Dr. Li graduated from the Sun Yat Sen Univ of Med Sci, Guangzhou, China (242 21 Pr 1/71) in 1987. She works in Flushing, NY and specializes in Internal Medicine. Dr. Li is affiliated with Flushing Hospital Medical Center and Queens Hospital Center.
Yuan John Li - Novi MI Mawutor Kofi Kpeglo - Canton MI Yung-Sen Steven Shang - Canton MI
Assignee:
Visteon Global Technologies, Inc. - Dearborn MI
International Classification:
G06F 1700
US Classification:
706 45, 706 46
Abstract:
A method of knowledge-based engineering cost and weight estimation of an HVAC air-handling assembly for a climate control system on a vehicle includes the steps of selecting a parametric model of an HVAC air-handling assembly design using a knowledge-based engineering library stored in a memory of a computer system. The method also includes the steps of selecting a component part from the parametric model of the HVAC air-handling assembly, determining a cost estimate of the component part using the knowledge-based engineering library and using a summation of the component part cost as the cost estimate of the HVAC air-handling assembly. The method further includes the steps of determining a weight estimate of the component part using the knowledge-based engineering library and using a summation of the component part weight as the weight estimate of the HVAC air-handling assembly. The method further includes the steps of using the cost and weight estimate in the HVAC air-handling assembly design.
Method Of Optimizing Design Of An Hvac Air-Handling Assembly For A Climate Control System
Timothy J. Hall - Novi MI Steven Kelley Howell - Dexter MI Yuan (John) Li - Novi MI
Assignee:
Visteon Global Technologies, Inc. - Dearborn MI
International Classification:
G06G 748
US Classification:
703 8, 703 1, 345419
Abstract:
A method of optimized design of an HVAC air-handling assembly for a climate control system on a vehicle includes the steps of generating a basic design of the HVAC air-handling assembly and analyzing a performance of the basic design of the HVAC air-handling assembly using an engineering analytical technique. The method also includes the steps of varying the basic design of the HVAC air-handling assembly based on the performance analysis and using the optimized basic design of the HVAC air-handling assembly in generating the HVAC air-handling assembly design.
A semiconductor package includes a chip carrier to receive a semiconductor with a dimension generally greater than 22 mm. The chip carrier has a first coefficient of thermal expansion that is larger than the coefficient of thermal expansion of the semiconductor. A heat spreader having parallel channels on opposite sides is attached to the chip carrier along the channels. The heat spreader has a second coefficient of thermal expansion that is smaller than or equal to the coefficient of thermal expansion of the chip carrier. The interplay between the heat spreader and the chip carrier can effectively reduce package warpage and maintain coplanarity within the specification.
Structure And Material For Assembling A Low-K Si Die To Achieve A Low Warpage And Industrial Grade Reliability Flip Chip Package With Organic Substrate
Wen-Chou Vincent Wang - Cupertino CA, US Donald S. Fritz - San Jose CA, US Yuan Li - Sunnyvale CA, US
Assignee:
Altera Corporation - San Jose CA
International Classification:
H01L023/10
US Classification:
257706, 257701, 257783, 257775
Abstract:
Provided are a semiconductor low-K Si die flip chip package with warpage control and fabrication methods for such packages. The packages include heat spreaders that are attached to the low-K Si die and packaging substrate. In general, the modulus of the thermal interface material, which is used to attach the heat spreader to the low-K Si die, is selected as high as possible relative to other commercially available thermal interface materials. On the other hand, the modulus of the adhesive, which is used to attach the heat spreader via an optional stiffener to the substrate, is selected as low as possible relative to other commercially available adhesives. The result is a package with less bowing and so improved co-planarity (in compliance with industry specifications) with the surface to which it is ultimately bound. Moreover, the low-K Si die and package reliabilities are thereby enhanced.
Don Fritz - San Jose CA, US Wen-chou Vincent Wang - Cupertino CA, US Yuan Li - Sunnyvale CA, US
Assignee:
Altera Corporation - San Jose CA
International Classification:
H01L021/44 H01L021/48 H01L021/50
US Classification:
438106, 438107, 438108, 438125
Abstract:
Provided are a semiconductor flip chip package with warpage control and fabrication methods for such packages. The packages of the present invention include heat spreader lids that are rigidly attached to the die or packaging substrate with a bond that can withstand the considerable bowing pressures caused by the CTE mismatch between the die and substrate. The result is a package with less bowing and so improved co-planarity (in compliance with industry specifications) with the PCB board to which it is ultimately bound. Package reliability is thereby also enhanced, particularly for large die sizes.
Low Stress And Warpage Laminate Flip Chip Bga Package
Provided are a semiconductor die flip chip package with warpage control and fabrication methods for such packages. The packages include heat spreaders that are attached to the die and packaging substrate. In general, the modulus of the adhesive, which is used to attach the heat spreader to the substrate, is selected to provide a relatively “soft” connection. The result is a package with less bowing and so improved co-planarity (e. g. , in compliance with industry specifications) with the surface to which it is ultimately bound. Moreover, the die and package reliabilities are thereby enhanced.
Structure And Material For Assembling A Low-K Si Die To Achieve A Low Warpage And Industrial Grade Reliability Flip Chip Package With Organic Substrate
Wen-Chou Vincent Wang - Cupertino CA, US Donald S. Fritz - San Jose CA, US Yuan Li - Sunnyvale CA, US
Assignee:
Altera Corporation - San Jose CA
International Classification:
H01I 21/44
US Classification:
438106, 257E23001
Abstract:
Provided are a semiconductor low-K Si die flip chip package with warpage control and fabrication methods for such packages. The packages include heat spreaders that are attached to the low-K Si die and packaging substrate. In general, the modulus of the thermal interface material, which is used to attach the heat spreader to the low-K Si die, is selected as high as possible relative to other commercially available thermal interface materials. On the other hand, the modulus of the adhesive, which is used to attach the heat spreader via an optional stiffener to the substrate, is selected as low as possible relative to other commercially available adhesives. The result is a package with less bowing and so improved co-planarity (in compliance with industry specifications) with the surface to which it is ultimately bound. Moreover, the low-K Si die and package reliabilities are thereby enhanced.
A semiconductor package includes a chip carrier to receive a semiconductor with a dimension generally greater than 22 mm. The chip carrier has a first coefficient of thermal expansion that is larger than the coefficient of thermal expansion of the semiconductor. A heat spreader having parallel channels on opposite sides is attached to the chip carrier along the channels. The heat spreader has a second coefficient of thermal expansion that is smaller than or equal to the coefficient of thermal expansion of the chip carrier. The interplay between the heat spreader and the chip carrier can effectively reduce package warpage and maintain coplanarity within the specification.