onto a holder that spins the target during laser ablation. In addition, the deposition chamber is provided with a vacuum pump, an external gas supply with atomizer and radical generator, a gas generator for producing a flow of molecules on the substrate, and a substrate cleaning device, such as an ion gun. The substrate can be rotated and tilted, for example, whereby only the tip of an emitter can be coated with a low work function material.

US Patent:

54619076, Oct 31, 1995

Filed:

Mar 23, 1993

Appl. No.:

8/035741

Inventors:

Robert J. Tench - Tracy CA
Wigbert J. Siekhaus - Berkeley CA
Mehdi Balooch - Berkeley CA
Rodney L. Balhorn - Livermore CA
Michael J. Allen - Davis CA

Assignee:

Regents of the University of California - Oakland CA

International Classification:

H01J 314

US Classification:

73105

Abstract:

Instrumentation and techniques to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution, to cut-off identified parts of such objects, to move around and manipulate such cut-off parts on the substrate on which they are being imaged to predetermined locations on the substrate, and to remove the cut-off parts from the substrate. This is accomplished using an atomic force microscope (AFM) and by modification of the conventional cantilever stylus assembly of an AFM, such that plural cantilevers are used with either sharp-tips or knife-edges thereon. In addition, the invention can be utilized for measuring hardness of materials.