Yun Suk Chang

US Patent:

6950548, Sep 27, 2005

Filed:

Mar 16, 2001

Appl. No.:

09/809027

Inventors:

Ivan A. Bachelder - Newton MA, US
Yun Chang - Lexington MA, US
Yasunari Tosa - Lexington MA, US
Venkat Gopalakrishnan - Framingham MA, US
Raymond Fix - Natick MA, US
Rob Milligan - Maynard MA, US
Therese Hunt - Framingham MA, US
Karen Roberts - Natick MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G06K009/00

US Classification:

382145, 382146, 382147, 382151, 348126, 25055934, 25055937

Abstract:

A method and system create a geometric object model for use in machine vision inspection. A pixel image representation of an object is acquired. Based on this pixel image representation, part models for the parts of the object are generated. Each part model corresponds to a different part of the object. From the part models of the object, a model for the entire object can be created. Using this created object model, a test inspection is performed on a set of test images, and each of the test images is associated with a set of known inspection measurements. The test inspection produces a set of testing inspection measurements. If the test inspection yields satisfactory performance, the object models created are stored.