William W Simon

US Patent:

44424965, Apr 10, 1984

Filed:

Dec 3, 1982

Appl. No.:

6/446501

Inventors:

William E. Simon - Cleveland OH
Richard D. Richards - Bay Village OH

Assignee:

Victoreen, Inc. - Cleveland OH

International Classification:

G01D 1800

US Classification:

364524

Abstract:

A radiation analysis instrument is described for measuring the characteristics of radiation emanating from a source (XS). The instrument includes two absorbers (a, b) and corresponding detectors (10, 12) with the detectors being disposed in the path of the radiation and the absorbers being interposed between the corresponding detector and the source. A circuit (16) digitizes the analog signals derived by the two detectors and provides the digital values to a microcomputer (18) which stores these digitals values within a memory (50). A microprocessor (48) processes the digital signals stored within the memory (50) to analyze characteristics of the radiation emitted from and the potential applied across the source (XS). This instrument is particularly useful in measuring the kVp applied to X-ray tubes.

Address:

8160 Thackeray Ct, Broadview Heights, OH 44147

Phone:

(440)5467693

VIN:

WBANF73537CU22841

Make:

BMW

Model:

5 SERIES

Year:

2007