Stony Brook Cancer Center 3 Edmund D Pellegrino Rd, Stony Brook, NY 11794 (631)4442989 (phone), (631)4442743 (fax)
Bronx VA Medical Center Pathology 130 W Kingsbridge Rd RM 2B29, Bronx, NY 10468 (718)5849000 (phone), (718)7414615 (fax)
Education:
Medical School Tianjin Med Univ, Tianjin City, Tianjin, China Graduated: 1982
Languages:
English
Description:
Dr. Zhang graduated from the Tianjin Med Univ, Tianjin City, Tianjin, China in 1982. She works in Bronx, NY and 1 other location and specializes in Hematology/Oncology and Internal Medicine. Dr. Zhang is affiliated with Columbia Memorial Hospital, Mount Sinai Queens and Stony Brook University Hospital.
Yury Gaknoki - San Jose CA, US Yue Zhang - Mountain View CA, US Mingming Mao - Saratoga CA, US
Assignee:
Power Integrations, Inc. - San Jose CA
International Classification:
H02M 3/335
US Classification:
361 18, 363 2112, 363 2117
Abstract:
This relates to detecting unwanted couplings between a protected terminal and other terminals in an integrated controller of a power supply. Offset and clamp circuitry may apply a positive or negative offset voltage and clamp current to one or more terminals of the controller. In the event that a terminal having the offset voltage and clamp current is accidentally coupled to the protected terminal, the offset voltage and clamp current may be applied to the protected terminal. The protected terminal may be coupled to a fault detection circuitry operable to detect a fault signal at the protected terminal. The fault detection circuitry of the controller may cause the power supply to shut down in response to a detection of the fault signal at the protected terminal or may cause the power supply to shut down in response to a detection of a predefined threshold number of cycles in which the fault signal is detected.
Moises Goldszmidt - Palo Alto CA, US Mihai Budiu - Sunnyvale CA, US Yue Zhang - Sunnyvale CA, US Michael Pechuk - Sammamish WA, US
Assignee:
Microsoft Corporation - Redmond WA
International Classification:
G06F 11/00
US Classification:
714 25
Abstract:
In a distributed system a plurality of devices (including computing units, storage and communication units) are monitored by an automated repair service that uses sensors and performs one or more repair actions on computing devices that are found to fail according to repair policies. The repair actions include automated repair actions and non-automated repair actions. The health of the computing devices is recorded in the form of states along with the repair actions that were performed on the computing devices and the times at which the repair actions were performed, and events generated by both sensors and the devices themselves. After some period of the time, the history of states of each device, the events, and the repair actions performed on the computing devices are analyzed to determine the effectiveness of the repair actions. A statistical analysis is performed based on the cost of each repair action and the determined effectiveness of each repair action, and one or more of the policies may be adjusted, as well as determining from the signals and events from the sensors whether the sensors themselves require adjustment.
Yue Zhang - Mountain View CA, US Mingming Mao - Saratoga CA, US
Assignee:
Power Integrations, Inc. - San Jose CA
International Classification:
H02H 9/02
US Classification:
361 18
Abstract:
This relates to detecting unwanted couplings between a protected terminal and other terminals in an integrated controller of a power supply. Offset and clamp circuitry may apply a positive or negative offset voltage and clamp current to one or more terminals of the controller. In the event that a terminal having the offset voltage and clamp current is accidentally coupled to the protected terminal, the offset voltage and clamp current may be applied to the protected terminal. The protected terminal may be coupled to a fault detection circuitry operable to detect a fault signal at the protected terminal. The fault detection circuitry of the controller may cause the power supply to shut down in response to a detection of the fault signal at the protected terminal or may cause the power supply to shut down in response to a detection of a predefined threshold number of cycles in which the fault signal is detected.
Yue Zhang - San Jose CA, US Wen Hsu - Saratoga CA, US
Assignee:
Qpixel Technology International, Inc. - Cupertino CA
International Classification:
H04N 5/225
US Classification:
3482071, 348E05024
Abstract:
The present invention discloses a novel combination for low cost, stand alone video cameras with surveillance features. In the embodiments, the camera body can be manufactured utilizing inexpensive materials such as press molded plastic, the view finder can be a simple through-hole without a lens, simple indicator lights and buttons can be utilized for programming and status functions, and a removable memory card can be used as primary storage. The video camera can operate on one or more batteries or external power. The video camera can be embedded with surveillance functions offering a variety of programming modes for operating as a security camera. By providing only essential features and features that can be manufactured at low cost, the overall cost of the resulting camera can be kept very low.
Cmos Thermal-Diffusivity Temperature Sensor Based On Polysilicon
- Redwood Shores CA, US Frankie Y. Liu - Palo Alto CA, US Yue Zhang - San Mateo CA, US Suwen Yang - Mountain View CA, US
Assignee:
Oracle International Corporation - Redwood Shores CA
International Classification:
G01K 7/01 H01L 23/34 H01L 35/12 H01L 35/32
Abstract:
The disclosed embodiments relate to the design of a temperature sensor, which is integrated into a semiconductor chip. This temperature sensor comprises an electro-thermal filter (ETF) integrated onto the semiconductor chip, wherein the ETF comprises: a heater; a thermopile, and a heat-transmission medium that couples the heater to the thermopile, wherein the heat-transmission medium comprises a polysilicon layer sandwiched between silicon dioxide layers. It also comprises a measurement circuit that measures a transfer function through the ETF to determine a temperature reading for the temperature sensor.
Computer Science Department, Stanford University Engineering School
Jan 2015 to 2000 Project Experience in Computer ScienceDepartment of Statistics, Stanford Univeristy Stanford, CA Aug 2014 to Aug 2014 Data Mining and Relevance of Searching DocumentsAccenture
Sep 2013 to Dec 2013 InternChina Development Bank
Aug 2013 to Sep 2013 Overseas Intern
Education:
Stanford University Stanford, CA 2015 to 2016 Master of Science in Department of StatisticsPeking University 2007 to 2011 BA in Chinese Language and Literature
Harbin Institute of Technology Harbin, China May 2013 to Jun 2014 Research Assistant
Education:
Stanford University Stanford, CA 2014 to 2016 M.S. in Electrical EngineeringHarbin Institute of Technology Harbin, China 2010 to 2014 B.S. in Instruments Science and Technology
TAS Tigard, OR Jun 2013 to Dec 2013 Java DeveloperPortland State University Portland, OR Jan 2013 to Jun 2013 Teaching AssistantTektronix, Inc Beaverton, OR Jul 2012 to Sep 2012 Java Developer (Summer Intern)Portland State University Portland, OR Jan 2011 to Mar 2012 Teaching AssistantSouthwest Institute of Technical Physics Chengdu, CN Jul 2006 to Sep 2008 Software Engineer
Education:
Portland State University Sep 2008 to Dec 2010 M.S. in Computer ScienceSichuan University Chengdu, CN Sep 1999 to Aug 2003 B.S. in Computer Science and Technology
University of Pittsburgh - Information Science, Nanjing University of Science and Technology - Computer Science, High School Affiliated of Nanjing Normal University
Relationship:
Married
Yue Zhang
Work:
North Commons - Student assistant
Education:
Ohio State University - Finance, Southwest Jiaotong University - The material science and engineering
Yue Zhang
Education:
University College London - MRes Speech Language and Cognition, Anhui University - Teaching Chinese as Foreign Language
Tagline:
I will never be tired of the world until I am bored by it.