Lin Zhou

US Patent:

7406860, Aug 5, 2008

Filed:

Apr 28, 2006

Appl. No.:

11/413579

Inventors:

Lin Zhou - Eagan MN, US
Huiwen Liu - Eden Prairie MN, US
Dale Egbert - Deephaven MN, US
Jonathan A. Nelson - Maple Grove MN, US
Jianxin Zhu - Eagan MN, US

Assignee:

Seagate Technology LLC - Scotts Valley CA

International Classification:

G01B 6/28

US Classification:

73105

Abstract:

A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.

US Patent:

8296860, Oct 23, 2012

Filed:

Mar 16, 2009

Appl. No.:

12/404849

Inventors:

Huiwen Liu - Eden Prairie MN, US
Lin Zhou - Eagan MN, US
Dale Egbert - Deephaven MN, US
Jonathan Arland Nelson - Maple Grove MN, US
Peter Gunderson - Ellsworth WI, US

Assignee:

Seagate Technology LLC - Cupertino CA

International Classification:

G01B 5/28

US Classification:

850 33, 850 1, 850 4, 850 11, 850 19, 850 20, 250306, 250307, 250310, 977850, 977851, 977860, 977863, 977872, 73105

Abstract:

An atomic force microscopy (AFM) method includes a scanning probe that scans a surface of a structure to produce a first structure image. The structure is then rotated by 90 with respect to the scanning probe. The scanning probe scans the surface of the structure again to produce a second structure image. The first and second structure images are combined to produce best fit image of the surface area of the structure. The same method is used to produce the best fit image of a flat standard. The best fit image of the flat standard is subtracted from the best fit image of the structure to obtain a true topographical image in which Z direction run out error is substantially reduced or eliminated.

US Patent:

8371155, Feb 12, 2013

Filed:

Aug 10, 2010

Appl. No.:

12/854112

Inventors:

Lin Zhou - Eagan MN, US
Huiwen Liu - Eden Prairie MN, US
Dale Egbert - Deephaven MN, US
Peter Gunderson - Ellsworth WI, US
John Ibele - Minneapolis MN, US
Cing Siong Ling - Bayan Lepas, MY

Assignee:

Seagate Technology LLC - Cupertino CA

International Classification:

G01N 19/02

US Classification:

73104

Abstract:

An apparatus and associated method for topographically characterizing a workpiece. A scanning probe obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file and to scan a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest.

US Patent:

8525112, Sep 3, 2013

Filed:

Aug 10, 2010

Appl. No.:

12/854122

Inventors:

Lin Zhou - Eagan MN, US
Huiwen Liu - Eden Prairie MN, US
Dale Egbert - Deephaven MN, US
Peter Gunderson - Ellsworth WI, US
John Ibele - Minneapolis MN, US

Assignee:

Seagate Technology LLC - Cupertino CA

International Classification:

H01J 37/26

US Classification:

250307, 250306, 382181, 382194, 382221, 702 27, 702 28, 702 29

Abstract:

A method and associated apparatus for topographically characterizing a workpiece. The workpiece is scanned with a scanning probe along a first directional grid, thereby scanning a reference surface and an area of interest subportion of the reference surface, at a variable pixel density including a first pixel density outside the area of interest and a second pixel density inside the area of interest to derive a first digital file characterizing topography of the workpiece. The workpiece is further scanned along the reference surface and the area of interest with the scanning probe along a second directional grid that is substantially orthogonal to the first directional grid and at a constant pixel density to derive a second digital file characterizing topography of the workpiece. A processor executes computer-readable instructions stored in memory that generate a topographical profile of the workpiece in relation to the first and second digital files.

US Patent:

8553350, Oct 8, 2013

Filed:

May 27, 2011

Appl. No.:

13/117969

Inventors:

Lin Zhou - Eagan MN, US
Huazhou Lou - Eden Prairie MN, US
Dongming Liu - Eden Prairie MN, US
Vincent Bernard Engelkes - Maple Grove MN, US

Assignee:

Seagate Technology LLC - Scotts Valley CA

International Classification:

G11B 21/02

US Classification:

360 75

Abstract:

A system that is capable of monitoring tribological data, such as friction, in a data storage device. In accordance with various embodiments, a magnetoresistive head is separated from a rotating data storage media by an air bearing and attached to a slider that is adjusted through deformation controlled by a heating element. A measurement circuit concurrently monitors friction from the head and power applied to the heating element to determine an MR head clearance. The measurement circuit includes at least a phase filter that eliminates off-phase friction from contributing to the determination of the MR head clearance.

US Patent:

8638349, Jan 28, 2014

Filed:

Mar 11, 2013

Appl. No.:

13/793803

Inventors:

Kenneth Haapala - Plymouth MN, US
Scott E. Ryun - Chaska MN, US
Lin Zhou - Eagan MN, US

Assignee:

Seagate Technology LLC - Cupertino CA

International Classification:

G11B 21/12
G11B 5/455

US Classification:

346 78, 360 75

Abstract:

An apparatus includes a head transducer configured to interact with a magnetic recording medium and a heater configured to thermally actuate the head transducer. A thermal sensor at or near the head transducer is configured to produce a sensor signal. Circuitry is coupled to the heater and configured to cause an oscillation in heater power. The heater power oscillation causes an oscillation in the sensor signal. A detector is coupled to the thermal sensor and configured to detect head-medium contact using the oscillating sensor signal and heater power.

US Patent:

20080273260, Nov 6, 2008

Filed:

May 1, 2007

Appl. No.:

11/799204

Inventors:

Dongming Liu - Eden Prairie MN, US
Lin Zhou - Eagan MN, US
Lance E. Stover - Eden Prairie MN, US

Assignee:

Seagate Technology LLC - Scotts Valley CA

International Classification:

G11B 5/596
G11B 5/127
G11B 5/52

US Classification:

360 86

Abstract:

A method and apparatus are provided for positioning a transducer relative to a track of a data storage medium and inducing lateral modulation of transducer the relative to the track. An element of the transducer is actuated toward the storage medium during the lateral modulation, and atomic interaction is detected between the element and the storage medium because of a change in a response to the lateral modulation of the transducer due to the atomic interaction.

US Patent:

20080276696, Nov 13, 2008

Filed:

Jul 25, 2008

Appl. No.:

12/179688

Inventors:

Lin Zhou - Eagan MN, US
Huiwen Liu - Eden Prairie MN, US
Dale Egbert - Deephaven MN, US
Jonathan A. Nelson - Maple Grove MN, US
Jianxin Zhu - Eagan MN, US

Assignee:

SEAGATE TECHNOLOGY LLC - Scotts Valley CA

International Classification:

G01B 5/28

US Classification:

73105

Abstract:

A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.