Oleg Sulima - Ballston Lake NY, US Loucas Tsakalakos - Niskayuna NY, US Alok Mani Srivastava - Niskayuna NY, US Adam Fraser Halverson - Albany NY, US
Assignee:
GENERAL ELECTRIC COMPANY - Schenectady NY
International Classification:
H01L 31/0232
US Classification:
136257, 136259
Abstract:
An article, such as a solar cell or module, is presented. In one embodiment, the article includes a photovoltaically active region and a photovoltaically inactive region. A filler material is disposed in the inactive region; the filler material includes a reflective material configured to scatter at least 50% of light incident on the filler material. Another embodiment is an article that includes a photovoltaically active region and a photovoltaically inactive region. A filler material is disposed in the inactive region; the filler material includes a wavelength converting material. Other embodiments are described herein in which the filler material described above and disposed in the inactive region includes both the reflective material and the wavelength converting material.
- Tempe AZ, US Holly Ann Blaydes - Perrysburg OH, US Jongwoo Choi - Boise ID, US Adam Fraser Halverson - Albany NY, US Eugene Thomas Hinners - Gansevoort NY, US William Hullinger Huber - Ottawa Hills OH, US Yong Liang - Niskayuna NY, US Joseph John Shiang - Niskayuna NY, US
Embodiments of a photovoltaic device are provided herein. The photovoltaic device can include a layer stack and an absorber layer disposed on the layer stack. The absorber layer can include a first region and a second region. Each of the first region of the absorber layer and the second region of the absorber layer can include a compound comprising cadmium, selenium, and tellurium. An atomic concentration of selenium can vary across the absorber layer. The first region of the absorber layer can have a thickness between 100 nanometers to 3000 nanometers. The second region of the absorber layer can have a thickness between 100 nanometers to 3000 nanometers. A ratio of an average atomic concentration of selenium in the first region of the absorber layer to an average atomic concentration of selenium in the second region of the absorber layer can be greater than 10.
- Tempe AZ, US Holly Ann Blaydes - Perrysburg OH, US Jongwoo Choi - Boise ID, US Adam Fraser Halverson - Albany NY, US Eugene Thomas Hinners - Gansevoort NY, US William Hullinger Huber - Ottawa Hills OH, US Yong Liang - Niskayuna NY, US Joseph John Shiang - Niskayuna NY, US
Embodiments of a photovoltaic device are provided herein. The photovoltaic device can include a layer stack and an absorber layer disposed on the layer stack. The absorber layer can include a first region and a second region. Each of the first region of the absorber layer and the second region of the absorber layer can include a compound comprising cadmium, selenium, and tellurium. An atomic concentration of selenium can vary across the absorber layer. The first region of the absorber layer can have a thickness between 100 nanometers to 3000 nanometers. The second region of the absorber layer can have a thickness between 100 nanometers to 3000 nanometers. A ratio of an average atomic concentration of selenium in the first region of the absorber layer to an average atomic concentration of selenium in the second region of the absorber layer can be greater than 10.
- Tempe AZ, US Holly Ann Blaydes - Perrysburg OH, US Jongwoo Choi - Boise ID, US Adam Fraser Halverson - Albany NY, US Eugene Thomas Hinners - Gansevoort NY, US William Hullinger Huber - Ottawa Hills OH, US Yong Liang - Niskayuna NY, US Joseph John Shiang - Niskayuna NY, US
Embodiments of a photovoltaic device are provided herein. The photovoltaic device can include a layer stack and an absorber layer disposed on the layer stack. The absorber layer can include a first region and a second region. Each of the first region of the absorber layer and the second region of the absorber layer can include a compound comprising cadmium, selenium, and tellurium. An atomic concentration of selenium can vary across the absorber layer. The first region of the absorber layer can have a thickness between 100 nanometers to 3000 nanometers. The second region of the absorber layer can have a thickness between 100 nanometers to 3000 nanometers. A ratio of an average atomic concentration of selenium in the first region of the absorber layer to an average atomic concentration of selenium in the second region of the absorber layer can be greater than 10.
- Schenectady NY, US Adam HALVERSON - Albany NY, US
International Classification:
G02F 1/35 G02F 1/39
Abstract:
A photonic circuit integrated on a silicon-on-insulator waveguide, the silicon-on-insulator waveguide including a guiding layer, a cladding layer, and a substrate layer. The guiding layer having a first surface and a second surface, the second surface abutting one surface of the cladding layer, the cladding layer having another surface in abutment with a surface of the substrate layer, a photon pump in optical communication with the guiding layer, a nonlinear optical material in contact with the guiding layer first surface, a photon beam of the photon pump traversing the silicon-on-insulator waveguide, and the silicon-on-insulator waveguide having an output beam that includes a signal beam and an idler beam.
- Tempe AZ, US Kristian William Andreini - Burnt Hills NY, US William Hullinger Huber - Ottawa Hills OH, US Eugene Thomas Hinners - Gansevoort NY, US Joseph John Shiang - Niskayuna NY, US Yong Liang - Niskayuna NY, US Jongwoo Choi - Niskayuna NY, US Adam Fraser Halverson - Albany NY, US
Embodiments of a photovoltaic device are provided herein. The photovoltaic device can include a layer stack and an absorber layer disposed on the layer stack. The absorber layer can include a first region and a second region. Each of the first region of the absorber layer and the second region of the absorber layer can include a compound comprising cadmium, selenium, and tellurium. An atomic concentration of selenium can vary across the absorber layer. The first region of the absorber layer can have a thickness between 100 nanometers to 3000 nanometers. The second region of the absorber layer can have a thickness between 100 nanometers to 3000 nanometers. A ratio of an average atomic concentration of selenium in the first region of the absorber layer to an average atomic concentration of selenium in the second region of the absorber layer can be greater than 10.
Methods Of Fabricating A Photovoltaic Module, And Related System
- Kulim, MY Jinbo Cao - Rexford NY, US Adam Fraser Halverson - Niskayuna NY, US Mark Jeffrey Pavol - Arvada CO, US Douglas Garth Jensen - Lakewood CO, US
Assignee:
First Solar Malaysia Sdn. Bhd. - Kulim
International Classification:
H01L 31/18
Abstract:
A method of processing a semiconductor assembly is presented. The method includes fabricating a photovoltaic module including a semiconductor assembly. The fabrication step includes performing an efficiency enhancement treatment on the semiconductor assembly, wherein the efficiency enhancement treatment includes light soaking the semiconductor assembly, and heating the semiconductor assembly. The semiconductor assembly includes a window layer having an average thickness less than about 80 nanometers, wherein the window layer includes cadmium and sulfur. A related system is also presented.
- Tempe AZ, US Joseph John Shiang - Niskayuna NY, US William Hullinger Huber - Niskayuna NY, US Adam Fraser Halverson - Albany NY, US
Assignee:
First Solar Inc. - Tempe AZ
International Classification:
H01L 31/0272
US Classification:
136256, 136260
Abstract:
A photovoltaic device is presented. The photovoltaic device includes a layer stack; and an absorber layer is disposed on the layer stack. The absorber layer includes cadmium, tellurium, and selenium. A semiconductor layer is further disposed on the absorber layer, wherein a valence band offset between the semiconductor layer and the absorber layer is less than about 1.3 electron Volts, and a band gap of the semiconductor layer is in a range from about 1.2 electron Volts to about 3.5 electron Volts.
GE Global Research since May 2010
Physicist
National Renewable Energy Laboratory Oct 2007 - May 2010
Photovoltaic Research Physicist
Electro Scientific Industries, Inc. 2000 - 2001
Laser and Optics Physicist
Education:
University of Oregon 2001 - 2007
Ph.D., Physics
Reed College 1996 - 2000
BA, Physics
Skills:
Scientists Chemists Research Global Research Materials Structures Thin Films Support Nano
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