Manish Sharma

US Patent:

6480825, Nov 12, 2002

Filed:

Jan 29, 1998

Appl. No.:

09/015393

Inventors:

Manish Sharma - Somerset NJ
Richard J. Mammone - Bridgewater NJ

Assignee:

T-NETIX, Inc. - Dallas TX

International Classification:

G01L 1700

US Classification:

704270, 704273, 704275, 379 67, 379 88

Abstract:

The present invention is a reliable system and method for detecting a recorded voice, which can be employed independently or to provide protection from fraudulent use of a recording to defeat an automatic speaker recognition system. Several techniques and systems are employed either independently or in combination to verify that a detected audio sample is live and not recorded. Temporal speech characteristics of an audio sample are analyzed to determine whether a sample under examination is so similar to a previous sample as to indicate a recording. Communications channel characteristics are examined to determine whether an sample was recorded on a different channel from a predetermined communications channel. A pattern classifier is trained to distinguish between live and recorded speech. Finally, an âaudio watermarkâ is used to determine whether a detected audio sample is a recording of a previous communication by an authorized user.

US Patent:

6738543, May 18, 2004

Filed:

May 30, 2002

Appl. No.:

10/160383

Inventors:

Karl W. Beeson - Princeton NJ
Lawrence W. Shacklette - Maplewood NJ
Manish Sharma - Princeton NJ
Han Zou - Windsor NJ

Assignee:

E. I. du Pont de Nemours and Company - Wilmington DE

International Classification:

G02B 626

US Classification:

385 27, 385 10, 385 16, 385 37

Abstract:

A hitless wavelength selective optical device includes a first thermo-optic switch (TOS), a second TOS, a first waveguide, a second waveguide, a third waveguide, a heating element and a control unit. The first TOS includes receives a wavelength division multiplexed (WDM) signal at a first port of the first TOS. The second TOS provides at least one channel of the WDM signal at a first port of the second TOS. The first waveguide is coupled between second ports of the first and second TOS. The second waveguide includes a tunable filter that reflects a selected channel from the received WDM signal and coupled between the third ports of the first and second TOS.

US Patent:

7395473, Jul 1, 2008

Filed:

Oct 25, 2005

Appl. No.:

11/258769

Inventors:

Manish Sharma - Wilsonville OR, US

International Classification:

G01R 31/28

US Classification:

714729, 714727

Abstract:

Methods, apparatus, and systems for filtering compacted test responses are disclosed. The methods, apparatus, and systems can be used, for example, to remove the effects of unknown test values. For instance, in one embodiment, a compacted test response from a compactor of a circuit-under-test is received. In this embodiment, the compacted test response includes one or more compacted test response values that are dependent on one or more respective unknown values. The compacted test response is filtered to remove the dependency of at least some of the compacted test response values on the one or more respective unknown values, and a filtered test response is output. Various filtering circuits and testing systems are also disclosed.

US Patent:

7716548, May 11, 2010

Filed:

Jun 27, 2008

Appl. No.:

12/215593

Inventors:

Manish Sharma - Wilsonville OR, US

International Classification:

G01R 31/28

US Classification:

714729, 714727

Abstract:

Methods, apparatus, and systems for filtering compacted test responses are disclosed. The methods, apparatus, and systems can be used, for example, to remove the effects of unknown test values. For instance, in one embodiment, a compacted test response from a compactor of a circuit-under-test is received. In this embodiment, the compacted test response includes one or more compacted test response values that are dependent on one or more respective unknown values. The compacted test response is filtered to remove the dependency of at least some of the compacted test response values on the one or more respective unknown values, and a filtered test response is output. Various filtering circuits and testing systems are also disclosed.

US Patent:

7836366, Nov 16, 2010

Filed:

Oct 22, 2007

Appl. No.:

11/876430

Inventors:

Manish Sharma - Wilsonville OR, US

International Classification:

G01R 31/28
G01R 31/14
G01R 31/02
G01R 31/26
G06F 11/00

US Classification:

714726, 714 25, 714724, 714729, 714737, 714742, 324528, 324531, 324537, 324765, 702117

Abstract:

Among the various embodiments described is a method of detecting defects in a cell of an integrated circuit that analyzes exercising conditions applied to an input of the cell during a capture phase of testing with failed test patterns that produce an indication of a fault and that analyzes the exercising conditions that are applied during a capture phase of testing with observable passing patterns that do not provide an indication of a fault. From the analysis, true failing excitation conditions and passing excitation conditions can be determined and used to identify whether a defect is in the cell or on an interconnect wire of the integrated circuit.

US Patent:

8280687, Oct 2, 2012

Filed:

Oct 20, 2006

Appl. No.:

11/584038

Inventors:

Manish Sharma - Wilsonville OR, US
Thomas Hans Rinderknecht - Tualatin OR, US

Assignee:

Mentor Graphics Corporation - Wilsonville OR

International Classification:

G06F 11/30
G01R 31/28

US Classification:

702185, 714729

Abstract:

In embodiments of the disclosed technology, diagnosis of a circuit is performed using compactor signatures (a technique referred to herein as “signature-based diagnosis”). Signature-based diagnosis typically does not require a test step that bypasses the compactor. Compactor signatures can be read from a compactor on a per-pattern basis, and an expected signature can be loaded into a compactor while an actual signature is being read from the compactor. Error functions can be used to describe relationships between errors in scan cell values and per-pattern compactor signatures, and the functions can be used to help generate a list of fault candidates in a circuit design.

US Patent:

8448032, May 21, 2013

Filed:

Feb 23, 2009

Appl. No.:

12/918988

Inventors:

Manish Sharma - Wilsonville OR, US
Thomas H. Rinderknecht - Tualatin OR, US

Assignee:

Mentor Graphics Corporation - Wilsonville OR

International Classification:

G01R 13/28

US Classification:

714732, 714737, 714742

Abstract:

Techniques are disclosed for reducing the set of initial candidates in signature based diagnosis methodology. These techniques are based on a unique way of making optimum use of information from logic back-cone tracing along with equations that describe the test response compactor.

US Patent:

8607107, Dec 10, 2013

Filed:

Apr 20, 2011

Appl. No.:

13/091092

Inventors:

Manish Sharma - Wilsonville OR, US
Avijit Dutta - West Linn OR, US
Robert Brady Benware - Clackamas OR, US
Mark A Kassab - Wilsonville OR, US

Assignee:

Mentor Graphics Corporation - Wilsonville OR

International Classification:

G01R 31/28

US Classification:

714729

Abstract:

Disclosed are representative embodiments of methods, apparatus, and systems for partitioning-based Test Access Mechanisms (TAM). Test response data are captured by scan cells of a plurality scan chains in a circuit under test and are compared with test response data expected for a good CUT to generate check values. Based on the check values, partition pass/fail signals are generated by partitioning scheme generators. Each of the partitioning scheme generators is configured to generate one of the partition pass/fail signals for one of partitioning schemes. A partitioning scheme divides the scan cells into a set of non-overlapping partitions. Based on the partition pass/fail signals, a failure diagnosis process may be performed.