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Jun Li Jiang

age ~42

from San Jose, CA

Also known as:
  • Jun L Jiang
  • Junli Jiang
  • Jun Lijiang
  • Jiang Jun Li
  • Jiang Junli

Jun Jiang Phones & Addresses

  • San Jose, CA
  • San Francisco, CA
  • 1652 Fern Pine Ct, San Jose, CA 95131 • (408)9261266

Us Patents

  • Wafer Grounding Methodology

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  • US Patent:
    8094428, Jan 10, 2012
  • Filed:
    Oct 27, 2008
  • Appl. No.:
    12/259216
  • Inventors:
    Yi Xiang Wang - Fremont CA, US
    Juying Dou - San Jose CA, US
    Kenichi Kanai - Palo Alto CA, US
    Jun Jiang - Fremont CA, US
    Zheng Fan - Beijing, CN
    Qingyu Meng - Beijing, CN
    Jay Chen - Fremont CA, US
  • Assignee:
    Hermes-Microvision, Inc. - Hsinchu
  • International Classification:
    H01L 21/683
  • US Classification:
    361234
  • Abstract:
    An apparatus for increasing electric conductivity to a wafer substrate, when exposed to electron beam irradiation, is disclosed. More specifically, a methodology to breakdown the insulating layer on wafer backside is provided to significantly reduce the damage on the wafer backside while proceeding with the grounding process.
  • Trace Gas Detection With 2-Photon, 2-Color, Cavity Ring-Down Spectroscopy

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  • US Patent:
    20220326150, Oct 13, 2022
  • Filed:
    Mar 30, 2022
  • Appl. No.:
    17/709222
  • Inventors:
    - Livermore CA, US
    Jun Jiang - Fremont CA, US
  • International Classification:
    G01N 21/39
    G01J 3/42
  • Abstract:
    In one aspect, a method of detecting a trace gas is disclosed. The method includes containing the trace gas in an optical cavity. The method further includes injecting a first laser light from a first laser into the optical cavity causing the trace gas to transition from an energy state lower that a first excited energy state to the first excited energy state, and injecting a second laser light from a second laser into the optical cavity causing the trace gas to transition from the first excited energy state to a second excited energy state. The method includes measuring, by a detector, a first cavity ringdown intensity as a function of time after turning off the second laser with the first laser on, and a second cavity ringdown intensity as a function of time after turning off the second laser with the first laser off.
  • Thermal-Aided Inspection By Advanced Charge Controller Module In A Charged Particle System

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  • US Patent:
    20220189733, Jun 16, 2022
  • Filed:
    Dec 16, 2021
  • Appl. No.:
    17/553357
  • Inventors:
    - Veldhoven, NL
    Jun JIANG - San Jose CA, US
    Jian ZHANG - San Jose CA, US
    Yixiang WANG - Fremont CA, US
  • Assignee:
    ASML Netherlands B.V. - Veldhoven
  • International Classification:
    H01J 37/28
    H01J 37/244
    H01J 37/26
  • Abstract:
    Apparatuses, systems, and methods for providing beams for controlling charges on a sample surface of charged particle beam system. In some embodiments, a module comprising a laser source configured to emit a beam. The beam may illuminate an area adjacent to a pixel on a wafer to indirectly heat the pixel to mitigate a cause of a direct photon-induced effect at the pixel. An electron beam tool configured to detect a defect in the pixel, wherein the defect is induced by the indirect heating of the pixel.
  • Edge-To-Edge Display Devices And Related Methods

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  • US Patent:
    20210004052, Jan 7, 2021
  • Filed:
    Sep 21, 2020
  • Appl. No.:
    17/026877
  • Inventors:
    - Santa Clara CA, US
    Seh Kwa - Saratoga CA, US
    Zhiming Zhuang - Sammamish WA, US
    Jackson Tsai - New Taipei City, TW
    Jun Jiang - Portland OR, US
  • International Classification:
    G06F 1/16
    F21V 8/00
    H05K 1/11
  • Abstract:
    Disclosed herein are example edge-to-edge display devices and related methods. An example display device includes a display screen and a backlight including a light guide frame defining a cavity therein. The example display device includes an integrated circuit coupled to the display screen. The example display device includes a flexible printed circuit in communication with the integrated circuit and including an electrical component coupled thereto. The electrical component is at least partially disposed in the cavity of the light guide frame.
  • Displays With Adaptive Spectral Characteristics

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  • US Patent:
    20200074910, Mar 5, 2020
  • Filed:
    Nov 7, 2019
  • Appl. No.:
    16/677522
  • Inventors:
    - Cupertino CA, US
    Deniz Teoman - San Mateo CA, US
    Jiaying Wu - San Jose CA, US
    John Z. Zhong - Saratoga CA, US
    Jun Jiang - Campbell CA, US
  • International Classification:
    G09G 3/20
    G09G 3/34
  • Abstract:
    An electronic device may include a display having an array of display pixels and having display control circuitry that controls the operation of the display. The display control circuitry may adaptively adjust the spectral characteristics of display light emitted from the display to achieve a desired effect on the human circadian system. For example, the display control circuitry may adjust the spectral characteristics of blue light emitted from the display based on the time of day such that a user's exposure to the display light may result in a circadian response similar to that which would be experienced in natural light. The spectral characteristics of blue light emitted from the display may be adjusted by adjusting the relative maximum power levels provided to blue pixels in the display or by shifting the peak wavelength associated with blue light emitted from the display.
  • Time-Dependent Defect Inspection Apparatus

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  • US Patent:
    20200075287, Mar 5, 2020
  • Filed:
    Aug 27, 2019
  • Appl. No.:
    16/552991
  • Inventors:
    - Veldhoven, NL
    Long Ma - San Jose CA, US
    Yongjun Wang - Pleasanton CA, US
    Jun Jiang - San Jose CA, US
  • International Classification:
    H01J 37/147
    H01J 37/26
    H01J 37/30
  • Abstract:
    An improved charged particle beam inspection apparatus, and more particularly, a particle beam inspection apparatus for detecting a thin device structure defect is disclosed. An improved charged particle beam inspection apparatus may include a charged particle beam source to direct charged particles to a location of a wafer under inspection over a time sequence. The improved charged particle beam apparatus may further include a controller configured to sample multiple images of the area of the wafer at difference times over the time sequence. The multiple images may be compared to detect a voltage contrast difference or changes to identify a thin device structure defect.
  • Pixel Level Polarizer For Flexible Display Panels

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  • US Patent:
    20190041562, Feb 7, 2019
  • Filed:
    Jun 29, 2018
  • Appl. No.:
    16/022837
  • Inventors:
    - SANTA CLARA CA, US
    Kunjal Parikh - San Jose CA, US
    Zhiming Zhuang - Sammamish WA, US
    Jun Jiang - Portland OR, US
  • Assignee:
    INTEL CORPORATION - SANTA CLARA CA
  • International Classification:
    G02B 5/30
    G09G 3/32
    H01L 25/075
    H01L 27/12
    H01L 33/58
    H01L 33/62
    H01L 23/538
  • Abstract:
    Disclosed herein are display panels, display panel stacks, and techniques to manufacture such display panel stacks where a polarizer is provided for each illumination element of the display panel stack. A polarizer can be formed onto each individual illumination element once the illumination element is transferred to the backplane. The polarizer can be arranged to polarize light emitted from the illumination element and light incident on the display from ambient.
  • Head Mounted Display Including Variable Beam Divergence And/Or Beam Direction

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  • US Patent:
    20190041719, Feb 7, 2019
  • Filed:
    Jan 2, 2018
  • Appl. No.:
    15/860584
  • Inventors:
    - Santa Clara CA, US
    Ginni Grover - Santa Clara CA, US
    Jun Jiang - Portland OR, US
    Basel Salahieh - Santa Clara CA, US
    Oscar Nestares - San Jose CA, US
    David W. Browning - Santa Clara CA, US
  • Assignee:
    Intel Corporation - Santa Clara CA
  • International Classification:
    G02F 1/29
  • Abstract:
    Technology for improving performance of a personal display device by variably controlling the emission divergence and/or the emission direction of light from the pixels of the display as a function of the location of the pixel within a display.

Myspace

Jun Jiang Photo 1

Jun Jiang

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Birthday:
1947

Googleplus

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Jun Jiang

Education:
Columbia University
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Jun Jiang

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Jun Jiang

Tagline:
选择比努力更重要 || Good Men always enter last
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Jun Jiang

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Jun Jiang

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Jun Jiang

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Jun Jiang

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Plaxo

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Jiang Jun

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山东淄博奇信电子
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Xue Jun Jiang

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Shang HaiSGS
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jun jiang

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Dalian j n foods co

Flickr

Youtube

jiang jun

jay chou jiang jun

  • Category:
    Music
  • Uploaded:
    10 Nov, 2005
  • Duration:
    3m 30s

Champions League: Michael Maze-Wang Jian Jun

Table Tennis:Your forehand, backhand or service aren't good enough? Ta...

  • Category:
    Sports
  • Uploaded:
    13 Dec, 2009
  • Duration:
    4m 37s

jiang jun lin

the song from kenji wu hehe very nice song i learn how to sing liao ea...

  • Category:
    Music
  • Uploaded:
    04 Jan, 2007
  • Duration:
    3m 50s

Lin Jun Jie - Jiang Nan

Great

  • Category:
    Music
  • Uploaded:
    23 May, 2006
  • Duration:
    4m 19s

Winter Sonata Anime Trailer

Oh yay ~ Finally, the bombshell exploded. Haha. Voiced by the same act...

  • Category:
    Film & Animation
  • Uploaded:
    23 May, 2008
  • Duration:
    2m 11s

Champions League: Oh Sang Eun-Wang Jian Jun

Your forehand, backhand or service aren't good enough? Take a look at ...

  • Category:
    Sports
  • Uploaded:
    18 Dec, 2009
  • Duration:
    7m 6s

Classmates

Jun Jiang Photo 21

Sherman Oaks Center High ...

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Graduates:
Stacy Moskowitz (1989-1993),
Samantha Doyle (2003-2007),
Jun Jiang (2001-2005),
Leandrey Vincenty (1998-2002),
Merlyn Linares (1995-1999)
Jun Jiang Photo 22

George Washington High Sc...

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Graduates:
Michael Lawrence (1989-1993),
Jun Jiang (2003-2007),
Marcos Molina (1999-2003),
Megan Warman (1983-1987)

Facebook

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Jun Jiang New York NY

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Jun Jiang (New York, NY)
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Jun Jiang Ann Arbor MI

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Jun Jiang (Ann Arbor, MI)
Jun Jiang Photo 25

Jun Jiang China

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Jun Jiang (China)
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Jun Jiang France

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Jun Jiang (France)
Jun Jiang Photo 27

Li Jun Jiang

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Jun Jiang Photo 28

Yu Jun Jiang

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Jun Jiang Photo 29

Chin Jun Jiang

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Jun Jiang Photo 30

Jun Jiang

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Friends:
Weiyi Tong, Sofia Koch, Isaac Black, Guanyuan Jia, Kapo Leung Chilie, Susan Song

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