Xiao Liu

US Patent:

20160161605, Jun 9, 2016

Filed:

Dec 8, 2014

Appl. No.:

14/563669

Inventors:

- Morristown NJ, US
Xiao Liu - Austin TX, US

International Classification:

G01S 13/66
G01S 13/00

Abstract:

Radar vehicle tracking is described. One or more embodiments include a device to receive a first determined distance between a first radar transceiver and a vehicle, the first distance determined by the first radar transceiver operating in a first mode, receive a second determined distance between a second radar transceiver and the vehicle, the second distance determined by the second radar transceiver operating in the first mode, receive a first determined distance ellipse between the first radar transceiver and the vehicle, the first distance ellipse determined by the first radar transceiver operating in a second mode, receive a second determined distance ellipse between the second radar transceiver and the vehicle, the second distance ellipse determined by the second radar transceiver operating in the second mode, and determine at least one location estimate of the vehicle based on the first and second determined distances and first and second determined distance ellipses.

US Patent:

20140095951, Apr 3, 2014

Filed:

Sep 28, 2012

Appl. No.:

13/631862

Inventors:

Nisar Ahmed - Bee Cave TX, US
Corey Jason Goodrich - McKinney TX, US
Xiao Liu - Allen TX, US
Chris Therrien - Trophy Club TX, US

Assignee:

Texas Instruments, Incorporated - Dallas TX

International Classification:

G01R 31/3177

US Classification:

714729, 714E11155

Abstract:

A path-based crosstalk fault model is used in conjunction with a built-in self-test (BIST) and software capability for automatic test pattern generation. The solution allows for test patterns to be generated that maximize switching activity as well as inductive and capacitive crosstalk. The path based fault model targets the accumulative effect of crosstalk along a particular net (“victim” path), as compared with the discrete nets used in conventional fault models. The BIST solution allows for full controllability of the target paths and any associated aggressors. The BIST combined with automatic test pattern generation software enables defect detection and silicon validation of delay defects on long parallel nets.