Willem G Langeveld

US Patent:

20120257719, Oct 11, 2012

Filed:

Sep 29, 2011

Appl. No.:

13/248079

Inventors:

Willem G.J. Langeveld - Menlo Park CA, US
William A. Johnson - La Honda CA, US
Roger D. Owen - Modesto CA, US
Russell G. Schonberg - Los Altos Hills CA, US

International Classification:

G01N 23/04

US Classification:

378 62

Abstract:

The present application is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present application further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.

US Patent:

20130129043, May 23, 2013

Filed:

Feb 3, 2011

Appl. No.:

13/577178

Inventors:

Edward James Morton - Guildford, GB
Joseph Bendahan - San Jose CA, US
Willem G.J. Langeveld - Menlo Park CA, US

International Classification:

G01N 23/04

US Classification:

378 62

Abstract:

The present application discloses scanner systems that have a radiation generator arranged to generate radiation to irradiate an object, a detector arranged to detect the radiation after it has interacted with the object and generate a sequence of detector data sets as the object is moved relative to the generator, and processors arranged to process each of the detector data sets thereby to generate a control output.

US Patent:

20100034355, Feb 11, 2010

Filed:

Jun 12, 2009

Appl. No.:

12/484172

Inventors:

Willem G.J. Langeveld - Menlo Park CA, US
William A. Johnson - La Honda CA, US
Roger D. Owen - Modesto CA, US
Russell G. Schonberg - Los Altos Hills CA, US

International Classification:

H05G 1/30
G01N 23/04

US Classification:

378 95, 378 57

Abstract:

The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present invention further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.

US Patent:

20160223706, Aug 4, 2016

Filed:

Jan 14, 2016

Appl. No.:

14/996018

Inventors:

- Torrance CA, US
Willem G.J. Langeveld - Menlo Park CA, US
Joseph Bendahan - San Jose CA, US
Martin Janecek - Sunnyvale CA, US
Dan Strellis - San Jose CA, US

International Classification:

G01V 5/00
G21K 1/02

Abstract:

The present specification discloses methods for inspecting liquids, aerosols and gels (LAGs) for threats. The method includes scanning LAGs packed in plastic bags in a multiple step process. In a primary scan, the bag is scanned using dual energy CT technique with fan beam radiation. In case of an alarm, the alarming LAG container is scanned again using coherent X-ray scatter technique with cone beam radiation. The system has a mechanism to switch between two collimators to produce either fan beam or cone beam. The system also has a mechanism to position the target properly for scanning and prevent container overlap when scanning multiple LAG containers in a bag.

US Patent:

20140341340, Nov 20, 2014

Filed:

Mar 28, 2014

Appl. No.:

14/228340

Inventors:

- Torrance CA, US
Willem G.J. Langeveld - Menlo Park CA, US

Assignee:

Rapiscan Systems, Inc. - Torrance CA

International Classification:

G01N 23/06

US Classification:

378 53

Abstract:

The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.