Yu Wen Wang

US Patent:

6992826, Jan 31, 2006

Filed:

Sep 25, 2001

Appl. No.:

09/965033

Inventors:

Yu Wang - La Crescenta CA, US

Assignee:

California Institute of Technology - Pasadena CA

International Classification:

G02B 1/10

US Classification:

359585, 359578, 359589, 359584, 349105, 349106, 345 88, 348744

Abstract:

Devices based on surface plasmon filters having at least one metal-dielectric interface to support surface plasmon waves. A multi-layer-coupled surface plasmon notch filter is provided to have more than two symmetric metal-dielectric interfaces coupled with one another to produce a transmission spectral window with desired spectral profile and bandwidth. Such notch filters can form various color filtering devices for color flat panel displays.

US Patent:

6998600, Feb 14, 2006

Filed:

Jun 30, 2003

Appl. No.:

10/612442

Inventors:

Yu Wang - La Crescenta CA, US

Assignee:

The United States of America as represented by the Administrator of the National Aeronautics and Space Administration - Washington DC

International Classification:

G02B 6/06

US Classification:

25022728, 25022729, 2502272, 250216

Abstract:

A miniature, ultra-high resolution, and color scanning microscope using microchannel and solid-state technology that does not require focus adjustment. One embodiment includes a source of collimated radiant energy for illuminating a sample, a plurality of narrow angle filters comprising a microchannel structure to permit the passage of only unscattered radiant energy through the microchannels with some portion of the radiant energy entering the microchannels from the sample, a solid-state sensor array attached to the microchannel structure, the microchannels being aligned with an element of the solid-state sensor array, that portion of the radiant energy entering the microchannels parallel to the microchannel walls travels to the sensor element generating an electrical signal from which an image is reconstructed by an external device, and a moving element for movement of the microchannel structure relative to the sample. Discloses a method for scanning samples whereby the sensor array elements trace parallel paths that are arbitrarily close to the parallel paths traced by other elements of the sensor array.

US Patent:

7632733, Dec 15, 2009

Filed:

Apr 29, 2006

Appl. No.:

11/413248

Inventors:

Yu Wang - Fremont CA, US
Tiesheng Li - San Jose CA, US
Hong Chang - Cupertino CA, US

Assignee:

Alpha & Omega Semiconductor, Inc. - Sunnyvale CA

International Classification:

H01L 21/336

US Classification:

438270, 257E2153

Abstract:

This invention discloses a semiconductor wafer for manufacturing electronic circuit thereon. The semiconductor substrate further includes an etch-back indicator that includes trenches of different sizes having polysilicon filled in the trenches and then completely removed from some of the trenches of greater planar trench dimensions and the polysilicon still remaining in a bottom portion in some of the trenches having smaller planar trench dimensions.

US Patent:

7912307, Mar 22, 2011

Filed:

Jun 22, 2007

Appl. No.:

11/821063

Inventors:

Yu Wang - La Crescenta CA, US

International Classification:

G06K 9/40
G06K 9/36
G06K 9/32

US Classification:

382254, 382280, 382299

Abstract:

The present disclosure includes an image processing technique that is capable to increase spatial resolution of single frame images beyond diffraction limit. If an image is taken by diffraction limited optical system with regularly spaced pixel detectors, and if the spacing of pixels of the detectors is much small than the diffraction pattern, then the spatial resolution of the image can be increased beyond the diffraction limit by using neighboring-pixel-optical-transfer-function (NPOTF) in Fourier Domain with periodical boundary conditions.

US Patent:

7928507, Apr 19, 2011

Filed:

Dec 9, 2009

Appl. No.:

12/653130

Inventors:

Yu Wang - Fremont CA, US
Tiesheng Li - San Jose CA, US
Hong Chang - Cupertino CA, US

Assignee:

Alpha & Omega Semiconductor, Inc. - Sunnyvale CA

International Classification:

H01L 29/66
H01L 29/06

US Classification:

257330, 257622, 257E2153, 257E21585

Abstract:

This invention discloses a semiconductor wafer for manufacturing electronic circuit thereon. The semiconductor substrate further includes an etch-back indicator that includes trenches of different sizes having polysilicon filled in the trenches and then completely removed from some of the trenches of greater planar trench dimensions and the polysilicon still remaining in a bottom portion in some of the trenches having smaller planar trench dimensions.

US Patent:

8193061, Jun 5, 2012

Filed:

Apr 18, 2011

Appl. No.:

13/066583

Inventors:

Yu Wang - Fremont CA, US
Tiesheng Li - San Jose CA, US
Hong Chang - Cupertino CA, US

Assignee:

Alpha & Omega Semiconductor Incorporated - Sunnyvale CA

International Classification:

H01L 21/336

US Classification:

438270, 257E2153

Abstract:

This invention discloses a semiconductor wafer for manufacturing electronic circuit thereon. The semiconductor substrate further includes an etch-back indicator that includes trenches of different sizes having polysilicon filled in the trenches and then completely removed from some of the trenches of greater planar trench dimensions and the polysilicon still remaining in a bottom portion in some of the trenches having smaller planar trench dimensions.

US Patent:

8374134, Feb 12, 2013

Filed:

Aug 26, 2009

Appl. No.:

12/547834

Inventors:

Yu Albert Wang - Cerritos CA, US
Vijayalakshmi R. Raveendran - San Diego CA, US

Assignee:

QUALCOMM Incorporated - San Diego CA

International Classification:

H04Q 7/00

US Classification:

370329, 370466

Abstract:

In general, this disclosure relates to techniques for transmitting data for applications using one or more available channels of a spectrum. One example method comprises transforming data into a digital broadcast format, identifying at least one available channel of a spectrum, and transmitting the transformed data in the at least one identified available channel.

US Patent:

8413195, Apr 2, 2013

Filed:

May 27, 2010

Appl. No.:

12/788752

Inventors:

Alan L. Adolphson - San Diego CA, US
Vijayalakshmi R. Raveendran - San Diego CA, US
Yu Albert Wang - Cerritos CA, US

Assignee:

QUALCOMM Incorporated - San Diego CA

International Classification:

H04N 7/20
H04N 7/16

US Classification:

725 73, 725 62, 725133, 725141, 725153

Abstract:

In general, this disclosure relates to techniques for transmitting data in a spectrum, and seamlessly switching from one transmission channel to an available channel in the spectrum. One example method comprises identifying, by a device, at least a first channel of a spectrum, transmitting at least one command to a second, different device, wherein the at least one command contains information that allows the second device to determine at least the first identified channel, and transmitting data in at least the first identified channel.