Yan Qiu Zhao
age ~42
from San Jose, CA
- Also known as:
-
- Yan Q Zhao
- Yanqiu Zhao
- Zhao Yan
- Phone and address:
- 1926 Messina Dr, San Jose, CA 95132
Yan Zhao Phones & Addresses
- 1926 Messina Dr, San Jose, CA 95132
- Milpitas, CA
- Cupertino, CA
Medicine Doctors
Yan S. Zhao
view sourceSpecialties:
Gastroenterology
Work:
Loma Linda Physicians Medical GroupLoma Linda Rheumatology & Gastroenterology
11370 Anderson St STE 3625, Loma Linda, CA 92354
(909)5582860 (phone), (909)5582417 (fax)
11370 Anderson St STE 3625, Loma Linda, CA 92354
(909)5582860 (phone), (909)5582417 (fax)
Education:
Medical School
Beijing Med Univ, Beijing City, Beijing, China
Graduated: 1993
Beijing Med Univ, Beijing City, Beijing, China
Graduated: 1993
Procedures:
Destruction of Benign/Premalignant Skin Lesions
Sigmoidoscopy
Colonoscopy
Esophageal Dilatation
Upper Gastrointestinal Endoscopy
Sigmoidoscopy
Colonoscopy
Esophageal Dilatation
Upper Gastrointestinal Endoscopy
Conditions:
Anemia
Constipation
Gastroesophageal Reflux Disease (GERD)
Gastrointestinal Hemorrhage
Inflammatory Bowel Disease (IBD)
Constipation
Gastroesophageal Reflux Disease (GERD)
Gastrointestinal Hemorrhage
Inflammatory Bowel Disease (IBD)
Languages:
English
Description:
Dr. Zhao graduated from the Beijing Med Univ, Beijing City, Beijing, China in 1993. She works in Loma Linda, CA and specializes in Gastroenterology. Dr. Zhao is affiliated with Loma Linda University Medical Center.
Yan Zhao
view sourceSpecialties:
Hematology/Oncology
Work:
University Alabama Birmingham Hematology Oncology
1802 6 Ave S STE NP2540, Birmingham, AL 35233
(205)9967557 (phone), (205)9759002 (fax)
1802 6 Ave S STE NP2540, Birmingham, AL 35233
(205)9967557 (phone), (205)9759002 (fax)
Languages:
English
Spanish
Spanish
Description:
Dr. Zhao works in Birmingham, AL and specializes in Hematology/Oncology. Dr. Zhao is affiliated with University Of Alabama Hospital.
Yan Zhao
view sourceSpecialties:
Pathology
Anatomic Pathology & Clinical Pathology
Cytopathology
Anatomic Pathology & Clinical Pathology
Cytopathology
Education:
(1987)
Us Patents
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Method For In-Line Monitoring Of Via/Contact Holes Etch Process Based On Test Structures In Semiconductor Wafer Manufacturing
view source -
US Patent:6815345, Nov 9, 2004
-
Filed:Nov 21, 2002
-
Appl. No.:10/302809
-
Inventors:Yan Zhao - San Jose CA
Chang-Chun (Roland) Yeh - Miaoli, TW
Zhongwei Chen - San Jose CA
Jack Jau - Los Altos CA -
Assignee:Hermes-Microvision (Taiwan) Inc. - Hsinchu
-
International Classification:H01L 2144
-
US Classification:438657, 438708, 438735
-
Abstract:A method for in-line monitoring of via/contact etching process based on a test structure is described. The test structure is comprised of via/contact holes of different sizes and densities in a layout such that, for a certain process, the microloading or RIE lag induced non-uniform etch rate produce under-etch in some regions and over-etch in others. A scanning electron microscope is used to distinguish these etching differences in voltage contrast images. Image processing and simple calibration convert these voltage contrast images into a âfingerprintâ image characterizing the etching process in terms of thickness over-etched or under-etched. Tolerance of shifting or deformation of this image can be set for validating the process uniformity. This image can also be used as a measure to monitor long-term process parameter shifting, as well as wafer-to-wafer or lot-to-lot variations. Advanced process control (APC) can be performed in-line with the guidance of this image so that potential electrical defects are avoided and process yield ramp accelerated.
-
Common User Profile Server And Method
view source -
US Patent:6944677, Sep 13, 2005
-
Filed:May 9, 2000
-
Appl. No.:09/567255
-
Inventors:Yan Zhao - Mountain View CA, US
-
Assignee:Aspect Communications Corporation - San Jose CA
-
International Classification:G06F015/173
-
US Classification:709244, 707 10
-
Abstract:A method and apparatus is provided for facilitating the exchange of user profile information between an information provider and an application system. The invention allows a user to create and edit user profile information stored by an information provider. The information provider stores the information and provides a mechanism for providing the user profile information, or portions thereof, to various application systems. When a user initiates a registration or similar process with an application system, the present invention facilitates the exchange of information between the application system and the information provider to streamline the registration process.
-
Method For In-Line Monitoring Of Via/Contact Holes Etch Process Based On Test Structures In Semiconductor Wafer Manufacturing
view source -
US Patent:7105436, Sep 12, 2006
-
Filed:Jun 9, 2004
-
Appl. No.:10/865230
-
Inventors:Yan Zhao - San Jose CA, US
Chang-Chun Yeh - Miaoli, TW
Zhong-Wei Chen - San Jose CA, US
Jack Jau - Los Altos CA, US -
Assignee:Hermes-Microvision, Inc. - Hsinchu
-
International Classification:H01L 21/4763
-
US Classification:438637, 438735
-
Abstract:A method for in-line monitoring of via/contact etching process based on a test structure is described. The test structure is comprised of via/contact holes of different sizes and densities in a layout such that, for a certain process, the microloading or RIE lag induced non-uniform etch rate produce under-etch in some regions and over-etch in others. A scanning electron microscope is used to distinguish these etching differences in voltage contrast images. Image processing and simple calibration convert these voltage contrast images into a “fingerprint” image characterizing the etching process in terms of thickness over-etched or under-etched. Tolerance of shifting or deformation of this image can be set for validating the process uniformity. This image can also be used as a measure to monitor long-term process parameter shifting, as well as wafer-to-wafer or lot-to-lot variations. Advanced process control (APC) can be performed in-line with the guidance of this image so that potential electrical defects are avoided and process yield ramp accelerated.
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Method And System To Register A User On An Application System
view source -
US Patent:7373374, May 13, 2008
-
Filed:Jun 8, 2005
-
Appl. No.:11/149053
-
Inventors:Yan Zhao - Mountain View CA, US
-
Assignee:Aspect Software, Incorporated - Bombard IL
-
International Classification:G06F 15/16
-
US Classification:709201
-
Abstract:A method and system to register a user on an application system. The system includes an application system that receives a first request to retrieve user profile information to register the user on the application system. The application system, in turn, communicates a second request for the user profile information to the information provider. Finally, the application system receives the user profile information from the information provider to register the user on the application system.
-
Method For In-Line Monitoring Of Via/Contact Holes Etch Process Based On Test Structures In Semiconductor Wafer Manufacturing
view source -
US Patent:7474001, Jan 6, 2009
-
Filed:Jun 13, 2006
-
Appl. No.:11/452544
-
Inventors:Yan Zhao - San Jose CA, US
Chang-Chun Yeh - Miaoli, TW
Zhong-Wei Chen - San Jose CA, US
Jack Jau - Los Altos CA, US -
Assignee:Hermes-Microvision, Inc. - San Jose CA
-
International Classification:H01L 21/31
H01L 21/469 -
US Classification:257758, 257750, 438622
-
Abstract:A method for in-line monitoring of via/contact etching process based on a test structure is described. The test structure is comprised of via/contact holes of different sizes and densities in a layout such that, for a certain process, the microloading or RIE lag induced non-uniform etch rate produce under-etch in some regions and over-etch in others. A scanning electron microscope is used to distinguish these etching differences in voltage contrast images. Image processing and simple calibration convert these voltage contrast images into a “fingerprint” image characterizing the etching process in terms of thickness over-etched or under-etched. Tolerance of shifting or deformation of this image can be set for validating the process uniformity. This image can also be used as a measure to monitor long-term process parameter shifting, as well as wafer-to-wafer or lot-to-lot variations. Advanced process control (APC) can be performed in-line with the guidance of this image so that potential electrical defects are avoided and process yield ramp accelerated.
-
Non-Coplanar High-Speed Interconnects
view source -
US Patent:7859367, Dec 28, 2010
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Filed:Oct 9, 2008
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Appl. No.:12/248456
-
Inventors:Yan Yang Zhao - Fremont CA, US
Yuheng Lee - San Jose CA, US
Jianying Zhou - Acton MA, US -
Assignee:Finisar Corporation - Sunnyvale CA
-
International Classification:H03H 7/38
H01P 1/04 -
US Classification:333260, 333 33
-
Abstract:In one example embodiment, a high-speed package includes first and second layers and a multi-channel non-coplanar interconnect. The first layer includes first and second sets of coplanar transmission lines. The second layer includes third and fourth sets of coplanar transmission lines. The multi-channel non-coplanar interconnect includes first and second channels. The first channel connects the first set of transmission lines to the third set of transmission lines. The second channel connects the second set of transmission lines to the fourth set of transmission lines.
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Charged Particle Beam Imaging Method And System Thereof
view source -
US Patent:7884334, Feb 8, 2011
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Filed:Jan 22, 2009
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Appl. No.:12/357969
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Inventors:Yan Zhao - San Jose CA, US
Jack Jau - Los Altos Hills CA, US -
Assignee:Hermes Microvision, Inc. - Hsinchu
-
International Classification:G01K 1/08
H01J 3/14
H01J 3/26 -
US Classification:250398, 250306, 250307, 250309, 250310, 250311, 250396 R, 250397, 250423 R, 250424
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Abstract:The method includes scanning a sample in at least one first scan line using a first charged particle beam probe; scanning the sample in at least one second scan line using a second charged particle beam probe, and scanning the sample in at least one third scan line using the first charged particle beam probe. The first or second charged particle beam probe is defocused by a control module of the imaging system through adjusting a condenser lens module, an objective lens module, a sample stage of the imaging system, or their combination. An image of the sample is selectively formed from the first, second and third scan lines. The first and the second charged particle beams induce a first charging condition and a second charging condition on the sample surface respectively. The second charging condition can enhance, mitigate, eliminate, reverse or have no effect on the first charging condition.
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High-Speed Interconnects
view source -
US Patent:7978030, Jul 12, 2011
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Filed:Feb 12, 2008
-
Appl. No.:12/030142
-
Inventors:Yuheng Lee - San Jose CA, US
Jianying Zhou - Acton MA, US
Yan Yang Zhao - Fremont CA, US
Christopher R. Cole - Redwood City CA, US
Bernd Huebner - Santa Clara CA, US -
Assignee:Finisar Corporation - Sunnyvale CA
-
International Classification:H01P 1/00
-
US Classification:333247, 333254
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Abstract:In one example embodiment, a high-speed transponder includes a printed circuit board having a set of coplanar high-speed traces, and a high-speed circuit and a package mounted to the printed circuit board. The package includes an outside housing and a second high-speed circuit positioned inside the housing. The high-speed transponder also includes a high-speed feed thru which includes an inside coplanar structure positioned inside the housing, a strip line structure positioned through the housing, and an outside coplanar structure positioned outside the housing. The second high-speed circuit is operably coupled to the inside coplanar structure, which is operably coupled to the strip line structure, which is operably coupled to the outside coplanar structure, which is operably coupled to the first high-speed circuit via the set of coplanar high-speed traces. The signal plane of the outside coplanar structure is flipped with respect to a signal plane of the inside coplanar structure.
Amazon
Preparatory Textbook for Foreign Students (Peking University Edition)-Professional Chinese Course Series- Chinese Course about Chinese History (Chinese Edition)
view sourceThis is an advanced Chinese textbook, different from other Chinese textbooks mainly in the limited range of Chinese history. In terms of professional features, this book just talks about the historical common sense, rather than systematic political knowledge; in terms of teaching objectives, this bo...
Author
zhao yan feng
Binding
Paperback
Pages
199
Publisher
Peking University Press
ISBN #
7301126174
EAN Code
9787301126172
ISBN #
9
If I'd Only Known That
view sourceDonald Rumsfeld famously said of the Iraq war that "There are known knowns. These are things we know that we know. There are known unknowns. That is to say, there are things that we know we don't know. But there are also unknown unknowns, the ones we don't know we don't know." He got a lot of flack ...
Author
Achaessa James, Bruce Brumberg, Jon F. Doyle, Kate Forsyth, Jennifer George, Steve Kifer, Kim Kovacs, Paul Leisey, Takis Makridis, Mark Miller, David Outlaw, Corey Rosen, Robyn Shutak, Jim Sillery, Mike Stevens, Dan Walter, Fred Whittlesey, Yan Zhao
Binding
Perfect Paperback
Pages
142
Publisher
The National Center for Employee Ownership (NCEO)
ISBN #
1932924817
EAN Code
9781932924817
ISBN #
3
Drops of knowledge of C++: Practical Skills using C++
view sourceThis book is about C++ language practical skills. All the skills are based on either classical C++ book or author's 20 years C++ developing career. All skills are shown in item listtogether with C++ code examples. It make reader can read and understand these skills very quickly and easily.The book i...
Author
Yan zhao
Binding
Kindle Edition
Pages
132
Publisher
Yan Zhao
ISBN #
2
C language drip(Chinese Edition)
view sourceAuthor
ZHAO YAN
Binding
Paperback
Publisher
People Post Press
ISBN #
7115321981
EAN Code
9787115321985
ISBN #
6
Second Language Creative Writers: Identities and Writing Processes (Second Language Acquisition)
view sourceThis monograph investigates 15 L2 creative writers' social constructive power in identity constructions. Through interviews and think-aloud story writing sessions, the central study considers how L2 writer voices are mediated by the writers' autobiographical identities, namely, their sense of selves...
Author
Yan Zhao
Binding
Paperback
Pages
216
Publisher
Multilingual Matters
ISBN #
1783092998
EAN Code
9781783092994
ISBN #
5
Spoken English for Academic Purposes(Chinese Edition)
view sourcePub Date: 2014-07-01 Pages: 268 Language: Chinese. English Publisher: Shanghai Jiaotong University Press 'academic exchanges English Graduate Public English textbook series' main line of academic exchanges. by creating interactive language environment. will read. vision. hearing. speaking. writing a...
Author
ZHAO HONG YAN
Binding
Paperback
Publisher
Shanghai Jiaotong University Press
ISBN #
7313110235
EAN Code
9787313110237
ISBN #
10
License Records
Yan Peter Zhao
License #:
285210
Category:
Physician
Issued Date:
Jun 21, 2016
Type:
MEDICINE
Name / Title
Company / Classification
Phones & Addresses
President
LUCKY FEET, INC
Ret Shoes
Ret Shoes
2141 Tully Rd, San Jose, CA 95131
(408)9233888
(408)9233888
Managing
Yuan Holding, LLC
Real Estate Investment
Real Estate Investment
270 Redwood Shr Pkwy, Redwood City, CA 94065
450 Neptune Dr, Redwood City, CA 94065
450 Neptune Dr, Redwood City, CA 94065
Xinai Investment LLC
3180 Apperson Rdg Dr, San Jose, CA 95148
CENTURY ALTERATIONS AND TRADITIONAL GIFTS LLC
President
Northport Investments, Inc
President
Bloomage International Investment Group, Inc
200 Irene Ct, Belmont, CA 94002
President
CHONG WING SHIPPING, INC
320 Peninsula Ave STE 219, San Mateo, CA 94401
Lawyers & Attorneys
Yan Zhao - Lawyer
view sourceAddress:
Dla Piper Uk LLP
(213)8522111 (Office)
(213)8522111 (Office)
Licenses:
New York - Currently registered 2000
Education:
The George Washington University
Specialties:
Advertising - 34%
Patent Infringement - 33%
Copyright Infringement - 33%
Patent Infringement - 33%
Copyright Infringement - 33%
Yan Zhao - Lawyer
view sourceOffice:
Haiwen & Partners
ISLN:
920710065
Admitted:
People's Republic of China
Law School:
China University of Political Science and Law, LL.B., 1984
Googleplus
Yan Zhao
Work:
MPYInternational.com
Yan Zhao
Education:
Beijing Institute of Technology
Yan Zhao
Work:
Yan Comercial Ltda
Yan Zhao
Yan Zhao
Tagline:
Haha xixi hehe gege
Yan Zhao
About:
Blue cello case, origami, orange lotus, Japanese currency, baking, Yanyan. If none of these ring of a bell with you, you've got the wrong Yan.
Yan Zhao
Yan Zhao
Plaxo
Yan Zhao
view sourceShenyang, China
Zhao Yan
view sourceBusiness Manager at Dalian OUYA Imp/Exp Co.,Ltd
Lg Yan Zhao
view sourceFriends:
Yolanda Chua, Genevive Chua, LiYang Quek, Yan Xi Long, Ellena Divinagracia
Long Yan Zhao
Yan Ping Zhao
view source
Yan Shu Zhao
view source
Jessica Yan Zhao
view sourceFriends:
Alan Wang, Kathy Qiu, Quan Bo, Vivien Leung
Yan Zhao Nu
view sourceFriends:
Johng Cruz, Thelma Cruz, Kwon Yuri, Stephan Fernando, Mee Cay
Yan Zhao
view sourceFriends:
Robert Hunt, Tracy McGibbon, Chao Chen, Grainne Burke, Birgitte Nagel Larsen
Yan Fang Zhao
view source
Yan Qing Zhao
view sourceClassmates
Indiana University - Henr...
view sourceGraduates:
Yan Zhao (2008-2012),
Philip Koch (1970-1972),
Lana Meadows (1973-1977),
Mike Gonzalez (1991-1995),
Nanette Thrush (1989-2006)
Philip Koch (1970-1972),
Lana Meadows (1973-1977),
Mike Gonzalez (1991-1995),
Nanette Thrush (1989-2006)
Wellington High School, N...
view sourceGraduates:
Yan Zhao (2002-2006),
Kathleen Williams (2001-2005),
Ken Finklestein (1996-2000)
Kathleen Williams (2001-2005),
Ken Finklestein (1996-2000)
News
How the Zika Virus Could Make Its Way North
view source- azils Oswaldo Cruz Foundation showed that Culex mosquitoes fed Zika-infected blood could pass on the virus in their saliva. Tong-Yan Zhao, from Chinas State Key Lab of Pathogens and Biosecurity, also reported at the conference that Zika-carrying Culex mosquitoes can transmit the virus to mice.
- Date: Oct 06, 2016
- Category: Health
- Source: Google
Youtube
Get Report for Yan Qiu Zhao from San Jose, CA, age ~42