Sang Gon Lee - Taejon, KR Jun Gyo Bak - Taejon, KR Manfred Bitter - Princeton NJ
Assignee:
Korea Basic Science Institute - Taejon
International Classification:
H01J 3506
US Classification:
378136, 378119
Abstract:
Disclosed is an X-ray tube for generating X-rays linearly focused in a vertical or horizontal direction in accordance with the orientation of a filament used. The X-ray tube includes a linear filament arranged at a cathode included in the X-ray tube, the linear filament serving to allow an anode included in the X-ray tube to generate line-focused X-rays. The X-ray tube according to the present invention can be applied to a calibration for X-ray spectroscopes, or various applications requiring line-focused X-rays.
Simultaneous Measurement Of The Reflectivity Of X-Ray With Different Orders Of Reflections And Apparatus For Measurement Thereof
Sang Gon Lee - Daejeon, KR Jun Gyo Bak - Daejeon, KR Manfred Bitter - Princeton NJ, US
Assignee:
Korea Basic Science Institute
International Classification:
G01N 23/20 G01N 23/207
US Classification:
378 73, 378 70
Abstract:
Disclosed are an apparatus and a method for simultaneously measuring integrated reflectivity of X-rays with different orders of reflections in crystal. Continuous X-rays are incident into the crystal and reflection intensities of the X-rays reflected from the crystal with different orders of reflections are measured based on Bragg's law, thereby measuring reflectivity of X-rays with different orders of reflections.
Non-Astigmatic Imaging With Matched Pairs Of Spherically Bent Reflectors
Manfred Ludwig Bitter - Princeton NJ, US Kenneth Wayne Hill - Plainsboro NJ, US Steven Douglas Scott - Wellesley MA, US Russell Feder - Newton PA, US Jinseok Ko - Cambridge MA, US John E. Rice - N. Billerica MA, US Frank Jones - Manalapan NJ, US
Assignee:
U.S. Department of Energy - Washington DC
International Classification:
G01J 1/00
US Classification:
2503361
Abstract:
Arrangements for the point-to-point imaging of a broad spectrum of electromagnetic radiation and ultrasound at large angles of incidence employ matched pairs of spherically bent reflectors to eliminate astigmatic imaging errors. Matched pairs of spherically bent crystals or spherically bent multi-layers are used for X-rays and EUV radiation; and matched pairs of spherically bent mirrors that are appropriate for the type of radiation are used with microwaves, infrared and visible light, or ultrasound. The arrangements encompass the two cases, where the Bragg angle—the complement to the angle of incidence in optics—is between 45 and 90 on both crystals/mirrors or between 0 and 45 on the first crystal/mirror and between 45 and 90 on the second crystal/mirror, where the angles of convergence and divergence are equal. For x-rays and EUV radiation, also the Bragg condition is satisfied on both spherically bent crystals/multi-layers.
X-Ray Imaging Crystal Spectrometer For Extended X-Ray Sources
Manfred L. Bitter - Princeton NJ Ben Fraenkel - Jerusalem, IL James L. Gorman - Bordentown NJ Kenneth W. Hill - Lawrenceville NJ A. Lane Roquemore - Cranbury NJ Wolfgang Stodiek - Princeton NJ Schweickhard E. von Goeler - Princeton NJ
Assignee:
The United States of America as represented by the United States Department of Energy - Washington DC
International Classification:
G01T 136
US Classification:
378 82
Abstract:
Spherically or toroidally curved, double focusing crystals are used in a spectrometer for X-ray diagnostics of an extended X-ray source such as a hot plasma produced in a tokomak fusion experiment to provide spatially and temporally resolved data on plasma parameters using the imaging properties for Bragg angles near 45. For a Bragg angle of 45. degree. , the spherical crystal focuses a bundle of near parallel X-rays (the cross section of which is determined by the cross section of the crystal) from the plasma to a point on a detector, with parallel rays inclined to the main plain of diffraction focused to different points on the detector. Thus, it is possible to radially image the plasma X-ray emission in different wavelengths simultaneously with a single crystal.
Precise Proton Positioning Method For Proton Therapy Treatment, And Proton Therapy Treatment Method
- Princeton NJ, US Kenneth W. HILL - Plainsboro NJ, US Lan GAO - Princeton NJ, US Manfred BITTER - Princeton NJ, US Dale MEADE - Princeton NJ, US Brian Francis KRAUS - Princeton NJ, US
International Classification:
A61N 5/10 A61L 31/02 A61L 31/14
Abstract:
A system/apparatus and a positioning method for the determination of the delivery of protons within a mammalian body or inanimate medium, as well as a treatment method which comprises the delivery of protons to a mammalian body. The system/apparatus necessarily comprise the use of a detector which is placed in the proximity of the body or medium which is responsive to a signal emitted from a fiducuial marker which his positioned within or in the near proximity of target tissue within the body or target volume within the medium. A signal emitted from the fiducial marker is responsive to the impingement of protons thereon received from a controlled proton beam, the signal may be used to modify the subsequent operative characteristics of the source of protons.
Novel Objective For Euv Microscopy, Euv Lithography, And X-Ray Imaging
Manfred Bitter - Princeton NJ, US Kenneth W. Hill - Plainsboro NJ, US Philip Efthimion - Bedminster NJ, US
Assignee:
The Trustees of Princeton University - Princeton NJ
International Classification:
G01N 23/04 G03F 7/20 G02B 27/09
US Classification:
378 70
Abstract:
Disclosed is an imaging apparatus for EUV spectroscopy, EUV microscopy, EUV lithography, and x-ray imaging. This new imaging apparatus could, in particular, make significant contributions to EUV lithography at wavelengths in the range from 10 to 15 nm, which is presently being developed for the manufacturing of the next-generation integrated circuits. The disclosure provides a novel adjustable imaging apparatus that allows for the production of stigmatic images in x-ray imaging, EUV imaging, and EUVL. The imaging apparatus of the present invention incorporates additional properties compared to previously described objectives. The use of a pair of spherical reflectors containing a concave and convex arrangement has been applied to a EUV imaging system to allow for the image and optics to all be placed on the same side of a vacuum chamber. Additionally, the two spherical reflector segments previously described have been replaced by two full spheres or, more precisely, two spherical annuli, so that the total photon throughput is largely increased. Finally, the range of permissible Bragg angles and possible magnifications of the objective has been largely increased.
Resumes
Principal Research Physicist Plasma Physics Laboratory