- Santa Clara CA, US Rahul JAIN - Gilbert AZ, US Sai VADLAMANI - Chandler AZ, US Cheng XU - Chandler AZ, US Ji Yong PARK - Chandler AZ, US Junnan ZHAO - Gilbert AZ, US Seo Young KIM - Chandler AZ, US
Apparatuses, systems and methods associated with a substrate assembly with an encapsulated magnetic feature for an inductor are disclosed herein. In embodiments, a substrate assembly may include a base substrate, a magnetic feature encapsulated within the base substrate, and a coil, wherein a portion of the coil extends through the magnetic feature. Other embodiments may be described and/or claimed.
Microelectronic Assemblies Having Conductive Structures With Different Thicknesses On A Core Substrate
- Santa Clara CA, US Kyu Oh Lee - Chandler AZ, US Yikang Deng - Chandler AZ, US Zhichao Zhang - Chandler AZ, US Liwei Cheng - Chandler AZ, US Andrew James Brown - Phoenix AZ, US Cheng Xu - Chandler AZ, US Jiwei Sun - Chandler AZ, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 23/498 H01L 23/00 H01L 21/48
Abstract:
Microelectronic assemblies, and related devices and methods, are disclosed herein. For example, in some embodiments, a microelectronic assembly may include a package substrate having a core substrate with a first conductive structure having a first thickness on the core substrate, and a second conductive structure having a second thickness on the core substrate, where the first thickness is different than the second thickness.
- Santa Clara CA, US Junnan Zhao - Gilbert AZ, US Sai Vadlamani - Chandler AZ, US Ying Wang - Chandler AZ, US Rahul Jain - Chandler AZ, US Andrew J. Brown - Chandler AZ, US Lauren A. Link - Chandler AZ, US Cheng Xu - Chandler AZ, US Sheng C. Li - Chandler AZ, US
Methods/structures of forming in-package inductor structures are described. Embodiments include a substrate including a dielectric material, the substrate having a first side and a second side. A conductive trace is located within the dielectric material. A first layer is on a first side of the conductive trace, wherein the first layer comprises an electroplated magnetic material, and wherein a sidewall of the first layer is adjacent the dielectric material. A second layer is on a second side of the conductive trace, wherein the second layer comprises the electroplated magnetic material, and wherein a sidewall of the second layer is adjacent the dielectric material.
Magnetic Structures In Integrated Circuit Package Supports
- Santa Clara CA, US Yikang Deng - Chandler AZ, US Junnan Zhao - Gilbert AZ, US Andrew James Brown - Phoenix AZ, US Cheng Xu - Chandler AZ, US Kaladhar Radhakrishnan - Chandler AZ, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 23/522 H01L 23/528 H01L 23/532 H01L 49/02
Abstract:
Disclosed herein are magnetic structures in integrated circuit (IC) package supports, as well as related methods and devices. For example, in some embodiments, an IC package support may include a conductive line, a magnetic structure around the conductive line, and material stubs at side faces of the magnetic structure.
Microelectronic Assemblies Having An Integrated Capacitor
Microelectronic assemblies, related devices, and methods are disclosed herein. In some embodiments, a microelectronic assembly may include a die having a first surface and an opposing second surface; a capacitor having a surface, wherein the surface of the capacitor is coupled to the first surface of the die; and a conductive pillar coupled to the first surface of the die. In some embodiments, a microelectronic assembly may include a capacitor in a first dielectric layer; a conductive pillar in the first dielectric layer; a first die having a surface in the first dielectric layer; and a second die having a surface in a second dielectric layer, wherein the second dielectric layer is on the first dielectric layer, and wherein the surface of the second die is coupled to the capacitor, to the surface of the first die, and to the conductive pillar.
- Santa Clara CA, US Ying Wang - Chandler AZ, US Cheng Xu - Chandler AZ, US Chong Zhang - Chandler AZ, US Junnan Zhao - Gilbert AZ, US
International Classification:
H01L 23/498 H01L 23/538
Abstract:
An electronic device may include a substrate, and the substrate may include one or more layers. The one or more layers may include a first dielectric material and one or more electrical traces. A cavity may be defined in the substrate, and the cavity may be adapted to receive one or more electrical components. One or more lateral traces may extend through a wall of the cavity. The lateral traces may provide electrical communication pathways between the substrate and the electrical components.
Amruthavalli Pallavi Alur - Tempe AZ, US Brandon C. Marin - Chandler AZ, US Yikang Deng - Chandler AZ, US Liwei Cheng - Chandler AZ, US Jeremy D. Ecton - Gilbert AZ, US Andrew J. Brown - Phoenix AZ, US Lauren A. Link - Mesa AZ, US Cheng Xu - Chandler AZ, US Prithwish Chatterjee - Tempe AZ, US Ying Wang - Chandler AZ, US
International Classification:
H01L 23/48 H01L 23/522 H01L 23/528 H01L 21/768
Abstract:
A substrate for an electronic device may include a first layer, and the first layer may include dielectric material. The first layer may include a first interconnect, and the first interconnect may have a first interconnect profile. The substrate may include a second layer, and the second layer may include dielectric material. The second layer may include a second interconnect, and the second interconnect may have a second interconnect profile. The first interconnect profile may be indicative of a subtractive manufacturing operation and the second interconnect profile may be indicative of an additive manufacturing operation.
- Santa Clara CA, US Sergio Antonio Chan Arguedas - Chandler AZ, US Peng Li - Chandler AZ, US Chandra Mohan Jha - Tempe AZ, US Aravindha R. Antoniswamy - Phoenix AZ, US Cheng Xu - Chandler AZ, US Junnan Zhao - Gilbert AZ, US Ying Wang - Chandler AZ, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 23/367 H01L 23/053 H01L 23/498 H01L 23/433
Abstract:
Disclosed herein are vented lids for integrated circuit (IC) packages, as well as related methods and devices. For example, in some embodiments, an IC package may include a package substrate, a lid, and a die between the package substrate and the lid. A vent may extend between the interior surface and the exterior surface of the lid, and the vent may at least partially overlap the die.
Republic Records New York, NY Jun 2013 to Aug 2013 A&R InternCity of Charlottesville Office of Economic Development Charlottesville, VA Jan 2013 to May 2013 Economic Development InternCACI Chantilly, VA Jun 2011 to 2012 Transformation Solutions InternTechup Ashburn, VA 2009 to 2011 Help Desk Technician
Education:
University of Virginia (U.Va), College of Arts & Sciences 2010 to 2014 BS in Cognitive Science & Leadership
Columbus, OH Baltimore, MD Edinburgh, Scotland Los Angeles, CA Singapore Washington, DC Milwaukee, Wisconsin
Education:
Johns Hopkins University - East Asian Studies, Public Health, University Of Edinburgh - Scottish Literature, New York University School Of Law - LL.M., Ohio State University - J.D.
Cheng Xu
Work:
Google - Software Engineer
Education:
Peking University - Computer Science, Wuhan University - Computer Science
Cheng Xu
Education:
University of Michigan, University of California, Berkeley