Aldo Giovanni Cometti - San Diego CA R. Frank OBleness - Del Mar CA
Assignee:
STMicroelectronics, Inc. - Carrollton TX
International Classification:
H03L 706
US Classification:
327156, 327159, 327292
Abstract:
A circuit that compensates for delays induced by clock generation logic and distributed clock drivers in phase lock loop applications is disclosed. The circuit is a phase lock loop (PLL) which contains a clock synchronization circuit that operates to synchronize a transition edge of a signal generated by a frequency divider against a distributed clock signal generated by a clock output driver of the circuit. The synchronization occurs unless the clock synchronization circuit is disabled.
Apparatus And Method For Determining A Read Level Of A Flash Memory After An Inactive Period Of Time
Aldo G. Cometti - San Diego CA, US Lun Bin Huang - San Diego CA, US Ashot Melik-Martirosian - San Diego CA, US
Assignee:
STEC, Inc. - Santa Ana CA
International Classification:
G11C 7/00
US Classification:
365201, 36518518, 365226
Abstract:
Disclosed is an apparatus and method for determining a dwell time in a non-volatile memory circuit after a shutdown of the memory circuit. A voltage shift is calculated by comparing a first read level voltage required to read a test block stored before the shutdown and a second read level voltage required to read a second test block stored after the shutdown. A shutdown time is determined from a look up table indexed by the voltage shift and a number of program/erase cycles. The dwell time is calculated as a function of the drive temperature, a clock, and a block time stamp. Once the dwell time is calculated, a controller calculates a new read level voltage based, in part, on the dwell time and provides one or more programming commands representative of the new read level voltage to the memory circuit to read the memory circuit.
Apparatus And Method For Determining A Read Level Of A Memory Cell Based On Cycle Information
Disclosed is an apparatus and method for determining a read level voltage to apply to a block of memory cells in a non-volatile memory circuit. A prediction value is compared to a prediction indicator to determine whether a new read level voltage to be applied to read the memory cells should be estimated. If a new read level should be estimated the new read level is calculated as a function of an initial read level and a dwell time and a number of program/erase cycles. A controller provides one or more programming commands representative of the new read level voltage to the memory circuit to read the cells.
Data Compensation/Resynchronization Circuit For Phase Lock Loops
Aldo Giovanni Cometti - Phoenix AZ R. Frank O'Bleness - Glendale AZ
Assignee:
SGS-Thomson Microelectronics, Inc. - Carrollton TX
International Classification:
H03L 706
US Classification:
327156
Abstract:
A circuit that compensates for delays induced by clock generation logic and distributed clock drivers in phase lock loop applications is disclosed. The circuit is a phase lock loop (PLL) which contains a clock synchronization circuit that operates to synchronize a transition edge of a signal generated by a frequency divider against a distributed clock signal generated by a clock output driver of the circuit. The synchronization occurs unless the clock synchronization circuit is disabled.
- San Jose CA, US Aldo Giovanni COMETTI - San Diego CA, US Richard Leo GALBRAITH - Rochester MN, US Jonas Andrew GOODE - Lake Forest CA, US Niranjay RAVINDRAN - Rochester MN, US Anthony Dwayne WEATHERS - San Diego CA, US
Systems and methods for read level tracking and optimization are described. Pages from a wordline of a flash memory device read and the raw page data read from the wordline may be buffered in a first set of buffers. The raw page data for each of the pages may be provided to a decoder for decoding and the decoded page data for each of the pages buffered in a second set of buffers. First bin identifiers may be identified for memory cells of the wordline based on the raw page data and second bin identifiers may be identified for the memory cells of the wordline based on the decoded page data. Cell-level statistics may be accumulated based on the first bin identifiers and the second bin identifiers, and a gradient may be determined for respective read levels based on decoding results for each of the pages and the cell-level statistics. Settings for the read levels may be configured in the flash memory device based on the determined gradients.
- San Jose CA, US Aldo Giovanni COMETTI - San Diego CA, US Richard Leo GALBRAITH - Rochester MN, US Jonas Andrew GOODE - Lake Forest CA, US Niranjay RAVINDRAN - Rochester MN, US Anthony Dwayne WEATHERS - San Diego CA, US
Systems and methods for read level tracking and optimization are described. Pages from a wordline of a flash memory device read and the raw page data read from the wordline may be buffered in a first set of buffers. The raw page data for each of the pages may be provided to a decoder for decoding and the decoded page data for each of the pages buffered in a second set of buffers. First bin identifiers may be identified for memory cells of the wordline based on the raw page data and second bin identifiers may be identified for the memory cells of the wordline based on the decoded page data. Cell-level statistics may be accumulated based on the first bin identifiers and the second bin identifiers, and a gradient may be determined for respective read levels based on decoding results for each of the pages and the cell-level statistics. Settings for the read levels may be configured in the flash memory device based on the determined gradients.
Solid State Drive Using Two-Level Indirection Architecture
- San Jose CA, US Chandan Mishra - Irvine CA, US Amir Hossein Gholamipour - Anaheim CA, US Aldo Giovanni Cometti - San Diego CA, US Namhoon Yoo - Anaheim CA, US
International Classification:
G06F 3/06 G06F 12/1009
Abstract:
Aspects of the present disclosure provide systems and methods for operating a solid state drive (SSD) using two-level indirection architecture. The SSD receives a command to perform a data operation in a NAND array and a logical address for the data operation. The SSD then converts the logical address to a physical address using a two-stage logical-to-physical (L2P) mapping table that includes a first stage stored in a byte-rewritable memory and a second stage stored in a block-erasable non-volatile memory (NVM). The SSD performs the data operation in the NAND array based on the physical address. The byte-rewritable memory may any byte-rewritable persistent memory. The block-erasable low latency NVM may be a flash memory that has lower latency than NAND array.
- San Jose CA, US Aldo Giovanni Cometti - San Diego CA, US Richard Leo Galbraith - Rochester MN, US Jonas Andrew Goode - Lake Forest CA, US Niranjay Ravindran - Rochester MN, US Anthony Dwayne Weathers - San Diego CA, US
International Classification:
G11C 16/34 G06F 3/06
Abstract:
Systems and methods for read level tracking and optimization are described. Pages from a wordline of a flash memory device read and the raw page data read from the wordline may be buffered in a first set of buffers. The raw page data for each of the pages may be provided to a decoder for decoding and the decoded page data for each of the pages buffered in a second set of buffers. First bin identifiers may be identified for memory cells of the wordline based on the raw page data and second bin identifiers may be identified for the memory cells of the wordline based on the decoded page data. Cell-level statistics may be accumulated based on the first bin identifiers and the second bin identifiers, and a gradient may be determined for respective read levels based on decoding results for each of the pages and the cell-level statistics. Settings for the read levels may be configured in the flash memory device based on the determined gradients.
Name / Title
Company / Classification
Phones & Addresses
Aldo Cometti Manager
SGS Thompson Motors and Generators
1000 E Bell Rd, Phoenix, AZ 85022 (602)4856100
Aldo Cometti Site Manager
Stmicroelectronics, Inc Whol Computer Components · Electronic Parts and Equipment, NEC
4690 Executive Dr, San Diego, CA 92121 (858)4527715
Petaio
Vice President of Products
Encore Semi
Storage Systems Consultant
Western Digital Mar 2017 - Mar 2019
Senior Director Chief Technology Officer Office
Hgst, A Western Digital Company Apr 2014 - Mar 2017
Senior Director Flash Rw Channel
Western Digital Jan 2013 - Apr 2014
Director Ssd
Education:
Politecnico Di Milano 1978 - 1983
Masters, Engineering