Earl L Dombroski

age ~68

from Rio Rancho, NM

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Also known as:

Earl Louis Dombroski
Earl L Dobroski
Earl Danbroski

Phone and address:: 100 Prestige Way NE, Albuquerque, NM 87124
(505)8924258

Connected to:

Earl Dombroski Phones & Addresses

100 Prestige Way NE, Rio Rancho, NM 87124 • (505)8924258
Albuquerque, NM
Wichita, KS

Work

Company:

No-company
2017
Position:

Semi retired

Education

School / High School:

Carnegie Mellon University
1995 to 1997

Skills

Software Development • Semiconductors • Linux • Management • Project Management • Sql • Requirements Analysis • Agile Methodologies • Integration • Testing • Python • Microsoft Sql Server • Databases • Electronics • Engineering Management • Business Intelligence • Software Project Management • Simulations • Team Leadership • Business Analysis • Cross Functional Team Leadership • Engineering • Manufacturing • Program Management • C • Product Development • Product Management • Embedded Systems • Product Marketing • R&D • Process Improvement • Project Planning • Analog • Wireless • Troubleshooting • Microsoft Office • Team Building • Analysis • Vendor Management • New Business Development • Java • Change Management • Automation • Software Engineering

Emails

b***[email protected]

Industries

Computer Software

Resumes

Earl Dombroski

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Location:

New York, NY

Industry:

Computer Software

Work:

No-Company
Semi Retired
Huawei Technologies Jul 2015 - Sep 2016
Friendly User Tester - Volunteer - Android Cell Phones
Document Imaging of the Southwest Mar 2014 - Feb 2015
Software System Support
Core Wafer Systems 2005 - 2012
Vice President Worldwide Operations
Sandia Technologies Inc 1997 - 2005
Director of Research and Development

Education:

Carnegie Mellon University 1995 - 1997
University of Phoenix 1996 - 1996
Master of Science, Masters, Computer Information Systems Southern Illinois University, Carbondale 1988 - 1988
Bachelors, Bachelor of Science, Education University of Michigan College of Literature, Science, and the Arts 1973 - 1974
Lincoln Park High School, Lincoln Park, Mi 1973
University of Oklahoma 1972 - 1972

Skills:

Software Development
Semiconductors
Linux
Management
Project Management
Sql
Requirements Analysis
Agile Methodologies
Integration
Testing
Python
Microsoft Sql Server
Databases
Electronics
Engineering Management
Business Intelligence
Software Project Management
Simulations
Team Leadership
Business Analysis
Cross Functional Team Leadership
Engineering
Manufacturing
Program Management
C
Product Development
Product Management
Embedded Systems
Product Marketing
R&D
Process Improvement
Project Planning
Analog
Wireless
Troubleshooting
Microsoft Office
Team Building
Analysis
Vendor Management
New Business Development
Java
Change Management
Automation
Software Engineering

Us Patents

Semiconductor Test Data Analysis System
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US Patent:

6898545, May 24, 2005
Filed:

Jun 28, 2002
Appl. No.:

10/186171
Inventors:

Yasuhiko Iguchi - Tokyo, JP
Hiroshi Tamura - Tokyo, JP
Mitsuhiro Enokida - Tokyo, JP
Earl Louis Dombroski - Rio Rancho NM, US
Thomas Robert Claus - Albuquerque NM, US
Assignee:

Agilent Technologies Inc - Palo Alto CA
Sandia Technologies, Inc - Albuquerque NM
International Classification:

H01L021/66
US Classification:

702118, 702 16, 702 31, 702 32, 702119, 702120, 702122
Abstract:

A semiconductor test data analysis system () automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (), an analysis target data storage means (), which stores the test data as analysis target data, a historical data storage means (), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation. In this system, when a new analysis operation is specified, the processing means () processes the input test data in accordance with the analysis operation, and processes at least one of the analysis target data, historical data, and display data by the new analysis operation.

Semiconductor Test Data Analysis System
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US Patent:

7035752, Apr 25, 2006
Filed:

Jan 4, 2005
Appl. No.:

11/028823
Inventors:

Yasuhiko Iguchi - Tokyo, JP
Hiroshi Tamura - Tokyo, JP
Mitsuhiro Enokida - Tokyo, JP
Earl Louis Dombroski - Rio Rancho NM, US
Thomas Robert Claus - Albuquerque NM, US
Assignee:

Agilent Technologies, Inc. - Palo Alto CA
International Classification:

H01L 21/66
US Classification:

702118, 700121, 438 17, 714738, 714720, 324555, 324765, 3241581
Abstract:

A semiconductor test data analysis system () automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (), an analysis target data storage means (), which stores the test data as analysis target data, a historical data storage means (), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation. In this system, when a new analysis operation is specified, the processing means () processes the input test data in accordance with the analysis operation, and processes at least one of the analysis target data, historical data, and display data by the new analysis operation.

Loudspeaker
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US Patent:

48072958, Feb 21, 1989
Filed:

Aug 18, 1987
Appl. No.:

7/086595
Inventors:

Earl L. Dombroski - Rio Rancho NM
Assignee:

Dumbroski and Hanson Industrial Designs, Inc. - Rio Rancho NM
International Classification:

H04R 904
US Classification:

381194
Abstract:

A loudspeaker design that eliminates the close tolerance magnetic gap used in conventional loudspeakers and in which motion of the diaphragm is produced by the attraction and repulsion of the magnetic poles of a solenoid and a permanent magnet. In the preferred embodiment, the permanent magnet is affixed to the frame, and the solenoid fits loosely about it, the two being coaxial. Elimination of the magnetic gap relaxes the dimensional tolerances of the loudspeaker as well as the possibility that heating will cause the coil to expand to the point of interfering with the pole pieces. Also, the design of the present invention results in the driving portion of the magnetic field being spread over a relatively larger volume of space, and this reduces the production of motion-induced voltages in the windings of the drive coil and improves linearity.