Jun Jiang

US Patent:

8094428, Jan 10, 2012

Filed:

Oct 27, 2008

Appl. No.:

12/259216

Inventors:

Yi Xiang Wang - Fremont CA, US
Juying Dou - San Jose CA, US
Kenichi Kanai - Palo Alto CA, US
Jun Jiang - Fremont CA, US
Zheng Fan - Beijing, CN
Qingyu Meng - Beijing, CN
Jay Chen - Fremont CA, US

Assignee:

Hermes-Microvision, Inc. - Hsinchu

International Classification:

H01L 21/683

US Classification:

361234

Abstract:

An apparatus for increasing electric conductivity to a wafer substrate, when exposed to electron beam irradiation, is disclosed. More specifically, a methodology to breakdown the insulating layer on wafer backside is provided to significantly reduce the damage on the wafer backside while proceeding with the grounding process.

US Patent:

20090154934, Jun 18, 2009

Filed:

Dec 18, 2007

Appl. No.:

11/958779

Inventors:

Jun Jiang - Lake Zurich IL, US
John St. Peter - Elburn IL, US
Aroon Tungare - Winfield IL, US
Huinan Yu - Kildeer IL, US

Assignee:

MOTOROLA, INC. - Schaumburg IL

International Classification:

H04B 10/00

US Classification:

398135

Abstract:

An optical transceiver () can comprise an optical receiver (), an optical lens (), and an optical transmitter (). The optical lens can have a lateral periphery () and can be configured and arranged to focus at least some incoming light () at the optical receiver. The optical transmitter, in turn, can be disposed within a boundary defined by the lateral periphery of the optical lens and other than in a lateral plane that contains the optical receiver.

US Patent:

20220326150, Oct 13, 2022

Filed:

Mar 30, 2022

Appl. No.:

17/709222

Inventors:

- Livermore CA, US
Jun Jiang - Fremont CA, US

International Classification:

G01N 21/39
G01J 3/42

Abstract:

In one aspect, a method of detecting a trace gas is disclosed. The method includes containing the trace gas in an optical cavity. The method further includes injecting a first laser light from a first laser into the optical cavity causing the trace gas to transition from an energy state lower that a first excited energy state to the first excited energy state, and injecting a second laser light from a second laser into the optical cavity causing the trace gas to transition from the first excited energy state to a second excited energy state. The method includes measuring, by a detector, a first cavity ringdown intensity as a function of time after turning off the second laser with the first laser on, and a second cavity ringdown intensity as a function of time after turning off the second laser with the first laser off.

US Patent:

20220189733, Jun 16, 2022

Filed:

Dec 16, 2021

Appl. No.:

17/553357

Inventors:

- Veldhoven, NL
Jun JIANG - San Jose CA, US
Jian ZHANG - San Jose CA, US
Yixiang WANG - Fremont CA, US

Assignee:

ASML Netherlands B.V. - Veldhoven

International Classification:

H01J 37/28
H01J 37/244
H01J 37/26

Abstract:

Apparatuses, systems, and methods for providing beams for controlling charges on a sample surface of charged particle beam system. In some embodiments, a module comprising a laser source configured to emit a beam. The beam may illuminate an area adjacent to a pixel on a wafer to indirectly heat the pixel to mitigate a cause of a direct photon-induced effect at the pixel. An electron beam tool configured to detect a defect in the pixel, wherein the defect is induced by the indirect heating of the pixel.

US Patent:

20210004052, Jan 7, 2021

Filed:

Sep 21, 2020

Appl. No.:

17/026877

Inventors:

- Santa Clara CA, US
Seh Kwa - Saratoga CA, US
Zhiming Zhuang - Sammamish WA, US
Jackson Tsai - New Taipei City, TW
Jun Jiang - Portland OR, US

International Classification:

G06F 1/16
F21V 8/00
H05K 1/11

Abstract:

Disclosed herein are example edge-to-edge display devices and related methods. An example display device includes a display screen and a backlight including a light guide frame defining a cavity therein. The example display device includes an integrated circuit coupled to the display screen. The example display device includes a flexible printed circuit in communication with the integrated circuit and including an electrical component coupled thereto. The electrical component is at least partially disposed in the cavity of the light guide frame.

US Patent:

20200074910, Mar 5, 2020

Filed:

Nov 7, 2019

Appl. No.:

16/677522

Inventors:

- Cupertino CA, US
Deniz Teoman - San Mateo CA, US
Jiaying Wu - San Jose CA, US
John Z. Zhong - Saratoga CA, US
Jun Jiang - Campbell CA, US

International Classification:

G09G 3/20
G09G 3/34

Abstract:

An electronic device may include a display having an array of display pixels and having display control circuitry that controls the operation of the display. The display control circuitry may adaptively adjust the spectral characteristics of display light emitted from the display to achieve a desired effect on the human circadian system. For example, the display control circuitry may adjust the spectral characteristics of blue light emitted from the display based on the time of day such that a user's exposure to the display light may result in a circadian response similar to that which would be experienced in natural light. The spectral characteristics of blue light emitted from the display may be adjusted by adjusting the relative maximum power levels provided to blue pixels in the display or by shifting the peak wavelength associated with blue light emitted from the display.

US Patent:

20200075287, Mar 5, 2020

Filed:

Aug 27, 2019

Appl. No.:

16/552991

Inventors:

- Veldhoven, NL
Long Ma - San Jose CA, US
Yongjun Wang - Pleasanton CA, US
Jun Jiang - San Jose CA, US

International Classification:

H01J 37/147
H01J 37/26
H01J 37/30

Abstract:

An improved charged particle beam inspection apparatus, and more particularly, a particle beam inspection apparatus for detecting a thin device structure defect is disclosed. An improved charged particle beam inspection apparatus may include a charged particle beam source to direct charged particles to a location of a wafer under inspection over a time sequence. The improved charged particle beam apparatus may further include a controller configured to sample multiple images of the area of the wafer at difference times over the time sequence. The multiple images may be compared to detect a voltage contrast difference or changes to identify a thin device structure defect.

US Patent:

20190041562, Feb 7, 2019

Filed:

Jun 29, 2018

Appl. No.:

16/022837

Inventors:

- SANTA CLARA CA, US
Kunjal Parikh - San Jose CA, US
Zhiming Zhuang - Sammamish WA, US
Jun Jiang - Portland OR, US

Assignee:

INTEL CORPORATION - SANTA CLARA CA

International Classification:

G02B 5/30
G09G 3/32
H01L 25/075
H01L 27/12
H01L 33/58
H01L 33/62
H01L 23/538

Abstract:

Disclosed herein are display panels, display panel stacks, and techniques to manufacture such display panel stacks where a polarizer is provided for each illumination element of the display panel stack. A polarizer can be formed onto each individual illumination element once the illumination element is transferred to the backplane. The polarizer can be arranged to polarize light emitted from the illumination element and light incident on the display from ambient.