Yen Chih Lin

US Patent:

20110161553, Jun 30, 2011

Filed:

Dec 30, 2009

Appl. No.:

12/649992

Inventors:

Nirmal Saxena - Los Altos Hill CA, US
Howard Tsai - Cupertino CA, US
Dmitry Vyshetsky - Cupertino CA, US
Yen Lin - Saratoga CA, US

Assignee:

NVIDIA CORPORATION - Santa Clara CA

International Classification:

G06F 12/06
G06F 12/00

US Classification:

711103, 711206, 711118, 711E12078, 711E12001

Abstract:

The wear-leveling techniques include discovering a persistent state of one or more memory devices, or building and caching persistent state parameters for each logical unit of a given memory device if a persistent state is not discovered for a given memory device. The techniques may also include processing memory access commands utilizing the cached persistent state parameters. When processing memory access commands, the logical block address and length parameter of a logical address of a command may be translated to a plurality of physical addresses for accessing one or more memory devices, each physical address includes a device address, a logical unit address, a block address, and a page address, wherein the block address includes one or more interleaved address bits.

US Patent:

20130231867, Sep 5, 2013

Filed:

Jan 10, 2013

Appl. No.:

13/738634

Inventors:

Yen Ting LIN - Los Angeles CA, US
Antonio ORTEGA - Los Angeles CA, US
Tayeb Ayatollahy TAFTI - Los Angeles CA, US
Ira ERSHAGHI - Los Angeles CA, US

Assignee:

University of Southern California - Los Angeles CA

International Classification:

E21B 49/00

US Classification:

702 12, 7315239

Abstract:

A method and system of locating discontinuities in a reservoir are provided. The method includes identifying a plurality of injection and production sites in the reservoir, injecting fluid into selected injection sites in accordance with an injection schedule, monitoring an output at the production sites, determining a time delay between the injection sites and the production sites based on the monitored output, and determining a location of discontinuities based on the determined time delay.

US Patent:

20130245952, Sep 19, 2013

Filed:

Feb 27, 2013

Appl. No.:

13/779681

Inventors:

Yen Ting LIN - Los Angeles CA, US
Antonio Ortega - Los Angeles CA, US
Tayeb Ayatollahy Tafti - Los Angeles CA, US
Ira Ershaghi - Los Angeles CA, US

Assignee:

University of Southern California - Los Angeles CA

International Classification:

E21B 49/00

US Classification:

702 12

Abstract:

A method and system of characterizing a flow property of a production well site in a reservoir are provided. The method includes identifying a plurality of injection and production well sites in the reservoir; injecting fluid into selected injection well sites in accordance with an injection schedule; monitoring an output at the production well sites; determining a time delay between the selected injection sites and the production sites based on the monitored output using an estimated capacitance model; and characterizing a flow property of a production well site using the time delay and the estimated capacitance model.