Xiao I Mi

US Patent:

20210304054, Sep 30, 2021

Filed:

Mar 31, 2021

Appl. No.:

17/218690

Inventors:

- Mountain View CA, US
Vadim Smelyanskiy - Mountain View CA, US
Yu Chen - Goleta CA, US
Xiao Mi - Goleta CA, US
Yuezhen Niu - El Segundo CA, US
Kostyantyn Yevgenovych Kechedzhi - Santa Monica CA, US
Alexander Nikolaevich Korotkov - Riverside CA, US
Zhang Jiang - El Segundo CA, US

International Classification:

G06N 10/00
G06F 15/16

Abstract:

Systems and methods for composite quantum gate calibration for a quantum computing system are provided. In some implementations, a method includes accessing a unitary gate model describing a composite quantum gate. The unitary gate model includes a plurality of gate parameters. The method includes implementing the composite quantum gate for a plurality of gate cycles on the quantum system to amplify the plurality of gate parameters. The method includes obtaining a measurement of a state of the quantum system after implementing the composite quantum gate for the plurality of gate cycles. The method includes determining at least one of the plurality of gate parameters based at least in part on the measurement of the state of the quantum system. The method includes calibrating the composite quantum gate for the quantum computing system based at least in part on the plurality of gate parameters.